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Product
Environmental Monitoring
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Is the processes and activities that are done to characterize and describe the state of the environment.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Component Test Stands
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As your specialist for measurement and testing technology, imc designs and manufactures test stands perfectly matching requirements for a complete range of components: whether for servomotors, pumps, brakes or valves – according to your wishes, imc component test stands can quickly and precisely test for perfect operation, verify lifetime, determine energy efficiency, and much more. Thanks to the modern software imc STUDIO, test objects can be tested for complex and wide-ranging scenarios.Test stand solutions from imc are characterized by their flexibility, short set-up times and productive test processes.As a manufacturer of measurement and test technology, it is second nature to us that imc test stands deliver reproducible and verifiable results and ensure productive test processes. Furthermore, we place enormous value not only on first-class technical features for imc test stands, but also on meeting the economic demands of our customers.
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Product
High Power Devices
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SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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Product
Pulsed IV-Curve Solutions
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Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Product
ATCA 5U 6 Slot Dual Dual Star 40G - with bused IPMB
109ATCA506-1003R
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The 5U 6 slot ATCA backplane is a dual dual start with bused IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
Measuring Solar Fields
ISET Sensor
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The solar radiation sensor is characterized by a simple and compact but precise structure. Use in balancing monitoring systems for simple, fast and reliable information about the functioning and solar "energy yield" of a PV plant. For site surveys, monitoring and other fields of survey technology.
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Product
CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
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Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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Product
Oil Testers
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PeakTech Prüf- und Messtechnik GmbH
This device was developed for the quick and reliable testing of frying oils in the catering trade, commercial kitchens and also for private users. With the device settings it is possible to display the oil temperature of the deep fryer. By measuring the TPM value (Total Polar Materials) the content of polar substances can be determined, which is a reliable parameter to characterize the extent of aging of the frying oil / frying fat during frying.
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Product
Noise & Vibration Tester
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System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).
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Product
NanoSpectralyzer
NS MiniTracer
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The NS MiniTracer is the latest addition to the innovative line of NanoSpectralyzer instruments from Applied NanoFluorescence, LLC. Its design is optimized for fast, easy, and highly sensitive analytical measurements on a variety of samples containing single-walled carbon nanotubes. The MiniTracer is ideal for quantitating SWCNTs in environmental and biological specimens and is also perfect for routine sample characterization in any SWCNT research lab.
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Product
SparkFun Spectral Sensor Breakout
AS7262 Visible (Qwiic)
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The SparkFun AS7262 Visible Spectral Sensor Breakout brings spectroscopy to the palm of your hand, making it easier than ever to measure and characterize how different materials absorb and reflect different wavelengths of light. The AS7262 Breakout is unique in its ability to communicate by both an I2C interface and serial interface using AT commands. Hookup is easy, thanks to the Qwiic connectors attached to the board --- simply plug one end of the Qwiic cable into the breakout and the other into one of the Qwiic Shields, then stack the board on a development board. You’ll be ready to upload a sketch to start taking spectroscopy measurements in no time.
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Product
PXIe Measurement Accelerator
M9451A
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The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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Product
Gain-Compression Measurements
S96086B
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The S96086B, gain compression measurements provides fast and accurate characterization of input power, output power, gain, and phase at the compression point of an amplifier, over a specified frequency and power range, with a simple setup
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Product
EasyEXPERT Group+ Software (for PC)
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Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Product
LXI Microwave Matrix, 10GHz, Single 8x4, Terminated With Loop-Thru
60-750-184-C
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The 60-750-184-C is a single 8x4 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Candlestick Sensor
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Advanced Thermal Solutions, Inc.
The Candlestick Sensor is a flexible, robust, base-and-stem design air velocity sensor that measures both temperature and air velocity for characterizing thermal conditions in electronic systems. The Candlestick Sensor is narrow and low profile to minimize the disturbance of the heat flow in the test domain. It features a flexible, plastic-sleeved stem, which facilitates installation and repositioning during the testing process.
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Product
Physisorption & Chemisorption
ASAP 2020 Plus
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The ASAP 2020 Plus permits one instrument to accommodate almost any surface characterization need in your lab.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-02
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Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Modulation Distortion Up To 43.5 GHz
S930704B
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S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Moisture Testers for Wood
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Here you will find a moisture tester for wood to determine absolute moisture in different wood types. Newly-cut logs can have a moisture content of 80% or more, depending on the type. Since wood shrinks substantially when dried, it must be dried before being used in construction or most other applications. This is most often done using a large furnace called a kiln. The air drying method may also be used, but this is much slower. With the help of the moisture tester for wood you will be able to measure with high accuracy moisture in, not only raw wood, but also rolled paper products, planks, slats, beams, plywood, panels, particle board, main beams, window frames, etc., anything wooden. There are two ways of measuring moisture, these two ways are with or without damaging the material. The majority of types of moisture testers we offer at PCE do not damage the wood, or damage it very slightly.The moisture tester for wood is characterized by the measuring principle and the moisture sensors that can be adapted to it. The moisture tester for wood has special characteristics such as an automatic compensation of temperature. Besides, data can be stored and transferred to a PC or laptop, or characteristic curves can be programmed for specific wood types (only with the model FMD). Our moisture tester are of the highest quality standards in the industry, and are durable and easy to use.
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Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
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Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Particle Analyzers in Liquids and Gases
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Particle analyzers determine the size and distribution of particles in a material.Particle size analyzers work in many areas of research and development, product testing, manufacturing and quality control. Particle size analysis is important in characterizing a wide range of product performance factors.There are several many analytical techniques and approaches for particle size analysis.It depends on the range, the nature of the sample, the method of analysis and the sampling output.Particle size analysis is a very important test and is used for quality control in many different industries like Food and beverages,Pharmaceuticals,Aerosols and more.The tests should be adjusted according to the different materials.
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Product
PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
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100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Product
Thermal Warpage Measurement Tool
PS600S
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The TherMoir PS600S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoir PS600S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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Product
PXIe-4140, 4-Channel Source Measure Unit
781742-01
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The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
IndiRAM CTR With Quantum Characterizer
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The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Product
Variable Optical Attenuator Module with Angled Interface
81571A
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The Keysight 81571A variable optical attenuator features lowest insertion loss and excellent wavelength flatness over a complete attenuation range of 60 dB, for characterizing optical network components for telecommunication and data communication in systems.
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Product
Stylus Profilometry
Dektak®
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Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Product
Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
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While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
