Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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IEC60695-11-2 Single Wire And Cable Vertical Burning Tester
CX-D12
Shenzhen Chuangxin Instruments Co., Ltd.
It’s strictly designed according to IEC60695-11-2, IEC60332-1, GB/T18380.11-2008, GB/T18380.12-2008 etc. Stainless steel screen with a sliding burner handle support for approaching or movingback the flame from the sample under test according to the CEI standards for test on cables.
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AC / DC Combined High Voltage Test Set
Cambridge Instruments & Engineering Co.
suitable to perform AC High Voltage Power Frequency test on transformers, motors, cables etc. Leakage current can be measured at desired pressure and this set can be used as a source for cable fault burning.
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
High power logic individual temperature control
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Fire & Flammability Test
Fire & Flammability testing: ASTM E119 [UL 263]; ASTM E152 [UL 10C]; ASTM E814 [UL 1479]; API 607, 6A; ASTM E108 [UL 790]; UL 1709; UL 1715; UL 2043; NFPA 286; UBC 26-2; UBC 26-3; ASTM E84 [NFPA 255, UL 723]; ASTM E162; ASTM E662 [NFPA 258]; ASTM D635; ASTM D1929; ASTM D2863; ASTM E1354; ASTM E1317; Room Burn Facility; CAL 133, 117, 129; UL 94 V/HB; IMO A.652 (16); IMO A.653 (16); ULVW I; ASTM D2859; AITM 2.0007; NFPA 701; FMVSS 302; FAA 25.853; IEEE 383
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DC Power Supplies
XFR Series
AMETEK Programmable Power, Inc.
XFR is the smart choice for research, product development and production test applications such as R&D, magnet control, product design, ATE, process control, electroplating and burn-in. The unique features of XFR make it the best choice for applications where high power and a wide adjustment of output voltage or current are required in a full 19-inch rack package. Choose from ten 2800-watt models.
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Masks Flame Retardant Performance Tester
WKS-1208
WKS-1208 Masks Flame Retardant Performance Tester is used to test the burning performance of the mask after contacting the flame at a certain linear velocity. It is special test instrument for the flame retardant performance of masks.
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6 Chip Detection and Burn Channels
CD1
The CD1 provides 6 Chip Detect and Fuzz Burn interface(s). A Chip Detector (CD) is a magnetic-electrical device that provides a reliable method of detecting impending failure of bearings and gears.
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Laser Diode Light Current Voltage (LIV) Test Instruments
The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Multisite Probe Card
T300 ButtonTile™
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Burn-In Boards
Meets burn-in requirements, including extreme temperatures or continual handling. 2 or more layers of polyimide. 200 C maximum temperature. Gold-plated connectors.
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J-Detect Pro
With J Detect, rest assured about the results. Its highly accurate scanner misses nothing and can also detect if the diamond is enhanced or treated at a budget that doesn’t burn a hole in your pocket.
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6 ½ Digits Dual-Display Digital Multimeters
SDM3065X
The SIGLENT SDM3065X-SC includes a multiplexer that provides multi-point measurement capabilities. The scanner features 12 multi-purpose + 4 current channels and supports the following measurement functions: DCV, ACV, DCI, ACI, 2WR, 4WR, CAP, FREQ, DIODE, CONT and TEMP ( RTD and Thermocouple ). It provides a convenient and versatile solution for test applications that require multiple measurement points or signals and is an ideal tool for R&D burn-in and production testing.
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Qualification Hardware & Sockets
Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include: HTOL Boards (Mother and Daughter cards) Burn-In Boards HAST Boards THB (humidity) Boards Burn-In Modules and frames Dynamic Driver cards (Digital, Analogue and Mixed signal) Back Planes Voltage regulator cards Custom electro-mechanical assemblies DUT Cassettes and test Fixtures
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Memory Burn-In Tester
H5620/H5620ES
As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Horizontal Flammability Tester
Part Number:
TESTEX Testing Equipment Systems Ltd.
