System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
Static Load Cells (500 N to 600 kN)
2580 Series
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The Instron 2580 Series static load cells are high-precision force transducers optimized for use with 5900 and 6800 Series universal testing systems, capable of measuring loads across a wide range (up to ±600 kN) with accuracy to 0.5 % of reading and sensitivity down to 1/1000th of full scale. Temperature-compensated and calibrated on equipment traceable to international standards, they have automatic recognition with an electronic serial number and support electronic calibration, while offering overload protection (up to 150 % without damage, 300 % without mechanical failure). The 2580’s design delivers high stiffness and reliable alignment under load—making it a robust choice for tension, compression, cyclic, and reverse stress testing in materials and components.
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Product
Digital Battery & Electrical System Analyzer w/Printer
726
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*Accurate Battery & Electrical System Tester *Features programmed test for new Start/Stop Batteries 3 Testers in ONE! 1) 6 & 12 Volt Battery Tester + 12V Start/Stop Battery Test 2) 12 & 24 Volt Charging System Tester 3) Alternator-Starting-Charging System Tester *Wide Testing Range from 40 to 2,000 CCA *Built-in Printer - print the results for permanent service records *Removable/Replaceable Cable Set *Patented Dynamic Resistance Technology
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Product
PXI Medium Density Switch Matrix Modules
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Pickering's range of medium density switch matrix modules is a cost-effective solution for applications that require mid-range matrices in the PXI format. Selected modules are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Product
Laser Diode Light Current Voltage (LIV) Test Instruments
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The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Product
AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
High Voltage Test Station
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High-voltage test stations place high demands on the safety aspect. We design these test stations in cooperation with our manufacturers as self-sufficient test systems.
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Product
Substrate Inspection Apparatus
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The test system of the printed circuit board (mounting board) called the flying probe tester developed ahead of the world received high evaluation at the electronics manufacturing factory around the world, securing the top share of the industry and "Takaya of the board tester" We have established a firm position that.
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Product
Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Product
Test Sets For Switchgear Industries
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These durable and modern Test Sets For Switchgear Industries are developed for determining the tripping of circuit in emergency or random current fluctuation. These testing systems save the outage and break-down of any electrical systems. They are designed to be used on multiple types of circuits. From voltage, current to vacuum, every factor is precisely tested to provide accurate results. They are easy to use and install sets available with user-friendly features.
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Product
The Lorlin© Impact Series
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Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Product
Pattern Generator
S-113
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The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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Product
PXI Resistor Module 4-Channel 1R to 255R with SPDT
40-293-113
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Drivetrain Test Stands
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Customers in automotive and off-highway vehicle production and R&D environments trust us to design and build precise, reliable, and repeatable drivetrain component test stands. All of our systems are designed to provide the highest level of dynamic testing capability at a competitive price. For decades, RedViking has designed, built, and implemented highly engineered test systems for drivetrain systems and components.
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Product
Boundary Scan Compliance Tester
QT900
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Qmax Test Technologies Pvt. Ltd.
QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
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Product
In-Line Debug Press
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Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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Product
Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Product
Phase Noise Analyzer
NXA-26
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This new NXA-26 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 26.5 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range. The NXA-26 combines over 25 years of Phase Noise Measurement Technology with an easy to navigate user interface. System operation requires minimal training that will have you making measurements in minutes.
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Product
Precision Multiferroic and Ferroelectric Test System
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The Precision Multiferroic tester is Radiant's most advanced test system. The Multiferroic has fast built-in frequency at 30kHz measurements using the 200V internal amplifier and 50kHz measurements using the 100V internal amplifier. This system comes in a built-in option of +/-100V, 200V, and 500V and can be expanded to 10kV. This unit also comes with a 18 bit ADC and requires no configuration changes.
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Product
PXI Precision Resistor Module 9-Channel, 1 to 122
40-297-112
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PXI Resistor Module 2-Channel 1.5R to 2.04k
40-293-022
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Thermal Shroud
BC8-55/150C
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When combined with a thermal conditioner such as the Bemco PCL3L-III or PCL3M-III, this shroud converts a 24 inch inside diameter by 30 inch high vacuum only vertical bell jar into a 19 inch inside diameter by 20 inch high thermal vacuum testing system. With a convenient clam shell door, test objects are easily loaded by simply raising the bell jar above the top of the door opening.
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
PCI High Density Pecision Resistor Card, 9-Channel, 2.5Ω To 3.55kΩ
50-298-023
Programmable Resistor Module
The 50-298-023 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
50 Channel Linear Vibration Motor Aging Unit
BK2021
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The BK2021 50 Channel Linear Vibration Motor Aging Test System was designed to test your linear vibration motors so you know they are working. Load a jig drawer in the jig assembly unit with 10 DUT's. Close the drawer to start testing and begin loading the next of the 5 drawers. When the machine has finished running up to 4 test sequences that you've programmed in, the drawer opens. On the front, a green light tells you the motor is good, a red light tells you there was a short and if there is no light you know there was an open circuit.
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Product
PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 472Ω
40-253-020
Programmable Resistor Module
The 40-253-020 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 472Ω with 0.125Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 2.5Ω to 395kΩ
40-251-042
Programmable Resistor Module
The 40-251-042 is a programmable resistor module with 2 channels which can be set between 2.5Ω and 395kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Aircraft Escape Systems
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The Emergency Interseat Sequencing System (EISS) was designed an qualified for the F-15K Fighter and has since been installed in the F-15SG and F-15SA configurations of the F-15. The system consists of Thermal Batteries with Initiators, a Digital Interseat Sequencer, Mode Selector, and customer provided cabling Electro-Explosive Devices (EEDs). The system is operated from either thermal battery and aircraft 28Vdc for redundancy. A separate field Test Set (EESSTS) performs both complete system continuity tests and an operational test of the total system installed in the aircraft. The sequencer is programmable and could be used in any escape system.Based on the initiation point, Forward or Aft Seat Handle, Internal or External Canopy Jettison Handles, and the Mode Selector setting, the Sequencer provides firing pulses to the EEDs to support canopy removal, ejection seat inertial reel activation(s) and ejection seat catapult firing(s). Sensing capabilities are provided to determine system state, canopy gone, seat gone, so as to provide the optimum escape timing.
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Product
Harmonics And Flicker Measuring System
ProfLine Series
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The Teseq ProfLine system is a complete and cost effective Harmonics and Flicker measurement test system which compiles to the latest IEC/EN standards, including IEC 61000-3-2 and IEC 61000-3-3. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT).
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Product
PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
Multiplexer Module
The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
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Product
Mechanical Creep and Rupture Testing Machine
MRC Series
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Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.
