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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Scienlab Battery Test System – Cell Level
SL113XA | SL100XA Series
The cell is the basis of any battery system and directly influences its function, performance and safety. Therefore, it is essential to test and characterize the cell at an early development stage. For this purpose, Keysight offers reliable test systems for precise and reproducible measurement results. The Cell Level Series (SL1002A, SL1004A, SL1007A, SL1132A and SL1133A) — also known as Battery Cell Tester — emulates sink and source for battery cells for automotive and industrial applications.
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Thyristor Regulators
Small and lightweight thyristor regulators for single-phase loads are characterized with high panel installation density.
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NanoSpectralyzer
NS MiniTracer
The NS MiniTracer is the latest addition to the innovative line of NanoSpectralyzer instruments from Applied NanoFluorescence, LLC. Its design is optimized for fast, easy, and highly sensitive analytical measurements on a variety of samples containing single-walled carbon nanotubes. The MiniTracer is ideal for quantitating SWCNTs in environmental and biological specimens and is also perfect for routine sample characterization in any SWCNT research lab.
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LXI Microwave Matrix, 10GHz, Dual 3x3
60-750-233
The 60-750-233 is a dual 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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PNA-X Microwave Network Analyzer, 8.5 GHz
N5249B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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PXI/PXIe Arbitrary Generators
The arbitrary waveform generators of the PXA72xx family are characterized by a resolution of 16 bits with a maximum sample rate of 200 MS per second. The devices can also be used to directly output voltages of up to 30 V (or ±15 V).
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Differential Scanning Calorimeter
DSC-60 Plus Series
DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
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Thick Film Passive Element
GBR-183
GBR-183 series resistors are made in a thick film technology, on ceramic substrates(Al2O3 -96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-183 series elements are used both for general, and professional applications.
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Sample Holder
In combination with the PES measuring system, sample holders from aixACCT Systems are now practically standard for the characterization of piezoelectric materials.
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Pulse Characterization Sensors
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Dynamic Imaging Particle Analysis Technology
FlowCam® Macro
Yokogawa Fluid Imaging Technologies, Inc.
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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InfiniiVision Oscilloscopes
2000 X-Series
70 MHz to 200 MHz See more signal detail with 50,000 wfms/s update rateView time-correlated digital content with 8 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, I2C, SPI and RS232/422/485/UART Protect your investment with full upgradability
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Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Optical Component Test
Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with Luna’s suite of component analyzers and testers.
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High Voltage Dividers
Ohm-Labs manufactures precision resistive high voltage dividers. By individually characterizing each resistor in the divider, voltage and power effects are minimized.
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High-Channel Density Precision SMU
PZ2100 Series
PZ2100 source measure unit (SMU) solution. Focus more on characterization and less on synchronization, with multiple SMU module options and up to 20 SMU channels within a 1U rack space. Speed time-to-market with less programming, simplified system integration, and application-specific measurement capabilities.
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DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
DDR5 Receiver Conformance and Characterization Test Application.
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Thermal Analysis
Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Dimensional Metrology
Stand-Alone Metrology Family
Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Liquid Cooling High Amp
qCf 12 High Amp
qCf Liquid Cooling High Amp: Our system for the professional characterization of fuel cells for high current densities and direct flow field cooling.
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Comb Generators
Keysight comb generators provide excellent phase and amplitude flatness making them ideal for use in phase calibration applications. A customer selectable USB-controlled frequency divider which allows for broad range of input signal frequencies from 10 MHz to 67 GHz and small minimum tone spacing of 10 MHz, makes Keysight comb generators suitable for characterizing non-linear devices.
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Vibration Test Technology
These vibration exciters (also called shakers) use permanent magnets and are available as portable and stationary systems for simulating ambient vibration conditions. Robust design ensures a long service life, and typical applications include structure analysis and testing smaller subassemblies. These shakers are characterized by high lateral and axial stiffness and come in lightweight construction as specified by industrial users.
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Vector Signal Analyzers
Vector signal analyzers combine superheterodyne technology with high speed ADCs and other DSP technologies to provide fast FFT-based, high-resolution in-channel spectrum measurements, demodulation, and advanced time-domain analysis. A vector signal analyzer is especially useful for characterizing complex burst, transient, or modulated signals in aerospace & defense, radar, wireless communications, and avionics.
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Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Surface Plasmon Resonance Analysis
Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
