Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
-
Product
Burn-In Test
-
C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
-
Product
RF Bias Burn-In System
-
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
-
Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
RF Burn-In Services
-
Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
-
Product
Burn-In System
-
The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
-
Product
System Level Test and Burn-in Solutions
-
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
-
Product
Burn-In Test Sockets
-
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
-
Product
Burn-in Room and Aging Test Chamber
-
Aging test room according to your requirements. More types of Burn-In Test Room, Burn-In Chamber, Burn-In Test Oven wanted, please contact us freely.
-
Product
Burn-In Boards
-
Meets burn-in requirements, including extreme temperatures or continual handling. 2 or more layers of polyimide. 200 C maximum temperature. Gold-plated connectors.
-
Product
Memory Burn-In Test
-
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
-
Product
Polarity & Burn in Test Systems
-
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
-
Product
Production Wafer Level Burn-in
-
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
-
Product
Burn-In Systems
OPTIMUM Series
-
Advanced Microtechnology, Inc.
The OPTIMUM product line of burn-in systems has a model to meet your individual testing requirements. Please select one of the models below for more specific information
-
Product
Advanced Burn-in and Test System for packaged parts
ABTS-Li
-
High power logic individual temperature control
-
Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
-
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
-
Product
Laser Diode Burn-In Testing
-
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
-
Product
Multi-Wafer Test & Burn-in System
FOX-XP
-
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
-
Product
Burn-In Boards
-
Manufacture of burn-in boards since 1976. Established for more than 40 years in the market, Trio-Tech is recognized and is an approved global supplier to all major semiconductor companies. Trio-Tech has the capability to design and manufacture boards for all system types, with solutions available for many test conditions, Including HTOL, PTC, HAST and 85/85.
-
Product
/883
-
Renesas has a strong heritage of supplying memory, microprocessor peripherals and analog products to the high-reliability (Hi-Rel) marketplace. Renesas continues to supply SMD products that are offered in hermetic packages and with guaranteed performance over a -55 °C to +125 °C temperature range. SMD products are MIL-PRF-38535 compliant and are 100% burned in.
-
Product
Electric Burn-in Board Carts
-
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
-
Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
-
Product
BGA Sockets
-
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
-
Product
Analog Multimeters -VOM
-
Triplett Test Equipment & Tools
Analog Multimeter is a multi-range instrument for electrical and electronic troubleshooting and measurement. It can stand up under rigorous hard usage of the industrial and maintenance environment. Using a unique design and selection of materials, it can withstand the normal accidents of dropping (up to 5 ft.) and rough handling which occur in hard day to day use. Engineered for significant reduction in the need for maintenance by virtual elimination of parts burn out (other than fuses), and parts damage from severe mechanical abuse.
-
Product
Multi-Stage Injection Measurement System
-
Common rail fuel injection system in diesel engines is a fuel injection system which improves output performance and fuel consumption by purifying exhaust gas (soot, NOX) and reducing noise and vibration.The fuel is completely burned by being sprayed in the form of mist which burns easily at high pressure, and furthermore the combustion timing is optimized with electronic control.In this common rail injection system, injection timing by an electric controlling has great effect on the performance of an engine. So measurement of injection amount, injection rate, and injection timing are very important. FJ-8000 series Multi-Stage Injection Analyzer is able to measure those parameters for every 1 cycle by simulating in the environment which is near to an actual vehicle running.
-
Product
IC Test Services
-
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
-
Product
Wood Moisture Meters
-
PeakTech Prüf- und Messtechnik GmbH
High quality wood and material moisture meter, which is characterized by its ease of use and universal applicability. The device has an LCD display, in which measured values of humidity and ambient temperature are displayed. In addition, it is equipped with an LED display, which enables a quick good-bad assessment of the measured values. When burning wood in a wood-burning stove with a high moisture content, the efficiency of the stove decreases, while at the same time the emission of pollutants, such as soot and fine dust, increases. In addition, there is a build-up of soot in the chimney, which can lead to a fire. Therefore, this device is ideal for wood storage, control during the heating season or use in construction.
-
Product
Programmable USB Hub with 4 Charge Ports
-
The USBHub2x4 is a programmable USB 2.0 compatible hub featuring 4 device downstream ports with standard USB type-A receptacles and each port is capable of delivering up to 2.5A simultaneously. With two host (upstream) connections using usb mini-B connectors, the USBHub2x4 is perfect for environments where multiple devices need to be shared or switched between two host computers. E.g.: software regression testing, iPhone software development and validation, Android software development and validation, USB device regression testing, manufacturing testing, device burn-in testing and USB device charge-curve testing.
-
Product
AC / DC Combined High Voltage Test Set
-
Cambridge Instruments & Engineering Co.
suitable to perform AC High Voltage Power Frequency test on transformers, motors, cables etc. Leakage current can be measured at desired pressure and this set can be used as a source for cable fault burning.
-
Product
External Pyrometric Camera for Combustion Thermal Monitoring
PYROSCAN-U
-
Pyroscan-U is specifically designed to perform thermal monitoring and mapping of any object inside a kiln, furnace, boiler or reactor, while looking at the area of interest through a standard window, from outside the combustion chamber. This megapixel pyrometric camera captures both visible and infrared HDR (High Dynamic Range) images of the burning zone.
-
Product
300mm Single Touchdown Burn-in and Test System
FOX-15
-
Up to 15 wafers at a time Known Good Die solution Lowers production cost
