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Product
Breakout Box
T1000-62HD
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Our most expansive breakout box, using dual High Density 62 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 124 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity.
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Product
Flying Probe Tester Substrate
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Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions forscanningcapacitance measurementhigh accuracy and temperature Management
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Product
Test adapter LRP-LR (Type D, 4 mm)
MA-LPL02D
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Hachmann Innovative Elektronik
Our test adapter MA-LPL02D connects LR measuring devices to standardized LRP string parts and capacitive test points. An insulating tube with great dielectric strength shields the user from static energized test points without automatic earthing.
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Product
Hand Pumps And Controllers
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Ashcroft® offers a variety of hand pumps to generate pressure or vacuum for instrument calibration. In addition, the unique Ashcroft volume controller can be added to most pneumatic calibration benches to make it easy to dial-in specific pressure test points without wasting time under-shooting and over-shooting the target point.
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Product
Fixture and Software for Open/Leak Inspection
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In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC-READ provides specialized software for test point selection and log analysis.
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Product
Time Domain Replication (Road Load Simulation)
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The powerful graphical editor makes it easy to review and compile your field sample data for use in the test lab. The point editor, filters, velocity and displacement compensation ensure the test feasibility is evaluated at an early stage. The continuous closed-loop controller then replicates the test files with very high levels of precision. The control algorithms use a continuous coherence averaging technique to ensure a stable proactive control loop that will not only provide accurate replication but will also respond to changes in test item dynamics.
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Product
Reference Thermapen®
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Until now you would have spent hundreds more to get this level of accuracy in a NIST-Traceable standards thermometer. Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
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Product
SWB-2814, 8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781421-14
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8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2814 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Configurable Reostat or Potentiometer Module
YAV90084A
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4x 8-Bit 1KOhm reostat4x 8-Bit 40 Ohm reostat2x 8-Bit 5 MOhm reostat10x Electronic Potentiometer 8-bit resolution -256 steps- with build-in self test10x Voltage to current source 0(4)..20mA10x Analog Outputs (buffer for voltage or frequency)36-Ch Test Point voltage divider2xCAN Bus Channels Terminators testerExpandable with NI PXI-6723 and PXI-6345.
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Product
50 Pin Breakout Interface
VSI-Breakout-50
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The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Product
3-Axis Motion Simulators
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When a device under test needs to be stimulated with simultaneous movements around three axes, then a product from the ACUTRONIC three-axis motion simulator range is the right choice. Independent motion simulation in three axes makes them very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Product
TRUE Z-AXIS CAM ACTIVATED TEST FIXTURE KITS
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The Cam Press is designed to provide precise, bed-of-nails contact, in a production test environment. Durable aluminum and steel construction and precision bearings insure accuracy and repeatability sufficient to contact test points as close as 10-mils center-to-center.
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Product
Testing Services
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*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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Product
Bead Target Probes
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A methodology for placing test points directly on a PCB's copper traces, or top metal, thus forming a “Bead Probe”.
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Product
Digital Multimeter
8808A
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The Fluke 8808A 5.5 digit multimeter dependably performs the most common measurements required by today’s applications. Whether you are performing functional tests or making critical measurements on test points, using the limit compare mode with pass/fail indicators eliminates production mistakes, especially those where results are “on the edge.
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Product
Multipurpose Debug Board For EC
DB30 x86 Debug Module
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The DB30 x86 Debug Card is designed for debugging of COM Express modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
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Product
Auto Wire Integrated Tester Series
LX-1024A+
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Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·1024 Max. Test Points ,(Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Using Embedded Linux operating system，．·Adopted high resolution colour 640*480 TFT LCD ,．·Large 320×240 LCD display ,．·Instant test time :0-60s , optional adjustment.．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,
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Product
CAMGATE Test Kits
Series 457
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The VP Series 457 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 457 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those preferring to provide their own ITA Interface. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Product
Wire Harness Tester
NX Solo
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The Dynalab NX Solo Tester is an economical, feature-rich, stand-alone wire harness tester offering up to 256 test points. The powerful NX Editor software application is used to create unique program files to successfully validate all electrical and electro-mechanical wire harness parameters. This tester is compatible with all Dynalab NX accessories such as printers, scanners, control ports, and much more. The NX Solo Tester supports network communications with the NX Server for efficient file transfers and advanced data collection.
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Product
Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Product
Test Points
TestStation LX2
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TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integrated printed circuit board assemblies.
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Product
Stand Alone Low Voltage Tester
Model 64×2
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Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
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Product
SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-34
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8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
OTP-Based Test System
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Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Programmable Hi-Pot Tester
DU331/332/333
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Delta United Instrument Co., Ltd.
Large LCD Display Window for Setups and Test Values Output Frequency 50/60 HZ SelectableAll Initial Default Function Setting scan be Changed Easily to Fit RequirementEasy Manual Driven with Cursor Guiding Operation Mode Battery Backup Function will Recall theTest Parameter Settings before Power offLarge Memory (100 sets) for Setup Steps & ParametersEach Memory offers 9 steps of different Test ParametersTest mode: Single Step, Multiple Steps (Step by Step), Test Circle Number or Continuous Test are Programmable DU333 is designed for Multi-point Scan Test DU331/DU332 can perform Multi - point Test when used with Scan Box DU330
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Wire Harness Tester
NX Pro
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The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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Product
Functional Test
xUTS
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Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Non-Contact Voltage Detector
VOLTCHEK
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The VOLTCHEK is a variable non-contact voltage detector, A proximity device which detects the presence of an alternating electric or electromagnetic field. It is used by industry professionals for live or dead voltage determination of outdoor overhead or underground at URD test points. Firstly as a proximity device to determine live or dead situations and then as a touch device to verify the source has physically reached the zero AC field. This is the only equipment capable of testing all voltage from AC 415V to 765kV from a distance, beyond arcing zone.