Horizontal Flammability Tester, to determine the comparative burn rates and burn resistance of textiles, particularly those for automotive interior use. Horizontal flammability tester is safe and easy to operate, Comprises draft free stainless steel cabinet with observation window, sample holder and door mounted burner. Horizontal Flammability Tester complies with ISO 3795, ASTM D5132,FMVSS 302, etc.
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Thermal Protective Performance Tester (TPP)
Sataton Instruments Technology CO., Ltd
Thermal protective performance tester (TPP) is to determine the heat transmission of protective clothing or textiles exposed to flame and radiant heat resources. The tester which can provide thermal protection index (TPI) calculated by software is the recommended tool for evaluation the potential of second degree burn of the materials to block convective and radiant heat penetration. Analysis software can display real-time temperature curve and automatically detect heat time curve to show Stoll curve for rating the thermal protective performance of tested textiles.
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Multisystem Ignition Analyzer
TA500
The TA500''s unique and proprietary technology allows the user to perform quick and reliable diagnostics of non-starts, misfires, fouled up or damaged spark plugs and/or spark plug wires, by comparing digital read-outs of the spark plug voltage and spark burn time between cylinders on engines using Coil on Plug, Coil near Plug, conventional distributor/ignition coil, DIS (Distributor-less) or waste spark and magneto technologies.
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Stability and Shelf Life Test Chambers / Rooms
Steady state environmental temperature and humidity walk in rooms for pharmaceutical, medical, electronics, personal care, research and development and consumer products applications. Meets all ICH guidelines. Flexible sizes. For stability and shelf life testing, package testing, accelerated aging, drying, burn in, reliability testing, controlled temperature storage, incubation, and cold room applications.
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High Voltage Switching Test System
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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BIB Loading
FALCON Series
The Falcon Series is an automated BIB loading and unloading machine. It is designed to provide precise high-speed loading of DUTs from Trays/Tube to Burn-in boards and precise high-speed unloading of DUTs from Burn-in boards to Trays/Tube for different device packages. The Falcon Series also has a simple conversion kit which allows end-users to re-configure the equipment for different types of sockets and package combinations.
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Medical Storage Chambers
KDM
The Bemco KDM is similar to the Bemco Koldburn KDR except it has a circular air flow conditioning system located on the chamber ceiling, and is optimized for shelf supported temperature cycling, burn-in, stress screening, and storage of valuable pharmaceutical products or medical devices.
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Blanket Flammability Tester
TF316
TESTEX Testing Equipment Systems Ltd.
Blanket Flammability Tester, to determine the ignition resistance property of blanket fabrics and surface flame spread performance of fabric. A standardized flame is applied to the surface of specimen for a special time under controlled conditions, and burning, changing, or discoloration of a paper monitor is noted to classify flammability of tested fabric.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Burn-In System
The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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Radiant-Heat Protective Performance Tester (RPP)
Sataton Instruments Technology CO., Ltd
Radiant-heat protective performance tester which is normally called as RPP tester is to determine the radiant-heat protective performance of single or multi-layer textiles or other materials intended for heat protective clothes or assembly against radiant heat. The tester is a limited suitable tool for evaluating the potential of textiles for second degree skin burns.
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Flash Point Testers
Flash point is the lowest liquid temperature at which a test flame causes sample vapors to ignite. Fire point is the temperature at which the test flame causes the sample to ignite and remain burning for ≥5 seconds.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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/883
Renesas has a strong heritage of supplying memory, microprocessor peripherals and analog products to the high-reliability (Hi-Rel) marketplace. Renesas continues to supply SMD products that are offered in hermetic packages and with guaranteed performance over a -55 °C to +125 °C temperature range. SMD products are MIL-PRF-38535 compliant and are 100% burned in.
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Surge Generator
Techno Instrumentation (India) Private Limited
LT to HT 11 kV and 33kV Surge Generator is an all in one solution for thumping, DC high voltage testing(Hipot-test) and burning for effective fault location in LT to HT 11 kV and 33kV cables.
