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Product
WiFi Traffic Generators
LANforge WiFIRE
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wireless traffic generator is an excellent choice for testing Access Points and other WiFinetworks. The CT520 uses a modified Wireless driver for WiFi NICs based on the Atheros chipset. It cansupport up to 32 Virtual Stations. Each of the Virtual Stations has its own IP address, IP port space, MACaddress and routing table. The Virtual Stations can be assigned to communicate to a particular AccessPoint, use a particular SSID, and have a WEP (64 or 128bit) or WPA/WPA2 key assigned. More advanced802.1X authentication is also included. There is a single WiFi radio per CT520 but multiple LANforgesystems can be clustered together for more realistic radio interference patterns and increased trafficgeneration capability. The radio supports 802.11 a, b, g or n mode. Transmit power andchannel/frequency is configured on a per-radio basis. Most other settings are configurable per virtualstation
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Product
Precision Flying Probe Platforms For Automated Test Applications
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Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design.Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Product
SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-13
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4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Dedicated Testers
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Dedicated Testers are often inexpensive due to their low test point requirements, which allow for a reduction in switch cards, especially when compared with a Universal Tester. Ease of setup is accomplished through the utilization of transfer connectors between the fixture and the machine. However, this can contribute to a higher fixture cost than typically seen with a Universal Test Fixture due to the nature of their construction which is labor intensive.
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Product
Cable and Harness Tester
CHT
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The Cable and Harness Tester (CHT) provides multiple testing capabilities for up to 300 connector/harness test points. Test capabilities include DC Insulation Resistance (IR), DC and AC Dielectric Withstanding Voltage (DWV), and 2-Wire and 4-Wire Continuity.
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Product
PC Based Tester
Cablescan L8
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The Cablescan L8 provide the PC-based power of the larger PC based testers, but in an economical package for users who do not require more than 1024 test points. This analyzer is designed to operate under the control of your PC.
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Product
Mag Lead w/Alligator Clips
138
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*54" Test Lead Set *Mag Lead features a magnetic disconnect. *You can "stick" to any metallic ground or test point. *Time saving product - can substitute for alligator clips at metallic test points. *Now, when you need alligator clips, you've got them! *Fits almost all DMM's and hand held scopes. *Get the Mag Lead, it stays put and won't fall off!
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Product
Differential Probes (4-6 GHz)
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Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point. Dx10/Dx20/Dx00A-AT 4-6 GHz differential probes are a general purpose probing solution with high input dynamic range and offset.
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Product
15 Pin Breakout Interface
VSI-Breakout-15
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The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Product
Switches
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Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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Product
Digital Voltmeters
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*Measures voltage from 5V to 25kV line to line*Large, easy to read LED display*Versatile for overhead and underground applications*Capacitive Test Point and Peak Hold modes
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
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The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Voltage Indicators
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*Measures voltage from 100V to 138kV line‑to‑line.*Can be used individually as voltage indicators or together for phasing operations up to 100 ft (30 m) apart.*Two LED displays are automatically synchronized during phasing operations.*Clear in-phase and out-of-phase indication.*Versatile for overhead and underground applications.*Capacitive Test Point and Peak Hold modes
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
EOL RF Functional Test
AS652
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With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Military Communications Test
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Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Mixed Signal Battery Test System
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The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
PXI Digital Test Instrument
PXIe-6943
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
VXI Digital Test Instrument
T940 Series
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The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Product
ARINC-708 Module
M4K708
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The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
