Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Coating Thickness Meter
MEGA-CHECK DX
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The List-Magnetik MEGA-CHECK DX Coating Thickness Gauge can be connected to a wide range of specialized digital probes. Applications on very small apertures, thick layers and small measuring points are easily possible.
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Product
Nonwoven Thickness Gauge
DRK141P-II
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Shandong Drick Instruments Co., Ltd.
It is used to determine the thickness of bulky non-woven fabrics with a thickness of ≤ 20mm and the thickness of large-compression non-woven fabrics.
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Product
2D/3D Wafer Metrology System
7980
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Chroma 7980 provides accurate and reliable profile information. 7980 adopts new BLiS technology and specially designed platform to achieve 2D/3D nanoscale measurement.
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Product
Drone Thickness Gauge
Multigauge 6000
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The Multigauge 6000 Drone Thickness Gauge has been designed specifically to mount onto a drone or UAV. This new technology has already had many successful installations on various models of drone and this is the first dedicated drone thickness gauge available worldwide.
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Product
Ultrasonic Thickness Gauge
TI-100K
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TI-100K inherits high performance of predecessors including popular TI-45NA, and also have memory function and statistical processing performance.
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Product
Metal Thickness Measurement
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Micro-Epsilon offers innovative measurement and inspection systems for the metals industry. Latest technologies are used for thickness, profile and surface measurements. Performance and quality, as well as reliability of products and services have made Micro-Epsilon one of the leading suppliers of inspection systems for optical thickness measurement used in the metals industry. Numerous, successful installations in 13 countries around the world in milling lines and processing lines speak for themselves.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
Ultrasonic Wall Thickness
UTG
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The PosiTector UTG measures the wall thickness of materials such as steel, plastic and more using ultrasonic technology. Ideal for measuring the effects of corrosion or erosion on tanks, pipes or any structure where access is limited to one side. Multiple echo (UTG M) Thru-Paint models measure the metal thickness of a painted structure without having to remove the coating.
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Product
Thickness Gauges
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Thickness gauges are used for measuring the thickness of a material. Our thickness gauges use a non-destructive testing technique which does not permanently change the material it tests. GAOTek’s thickness gauges are reliable, high quality, and affordable instruments that provide an accurate measurement and offer an efficient and quick means of inspection or testing. They are compact, easy to carry and are designed to work in complex conditions. Our gauges are available for sale to the United States, Canada and globally.
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Product
Thickness Gauges
CMX DL
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The CMX DL has all the features of the CMX, plus a huge storage capacity, using multiple file structures. Select between to file formats: Sequential, with auto identifiers or, our standard alpha numeric grid format.
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Product
Ultrasonic Wafer Scanner
AutoWafer
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Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
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Product
Coating Thickness Measurement Gages
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Coating thickness or dry film thickness (DFT) is an important variable that plays a role in product quality, process control, and cost control. Measurement of film thickness can be accomplished by selecting the best mil gage for the particular application.
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Product
Paper Thickness Tester
DRK107A
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Shandong Drick Instruments Co., Ltd.
DRK107A Paper Thickness Tester is professionally applied to testing the thickness of paper specimens.
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Product
Wafer Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
Coating Thickness Measurement
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The Calotest instruments from Anton Paar provide quick, simple and inexpensive determination of coating thicknesses. Employing the simple ball-cratering method, the thickness of any kind of single or multi-layered coating stack is accurately checked in a short time, in full compliance with relevant international standards.
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Product
Mechanical Coating Thickness Gauges
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Mechanical Coating Thickness Gauges are suitable for working in high risk areas such as high temperature or flammable atmospheres, underwater or where the risk of explosion is high and could be triggered by the use of an electronic instrument. From the simplest coating thickness gauge Elcometer 101 which will provide you with quick and immediate results to the more accurate coating thickness gauge Elcometer 211, also called the "banana gauge" which is ideal for cold and underwater surfaces.
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Product
Wafer Probe Heads
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WLCSP test is the applying final test conditions at Wafer Level. WLCSP testing is driven in lowering the cost of test of devices through economical methods of manufacturing and testing.
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Product
Surveyor Datalogger Thickness Meter
Multigauge 5750
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Has a choice of Multiple Echo, Echo to Echo or Single Echo to cover all requirements. Measurements can be stored on the gauge and wirelessly transferred to the PC.
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Product
Moisture / Thickness / Density Meters
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On-line multi IR wavelength analyzer utilizing infrared absorption technology for measuring product constituent and/or thickness.
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Product
Ultrasonic Thickness Gauge
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Is a widely used nondestructive test technique for measuring the thickness of a material from one side.
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Product
Terahertz Coating Thickness Analysis
TeraCota
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TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Product
Distance, Coating and Thickness Meters
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PeakTech Prüf- und Messtechnik GmbH
This professional laser distance measuring device with multi-line LCD display, which has a backlight, was specially designed for high-precision distance measurements.
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Product
Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Product
Thickness Measurement Testing
DRK3011B
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Shandong Drick Instruments Co., Ltd.
It is used for the durability test of children's mattress surface rolling and the test of the height of the cushion surface.
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Product
Thickness and Flaw Inspection
NORTEC 600
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Olympus converges its latest advancements in high-performance digital circuitry and eddy current flaw detection into one compact and durable portable unit—the new NORTEC® 600. With its crisp and vivid 5.7 inch VGA display and true full-screen mode, the NORTEC 600 is capable of producing highly visible and contrasting eddy current signals in any lighting condition.
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Product
Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Product
System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Product
Coating thickness XRF Standards
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We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
