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Spectroscopic Ellipsometer
PH-SE
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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Climate Test
Series C
With our CTS climatic test chambers, you can also simulate the stress factor humidity in your tests next to the temperature. The humidity is measured by a capacitive moisture sensor, which is characterized by high accuracy, long term stability and low maintenance.
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Automated Tuners / Impedance Tuners / Load Pull Tuners
MT97x, MT98x and XT98x series automated tuners (also known as automated impedance tuners and automated load pull tuners) are precision instruments that are optimized for a broad class of in-fixture and on-wafer applications, and may be used in any automated or manual application requiring the ability to match the impedance of a microwave circuit element or to establish specific impedances at a terminal interface. The tuner design is based on the slide screw concept using the inherently broadband slab-line transmission structure. Each unit has two non-contacting probes deliver high VSWR with superb accuracy and reliability over a wide frequency range. These probes can be fully retracted leaving a low-loss, well-matched transmission line, which is a significant benefit in power related applications where two-port tuners capable of handling large amounts of power are required. As integral components of Maury Device Characterization Solutions, these PC-based tuners are controlled using Maury's family of Device Characterization Software tools, including MT930 IVCAD, MT993 ATS and the DLL-based measurement automation environment. Maury Microwave automed impedance tuners are ideal for load pull, harmonic load pull, active load pull, hybrid active load pull, noise figure, noise parameters and all automated tuner applications.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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RCS Software
CEMExpert
CEMExpert is a software dedicated to the prediction of radar cross-section of aerial and naval targets. The software uses both the high-frequency asymptotic method (PO-PTD) as well as the full-wave equation solver (FVTD). A quick calculation is made possible by automated meshing, scripts for azimuthal scan and parallel processing. The software has been used for improving stealth performance of UAVs, for shape optimization of naval ships and RCS characterization of target missiles.
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PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Test & Measurement
NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
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Safety Laser Scanner
Leuze electronic GmbH + Co. KG
Thanks to the configurable protective and warning fields, safety laser scanners can be used versatilely for danger zone and access guarding. Their compact design makes them ideal both for stationary and for mobile applications. Our RSL 400 safety laser scanners are characterized by their performance, robustness and easy handling. Thanks to its high operating range of 8.25 m and a scanning angle of 270°, it can monitor even large areas. The series also includes models for integration via PROFIsafe/PROFINET interface and models with data output for the navigation of automated guided vehicles.
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High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Field Comm Analyzer
S5800H
S5800H Series Field Comm Analyzer is an 8.4 inch large touch screen instrument which is designed specifically for wireless communications field engineers and technicians. S5800H series provide all necessary measurement functions and performance to accurately characterize the signal environment in addition to clearing, detecting, identifying and locating signal interferenc.
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Resistance Calibration
Process Instruments maintains fractional part-per-million accuracy with a state of the art resistance calibration facility. Specialized services include precision resistor manufacture, resistor and shunt repair, characterization of alpha and beta temperature coefficients and the determination of barometric effects on resistance values.
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Ultra High Frequency Vibrometer
UHF-120
Polytec?s New UHF-120 Vibrometer Laser-Doppler Vibrometers (LDV) can characterize the out-of-plane vibrations at ultra-high frequencies. Polytec?s UHF-120 extends the vibration frequency bandwidthup to 600 MHz.
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Spectroscopic Ellipsometry
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Hardness Testers
The QATM hardness tester portfolio covers all standard test methods, such as Vickers, Brinell, Knoop & Rockwell, as well as a wide test load range. The entire hardness tester range is characterized by technological innovation, precise measuring instruments and maximum comfort due to automation and advanced interfaces.
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Optical Return Loss (ORL) Meter
OPTOWARE-S300 (FOTS-ORL Meter Systyem)
The Optical Return Loss(ORL) Meter is an efficient system for the characterization and test of optical components and systems to be performed in high quality.
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Earth resistivity meter
16GL-N
Last release of a very popular family of earth resistivity meters, this 16 bits geoelectrical instrument represents a really performing and affordable solution for Vertical Electrical Soundings at medium and great depth. Reliable and lightweight, 16GL-N is characterized by really first-rate performances, even if it remains extremely easy to use. The possibility to download data through USB enables a quick interpretation with the data inversion software. It is recommended, as to exploit its capabilities, to use it in conjunction with one or more P-100-N rechargeable accumulators.
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Toolset for NI TestStand
TS+
MESULOG TS + includes new configurable TestStand steps that simplify product characterization and validation, while reducing the time and cost of developing test sequences. With TS + , you can easily create advanced loop structures, save and replay datasets, display data dynamically, and include screenshots in your reports.
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Infiniium UXR-Series Oscilloscope: 33 GHz, 4 Channels
UXR0334A
The UXR0334A is the 33 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope, that offers 10-bit high-definition ADC, 20 femtoseconds (typical) of intrinsic jitter for exceptional jitter characterization.
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PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Analog Modulation and Frequency-Dependent Measurements
Modern lightwave transmission systems require accurate and repeatable characterization of their optoelectronic, optical and electrical components to guarantee high-speed performance.
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Ensure Accurate Screening, Diagnosis and Monitoring
CT QA Solutions
Over 40 years of experience helping our customers with CT compliance and patient safety. From CT Perfusion verification, to Dual Energy Characterization, to daily, monthly and annual CT QC, Gammex is your trusted CT QA and compliance partner.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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PXI Electronic Load Module
PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
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Dynamic Vapor Sorption Analyzer
IGAsorp
The IGAsorp is a fully automated compact benchtop DVS analyzer, for fast and accurate vapor sorption measurements using the dynamic flow technique for water and organic solvents. Measured vapor uptake isotherms and kinetics are used to characterize, test and evaluate materials in precisely defined environmental conditions.
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PXIe Vector Network Analyzer
M937xA Series
The Keysight M937xA vector network analyzer (VNA) performs fast, accurate, measurements and reduces your cost-of-test by giving you simultaneous characterizations for two-port or multiport devices with a single PXI chassis.
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OTDR
Shenzhen Sharingtek Communication Co., LTD
Is an optoelectronic instrument used to characterize an optical fiber. It is the optical equivalent of an electronic time domain reflectometer which measures the impedance of the cable or transmission line under test.
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Spectrum Analyzers
From entry level swept spectrum analyzers to advanced real-time analysis RIGOL provides unprecedented value. Whether you are doing simple signal visualization, integrating wireless technologies into your IoT design, characterizing component performance, preparing for emissions compliance testing or working with complex modulated signals RIGOL has a Spectrum Analyzer to fit your need and budget.
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Surface Imaging & Metrology Software
Mountains®
Analyze multiple types of surface data. Turn your surface data into accurate, visual surface analysis reports. See every feature with high quality real-time 3D imaging of surface topography. Characterize surfaces in accordance with the latest metrology standards.
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EasyEXPERT Group+ Software (for PC)
Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
