System Under Test
tries inter, extra and intra interoperability. Also known as: SUT
See Also: EUT, Unit Under Test, UUT
-
Product
Tracer Gas Leak Test Systems
-
Tracer gas leak testing is a simple and highly-efficient method of leak detection that provides high sensitivity as well as increased accuracy and repeatability. This method is used for testing parts with very low leak rates that are outside the range for conventional air-flow pressure decay and mass flow, or to replace bubble test methods. Tracer gas testing uses escaping tracer gas to identify micro-leaks in the range of 1x10-4 to 10-9 scc/s.
-
Product
Multi-Wafer Test & Burn-in System
FOX-XP
-
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
-
Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
-
Product
Vibration Testing System
-
Wewon Environmental Chambers Co, Ltd.
Vibration Testing is performed to determine if a product can withstand the rigors of its intended use.
-
Product
Automatic Tablet Testing System
UTS 4.3
-
The UTS 4.3 LAB is a universal and fully automatic tablet testing system based on the long-proven UTS 4.1 - this was developed for industrial use and can be found in production worldwide. The UTS 4.3 LAB is now equipped with the database-driven, intuitive all-in-one touch software and no longer requires additional software solutions for most areas of application.The functionality of the software can be extended modularly and individually adapted to your needs and requirements. FDA regulations can be fulfilled with the optional FDA-21-CFR-Part-11 module.With UTS 4.3 LAB – as with the proven UTS 4.1 IPC – you can test round, oval, square and rectangular tablets as well as numerous special shapes. For difficult oblong tablets, the globally used Oblong Centering System (OZB) can also be integrated.
-
Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
-
Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
-
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
-
Product
Advanced Driver Assistance Systems (ADAS) Testing
-
Advanced Driver Assistance Systems (ADAS) TestingAll modern vehicles are now being equipped with Advanced Driver Assistance Systems (ADAS). The development of such systems requires complex testing, including the ability to control and calculate relative positions between multiple vehicles and objects in real-time. We provide an effective solution for ADAS testing with highly accurate GPS positioning systems to measure relative positions and velocity between multiple vehicles and objects.
-
Product
Battery PACK (500v-1000v)Test System
-
Shenzhen Sinexcel RE Equipment CO., Ltd
PACK test equipment adopts sinexcel, firstly adopts three-level AC scheme, and the detection process supports multi-gear switching. The device integrates voltage, temperature, pressure and other auxiliary channels, and CAN also integrate various communication protocols such as temperature box, water cooler, mainstream CAN CANFD 485, etc. It supports a variety of practical and innovative functions such as data one-click automatic export, which meets all aspects of PACK battery electrical performance testing.
-
Product
Circuit Breaker Test System
AutoScan
-
AutoScan Circuit Breaker Test System is used for performing routine tests on circuit breakers and various other types of switchgear. This test system is designed to test vacuum circuit breakers, high voltage circuit breakers, and extra high voltage circuit breakers as per suitable standards.
-
Product
Pneumatic Vertical Shock Test System
KRD11 series
-
KRD11 series pneumatic vertical shock test system is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and bump test, can perform conventional half-sine wave, post-peak sawtooth wave, trapezoid wave and other waveform shock tests.
-
Product
Electro-Dynamic Vibration Test System (Water Cooled)
-
HIACC Engineering & Services Pvt. Ltd.
Water-cooled systems are capable of performing a variety of vibration test procedures, including tri-axial sinusoidal vibration test as well as the classical (semi-sinusoidal, trapezoidal and post-peak sawtooth) pulse & shock response spectrum tests. When configured with HIACC climatic chamber, the water-cooled vibration test system can perform multi-environment vibration tests
-
Product
Diagnostic Test System™
-
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
-
Product
Modular Laser Diode Test System (PXI/PXIe)
LTS8620
-
The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
-
Product
Memory Test Systems
-
ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
-
Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
-
Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
-
Product
Computer-controlled Torque Testing System
Torque Testing System,
-
Our top-of-the-range Vortex-i torque testing system gives optimum testing performance and evaluation options, enabling you to get the most from your test measurements.
-
-
Product
Vibration Testing System
F Series
-
Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
-
Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
-
Product
Surge Voltage and Surge Current Testing Systems
-
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
-
Product
Count Down Test System
-
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
-
Product
Vibration Test System
3-axis
-
This small 3-axis vibration test system has been developed in response to many customers' request for ?gcompact and easy to handle & use h multi-axis VTSs without sacrificing performances, featured by its small installation area of W900mm by D850mm, relatively quiet due to employment of small fans insterad of bolower(s), a displacement of 25mmp-p for each axis and max. transient acceleration of over 98m/s2<10G>*,
-
Product
IEC60529 IP3/4 Oscillation Tube Rain Test System
CX-IPX3/4
-
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60529 IPX3/4 Oscillation Tube Rain Test System is designed according to IEC60529 standard.The IEC60529 IPX3/4 Oscillation Tube Rain Test System is mainly used to simulate the product under the condition of the rain climate to test the productc' physical properties, the product can be electronical products, lamps, lanterns, electrical cabinets, electrical components, automobiles, motorcycles and their accessories.
-
Product
Small Device Noise Emission Test System
-
The Small Device Noise Emission Test System from VIacoustics is a turnkey solution for the measurement of noise emissions of small devices typically used in computers, consumer electronics, appliances and automobiles. The system includes all hardware and software necessary (see the components tab) for the determinations of sound power levels (1/3 octave band and A-weighted), emission sound pressure levels (normalized 1/3 OB, A-weighted and high resolution FFT) and *ISO 532B loudness. The system is designed to be operated by a technician for production level testing or to be used by an engineer in the product development process.
-
Product
Test Systems
-
As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
-
Product
Traction and Induction Motor Test Systems
-
Crest makes state-of-the art test systems for testing 3-phase AC motors used in traction and other industrial applications.
-
Product
Microindentation Hardness Testing Systems
LM Series
-
Perfect for a production facility or a research lab, LECO's LM Series Microindentation Hardness Testing Systems offer a variety of models (including analog and digital) with the advanced features that meet your requirements and budget.
-
Product
Phase Noise Test System
N5511A
Phase Noise Analyzer
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
