Test Adapters
See Also: Interface Test Adapters
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
PCB Adapter, Receiver, SIM, VTAC, 96 Pos, 14 Slot, to (1) 12x InfiniBand
510170108
PCB Adapter (Receiver)
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single 12x InfiniBand connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
USB 2.0 Adapter
ADP-USB-445
USB 2.0 Adapter
The ADP-USB-445 USB 2.0 adapter converts one of the USB 2.0 headers on-board the WINSYSTEMS SBC35-427 single board computer to two type-A connectors on the front I/O panel. The integrated circuitry ensures noise immunity from the type-A connections to the single board computer and provides a robust power solution for external devices.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Test Port Cable, 1 Mm
11500K
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
PCB Adapter, Receiver, SIM, VTAC, 40 Pos, 6 Slot, to (1) HDMI
510170113
PCB Adapter (Receiver)
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single HDMI connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules.
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Product
Coaxial Waveguide Adapter, APC-7, 12.4 to 18 GHz
P281B
Coax Adapter
The Keysight P281B adapter transforms waveguide transmission line into 50-ohm coaxial line. Power can transmitted in either direction, and each adapter covers the full frequency range of its waveguide band with SWR less than 1.3.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-2
Pull-Thru Adapter
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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Product
PXI Pull-Thru Adapter, Receiver, QuadraPaddle, 6.75" Series, 2 VHDCI Males
510140306
Pull-Thru Adapter
PXI Pull-Thru Adapter, Receiver, QuadraPaddle, 6.75" Series, 2 VHDCI Males
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Product
Coaxial Waveguide Adapter, APC-7, 12.4 to 18 GHz
P281C
Coax Adapter
The Keysight P281C adapter transforms waveguide transmission line into 50-ohm coaxial line. Power can transmitted in either direction, and each adapter covers the full frequency range of its waveguide band with SWR less than 1.3.
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Product
High Resistance Measurement Universal Adapter
N1414A
High Resistance Measurement Adapter
N1414A High Resistance Measurement Universal Adapter is used to simplify the connection for high resistance measurements by B2980A series electrometer.
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Product
PCB Adapter, Receiver, SIM, VTAC, 16 Positions, 6 Slots, to (1) Cat6
510170105
PCB Adapter (Receiver)
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single Cat6 connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules. Please note this part is too wide for use in multiple adjacent slots (for more information, please reference the attached drawing).
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 1x100 Pin Female SCSI Connector
510150127
PCB Adapter
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 1x100 Pin Female SCSI Connector
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Product
NI-5792, 200 MHz to 4.4 GHz RF Adapter Module For FlexRIO
782511-01
RF Adapter Module
The NI‑5792 provides continuous frequency coverage from 200 MHz to 4.4 GHz. It features a single-stage, direct conversion architecture that provides high bandwidth in the small form factor of a FlexRIO adapter module. The onboard synthesizer, which is the local oscillator (LO), sets the center frequency for acquisition and generation, and you can export it to other modules for multiple input, multiple output (MIMO) synchronization. You can also import the LO from an external connector, enabling synchronization of up to eight NI‑5792 modules.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Adapter, 1.0 mm (f) to 1.0 mm (f), DC to 110 GHz
11920B
Coax Adapter
The Keysight 11920B precision 1.0 millimeter waveguide-to-coax adapter offers a simple way of measuring coaxial devices at higher frequencies. It is designed for the measurement of components with 50 ohms and frequency range from dc to 110 GHz.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Attenuator Interconnect Kit, SMA
11716C
Interconnect Adapter
The Keysight 11716C quickly and conveniently connects 1 dB step and 10 dB step attenuators together to achieve greater dynamic range with 1 dB steps. The Keysight 11716C can be utilized to connect any of the two Keysight 8494/95/96 attenuators in series.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
