-
Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
-
Product
Flying Probe Tester Substrate
-
Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions forscanningcapacitance measurementhigh accuracy and temperature Management
-
Product
CAM/GATE Test Kits
Series 45
-
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
-
Product
Switches
-
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
-
Product
Breakout Box
T1000-9
-
T1000-9 breakout box is our most compact breakout box, using dual 9 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 18 test points plus a ground jack. All test points use standard size 4mm banana jacks. Ideal for continuity testing, isolation testing or signal capture and monitoring.
-
Product
Offline In-Circuit Test Solutions
-
TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.
-
Product
Copper Network TAPs
-
Network test access points (TAPs) are a hardware tool that allows you to monitor your network. Garland Technology offers copper network TAPs in network speeds of 10/100M or 10M/100M/1000M (1G). Copper TAPs are purpose-built hardware devices used for out-of-band monitoring tools and make a 100% copy of your networks data allowing your monitoring tools to see every bit, byte and packet.®
-
Product
15 Pin Breakout Interface
VSI-Breakout-15
-
The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
-
Product
Non-Contact Voltage Detector
VOLTCHEK
-
The VOLTCHEK is a variable non-contact voltage detector, A proximity device which detects the presence of an alternating electric or electromagnetic field. It is used by industry professionals for live or dead voltage determination of outdoor overhead or underground at URD test points. Firstly as a proximity device to determine live or dead situations and then as a touch device to verify the source has physically reached the zero AC field. This is the only equipment capable of testing all voltage from AC 415V to 765kV from a distance, beyond arcing zone.
-
Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
-
Product
Stand Alone Low Voltage Tester
Model 256/PC
-
Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
-
Product
Consistency
-
Benefit from Anton Paar’s longstanding experience in consistency and ductility testing. From essential tools for surface penetration, grease working, and softening point testing to reliable breaking point testers – Anton Paar’s widely applicable solutions for consistency testing guarantee full compliance with a vast range of relevant standards.
-
Product
Test Board For SFP+ / SFP28 Transceiver
ESFP280
-
The OPTELLENT ESFP280 is a cost-effective and convenient test board for testing SFP/SFP+/SFP28 optical transceivers in R&D and manufacturing environments. The ESFP280 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The ESFP280 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
-
Product
CAMGATE Test Kits
Series 457
-
The VP Series 457 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 457 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those preferring to provide their own ITA Interface. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
-
Product
Breakout Box
T1000-62HD
-
Our most expansive breakout box, using dual High Density 62 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 124 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity.
-
Product
Differential Probes < 1.5GHz
-
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point
-
Product
Speedometer Test Bench
TPS 25 EURO | VP 640005
-
Maschinenbau Haldenwang GmbH & Co. KG.
The test lane-compatible TPS 25 EURO is ideal for evaluating deviations in the speedometer speed in two-wheeled vehicles up to 1.5 t. The speedometer test can be carried out with up to ten freely selectable test points. The distance can also be measured with optionally up to ten freely selectable test points.
-
Product
Reverse Osmosis Meters For Measuring Total Dissolved Solids
RO Meters™
-
The choice of professionals for years, this compact instrument has been designed specifically to demonstrate and test Point of Use (POU) reverse osmosis or distillation systems. By measuring electrical conductivity, it will quickly determine the parts per million/Total Dissolved Solids (ppm/TDS) of any drinking water.
-
Product
Voltage Indicators
-
*Measures voltage from 100V to 138kV line‑to‑line.*Can be used individually as voltage indicators or together for phasing operations up to 100 ft (30 m) apart.*Two LED displays are automatically synchronized during phasing operations.*Clear in-phase and out-of-phase indication.*Versatile for overhead and underground applications.*Capacitive Test Point and Peak Hold modes
-
Product
MTA Wiring Analyzer
2650
-
DIT-MCO's newest test solution, the Model 2650, incorporates modularity so that the system conforms to your testing needs. The modular switching units can rack-and-stack in a cabinet providing concentrated test points or can be distributed around the Unit Under Test (UUT) eliminating long, cumbersome adapter cables. Or you may reconfigure the system at any time when your needs or the UUT changes.
-
Product
Very High Density Fiber Tap
Flex Tap VHD
-
Keysight Network Applications and Security
Flex Tap VHD is a modular, very high density fiber tap available, offering up to 36 taps in a 19 inch 1U space, to reduce IT costs while helping ensure availability of security and business critical applications. Network taps (test access points) are a key part of the access layer of a visibility architecture because they are an unobtrusive way to capture monitoring data. They offer comprehensive traffic visibility for network monitoring and security tools that do not introduce points of failure in the network. Ixia has a large variety of network taps on the market today, offering speeds from 1Gbps to 100Gbps, single and multi-mode, as well as different fiber types and support for Cisco bidirectional (BiDi) transceivers.
-
Product
WiFi Traffic Generators
LANforge WiFIRE
-
wireless traffic generator is an excellent choice for testing Access Points and other WiFinetworks. The CT520 uses a modified Wireless driver for WiFi NICs based on the Atheros chipset. It cansupport up to 32 Virtual Stations. Each of the Virtual Stations has its own IP address, IP port space, MACaddress and routing table. The Virtual Stations can be assigned to communicate to a particular AccessPoint, use a particular SSID, and have a WEP (64 or 128bit) or WPA/WPA2 key assigned. More advanced802.1X authentication is also included. There is a single WiFi radio per CT520 but multiple LANforgesystems can be clustered together for more realistic radio interference patterns and increased trafficgeneration capability. The radio supports 802.11 a, b, g or n mode. Transmit power andchannel/frequency is configured on a per-radio basis. Most other settings are configurable per virtualstation
-
Product
Field Portable Wire Analyzer
Model 2635
-
The perfect tester for field use is rugged, mobile, and lightweight, without sacrificing the functionality and power of a larger system. That tester is found in the Model 2635. Weighing 32 pounds (14.5 kg), this wiring analyzer handles up to 400 test points of Series 10 switching per unit. The 2635 can be powered from any AC source 100-240 VAC or 28 VDC so you can use it anywhere in the world.
-
Product
Wire Harness Tester
NX Solo
-
The Dynalab NX Solo Tester is an economical, feature-rich, stand-alone wire harness tester offering up to 256 test points. The powerful NX Editor software application is used to create unique program files to successfully validate all electrical and electro-mechanical wire harness parameters. This tester is compatible with all Dynalab NX accessories such as printers, scanners, control ports, and much more. The NX Solo Tester supports network communications with the NX Server for efficient file transfers and advanced data collection.
-
Product
Reference Thermapen®
-
Until now you would have spent hundreds more to get this level of accuracy in a NIST-Traceable standards thermometer. Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
-
Product
Passive Oscilloscope Probes
5900 SERIES
-
Probe Master's new 5900 series passive oscilloscope probes are available in 400 MHz & 500 MHz bandwidths. Probes are also available with readout actuators for oscilloscopes with the readout feature. The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.The probe body is made of high impact ABS. Soft molded strain reliefs at all stress points assure long cable life. In short it has been designed to offer you high performance coupled with high quality.
-
Product
LCR Meter
MCR8000 Series
-
MCR8000 Series is a LCR meter also called impedance analyzer with high precision and high quality. With new 32-bit core, as good as first class equipment. 7 inche true color TFT display. 20Hx-5MHz testing frequency, frequency point continuously adjustable.
-
Product
PXI RF Multiplexer Switch Module
RF Multiplexer
PXI RF Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI RF Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
-
Product
CAM/TRAC Test Kits
Series 40
-
The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
-
Product
SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-33
Relay Matrix Module
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.





























