Test Adapters
See Also: Interface Test Adapters
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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PXI Pull-Thru Adapter, Receiver, QuadraPaddle, 6.75" Series, 2 VHDCI Males
510140306
PXI Pull-Thru Adapter, Receiver, QuadraPaddle, 6.75" Series, 2 VHDCI Males
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NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-02
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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Power Cord, AC, U.S., 120 VAC, 2.3 Meters
763000-01
Power Cord, AC, U.S., 120 VAC, 2.3 meters
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Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2x68 Female VHDCI Connectors
510150126
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Female VHDCI Connectors
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High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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SAS Protocol Test System
M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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NI-6585B , 200 MHz, 32 LVDS-Channel Digital I/O Adapter Module for FlexRIO
784060-01
200 MHz, 32 LVDS-Channel Digital I/O Adapter Module for FlexRIO—The NI-6585B is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO, creates a digital instrument for interfacing with 32 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6585 can operate at up to 200 MHz clock rates and includes support for common LVDS voltages.
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
510140141-1
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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True Concurrent Test
TestStation Duo
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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NI-6584, 16 Mbit/s, 16-Channel Digital I/O Adapter Module for FlexRIO
781290-03
16 Mbit/s, 16-Channel Digital I/O Adapter Module for FlexRIO—The NI-6584 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 16 RX and TX pairs of RS485 or RS422. This digital I/O adapter module for FlexRIO can be used to do real-time interfacing and analysis of RS485 and RS422 as well as other electrically compatible interfaces. The NI-6584 can sample digital waveforms at up to 100 MHz clock rates, has terminated and unterminated options, and full and half duplex configurations.
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PCB Test System
Circuit Wizard - CW409
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Pull-Thru Adapter, Wired, TriPaddle, 2 FML 9 Pin D-Sub, 2 SMB Plugs
510140111
Pull-Thru Adapter, Wired, TriPaddle, 2 FML 9 Pin D-Sub, 2 SMB Plugs.
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Magnetic Material Test Fixture
16454A
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Adapter Plate, 9050 Enclosure to 9025 ITA
410112422
This Adapter Plate allows a 25 Module ITA to accept standard 50 Module Enclosures.
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Off-Line Testing Platform
6TL29
6TL29 Testing platforms are based on the modularity concept; its construction is completely modular and scalable, allowing the user to take advantage of a powerful and reliable platform with a minimum investment.The platform is compact and due to its reduced footprint can be integrated easily into any production line. It’s ideal for High-Mix Low-Mid Volume production environments.
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PXI Pull-Thru Adapter, Wired, Mini Coaxial, to 4 SMB Plugs and 4 BNC Plugs
510140157
PXI Pull-Thru Adapter, Wired, Mini Coaxial, to 4 SMB Plugs and 4 BNC Plugs
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NI-5781 , 40 MHz Bandwidth, RF Adapter Module for FlexRIO
781267-01
The NI‑5781 is an analog dual-input, dual-output FlexRIO adapter module optimized for interfacing with baseband to RF upconverters and downconverters. When you pair the NI‑5781 with a PXI FPGA Module for FlexRIO, the resulting NI‑5781R is an FPGA-enabled reconfigurable I/O (RIO) baseband transceiver that you can use to implement custom RF modulation and demodulation, channel emulation, bit error rate testing, or spectral monitoring and jamming. Additionally, you can use the low latency and high throughput of FPGA‑based processing for ultra‑high‑speed control and inline processing applications.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
