Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Digital Thickness Gauge
K094
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For carpets, with weight set 20-2000 GM/cm², presser foot 412mm², range 0-25mm x 0.01mm.
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Product
Substrate Thickness, Warp, and TTV Measurement
413 Series
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Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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Product
Premium Handheld Coating Thickness Gauges
DUALSCOPE® FMP100 and H FMP150
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Coating thickness measurement at the highest level. The device series for maximum flexibility and control in coating thickness measurement. Ideal for the use of inspection plans.
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Coating Thickness Gauge
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Dalian Taijia Technology Co.,Ltd
In built probe(s)● Operating principle: magnetic induction/eddy current (F/NF)● Measuring range:0-1250um/0-50mil● Resolution; 0.1/1● Accuracy: ±1-3%n or ±2.5um● Min. measuring area: 6mm● Min. sample thickness: 0.3mm● Battery indicator: low battery indicator● Metric/ imperial: convertible● Power supply: 4x1.5V AAA(UM-4)battery● Auto power off● Operating conditions:0-+45℃(32℉-104℉),≤90%RH● Dimensions: 126x65x27mm● Weight: 81g(not including battery)● Optional accessories:● other range 0-200um to 15000um● RS-232C cable & software: 1.USB adaptor for RS-232C 2.Bluetooth interface
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Product
Solar Wafer Transfer Tool
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Solar Wafer Transfer Tool
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Ultrasonic Thickness Gauge
QTG Series
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Ultrasonic Thickness Gauge - QTG Series are economical, user-friendly, menu driven, and multi-functional units offering extensive features from basic measurements (model: QTG I) to extended memory (5000 reading storage) and USB output capabilities (model QTG II). The instrument can measure with very high resolution (0.01 mm or 0.001 inches) the thickness of metallic and non-metallic materials such as steel, aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave conductor. The Ultrasonic Thickness Gauge - QTG Series accurately displays readings in either inches or millimeters and is equipped with special features like Automatic recognition of probes with different frequencies and Automatic zeroing of the unit.
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Coating thickness XRF Standards
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We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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Product
Coating Thickness Measurement Gauges
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
Handy, universally applicable coating thickness gauge in three versions: Integrated probes, cable probes and interchangeable internal and external probes.
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Product
Ultrasonic Thickness Gauges
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A widely used nondestructive test technique for measuring the thickness of a material from one side. It is fast, reliable, and versatile, and unlike a micrometer or caliper it requires access to only one side of the test piece.
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Product
Coating Thickness Meters
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PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Wafer Probe Loadboards/PIB
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DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Product
Thick Film Passive Element
GBR-395
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GBR-395 series high voltage resistors are made in a thick film technology on ceramic substrates(Al2O3 96%). These elements are used in high voltage applications requiring high stability and resistance.
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Product
Coating Thickness Gauge
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Shenzhen Linshang Technology Co., Ltd.
Linshang coating thickness gauge, also named dry film thickness gauge, which can identify the substrate automatically. It can be used in various fields such as coating thickness measurement, plating thickness measurement, fireproof and anticorrosive coating thickness measurement, etc. The dual-use coating thickness gauge such as LS220H, LS221, LS223 are suitable for ferrous and non-ferrous substrates, LS225+F500 is special for ferrous substrates and LS225+N1500 is special for non-ferrous substrates.
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Product
Inline Thickness Measuring Instrument
TGD
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Thickness and profile measuring system for use in production lines.For cold and hot rolled strips and sheets. Measuring procedure free of contact.
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Product
Thickness Measurement
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Thickness Tester is a high precision mechanical contact method thickness tester, which can be used to thickness measurement of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
Wafer Chucks
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ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Ultrasonic Thickness Gauge
MMX-6
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The MMX-6 is a simple to use hand-held Ultrasonic Thickness Gauge with the ability to measure through paint and coatings and eliminate the thickness of the paint or coating. The MMX-6 uses a dual element style transducer. With the single press of a button, the MMX-6 can be switched between pit or flaw mode ( pulse-echo), and through paint/coatings mode (echo-echo) for maximum inspection efficiency. The MMX-6 is equipped with a bundle of features to make your job easier: Alarm mode, high speed scanning, and data send are the main features of the MMX-6. The MMX-6 comes as a complete kit, ready to use, and is backed by Dakota Ultrasonics 5 year limited warranty.
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Ultrasonic Thickness Gauges
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Capable of performing measurements on a wide range of material, including metals, plastic, ceramics, composites, epoxies, glass and other ultrasonic wave well-conductive materials.
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Ultrasonic Thickness Gage
27MG
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The Olympus 27MG is an affordable ultrasonic thickness gage designed to make accurate, measurements from one side on internally corroded or eroded metal pipes, tanks, and other equipment. It weighs only 12 oz. (340 g) and is ergonomically designed for easy, one-hand operation. Thickness range 0.50 mm to 635 mm (0.020 in. to 25.0 in.) depending on material, transducer, surface conditions, temperature.
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Metal Thickness Measurement
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Micro-Epsilon offers innovative measurement and inspection systems for the metals industry. Latest technologies are used for thickness, profile and surface measurements. Performance and quality, as well as reliability of products and services have made Micro-Epsilon one of the leading suppliers of inspection systems for optical thickness measurement used in the metals industry. Numerous, successful installations in 13 countries around the world in milling lines and processing lines speak for themselves.
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Thickness Measurement Products
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Our film thickness measurement products are available for every application. We stock most of the products listed below for fast delivery. Browse through them or contact one of our Application Engineers, who can immediately assist you with your film thickness measurement needs.
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Ultrasonic Wall Thickness
UTG
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The PosiTector UTG measures the wall thickness of materials such as steel, plastic and more using ultrasonic technology. Ideal for measuring the effects of corrosion or erosion on tanks, pipes or any structure where access is limited to one side. Multiple echo (UTG M) Thru-Paint models measure the metal thickness of a painted structure without having to remove the coating.
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Glass Thickness Meters
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Shenzhen Linshang Technology Co., Ltd.
As a supplier of laser glass thickness gauge and glass thickness measuring tool, Linshang provides two models of glass thickness gauge that can be used to measure the thickness of various glasses, i.e: single-layer glass, double glazing, triple glazing, multilayer glass, LOW-E glass, and insulating glass, especially suitable for installed glass, such as doors and windows, curtain wall glass, etc.. It can measure the glass thickness as well as the thickness of air space (between the glass). The glass check works on the basis of reflection in the glass.
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Flaw Detector & Thickness Gauge
DFX-8+
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Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Product
Thickness and Flaw Inspection
OmniScan SX
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Olympus is proud to introduce the OmniScan® SX, a flaw detector that benefits from more than 20 years of phased array experience and shares the OmniScan DNA. For improved ease of use, the OmniScan SX features a new streamlined software interface displayed on an 8.4 in. (21.3 cm) touch screen. A single-group and non-modular instrument, the OmniScan SX is easy to operate and cost-effective for less demanding applications.
