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Product
PTFE Insulated Terminals And Test Point Jacks
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Ideal for High Temperature, high quality terminal and PCB connector applications.
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Product
Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Analyzer
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Product
25 Pin Breakout Interface
VSI-Breakout-25
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The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Product
Benchtop/Portable Cable/Harness Wiring Test System
CKT1175-10
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Designed for wiring testing requirements requiring up to 2,000 test points, the CKT1175-10 is ideal as a benchtop or portable test system. The system is packaged in an enclosure specifically designed to be used in rugged environments. The basic 500 test point system is 20.5 in. (521 mm) wide X 12.0 in. (305 mm) high X 16.05 in. (408 mm) deep; the 500 test point expansion units are 20.5 in. (521 mm) wide X 6.00 in. (153 mm) high X 16.05 in. (408 mm) deep.
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Product
Passive Fiber Network TAPs
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Passive network test access points (TAPs) are a hardware tool that allows you to monitor your network. Garland Technology offers fiber network TAPs in network speeds of 1Gb, 10Gb, 40Gb and 100Gb. Fiber Network TAPs are passive, purpose-built hardware devices that make a 100% copy of your networks data - without affecting network traffic. Passive network TAPs let your monitoring tools to see every bit, byte and packet®.
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Product
Vertisocket™ Horizontal Mounting
Series 800
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Vertisockets Horizontal Mounting with Bifurcated Contacts. Aries offers a full line of VertisocketsTM for DIP packaging of LEDs, incandescent lamps, DIP switches, test points, etc. The variations of mounting position and pin configuration provide exceptional design freedom.
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Product
Electrical Test System TY-CHECKER
Type E Series
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High-speed, high-precision testers offered with a broad lineup, matching a range of test point numbers. Can be used alone and on our press systems.
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Product
CAM/TRAC Test Kits
Series 47
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The VP Series 47 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 47 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those wanting to provide their own ITA Interface.
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Product
Mag Lead w/Alligator Clips
138
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*54" Test Lead Set *Mag Lead features a magnetic disconnect. *You can "stick" to any metallic ground or test point. *Time saving product - can substitute for alligator clips at metallic test points. *Now, when you need alligator clips, you've got them! *Fits almost all DMM's and hand held scopes. *Get the Mag Lead, it stays put and won't fall off!
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Product
Copper Network TAPs
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Network test access points (TAPs) are a hardware tool that allows you to monitor your network. Garland Technology offers copper network TAPs in network speeds of 10/100M or 10M/100M/1000M (1G). Copper TAPs are purpose-built hardware devices used for out-of-band monitoring tools and make a 100% copy of your networks data allowing your monitoring tools to see every bit, byte and packet.®
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Product
CAMGATE Test Kits
Series 453
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LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Product
Voyager Intermittent Fault Detector
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The Voyager includes a spread spectrum TDR so that the fault can be located. Once an intermittent is detected, the TDR is immediately connected to the failed test point and used to determine the distance to the fault.
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Product
Wire Harness Tester
NX Pro
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The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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Product
SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781421-11
Reed Relay
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
CAMGATE Test Kits
Series 457
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The VP Series 457 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 457 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those preferring to provide their own ITA Interface. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Product
Dedicated Testers
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Dedicated Testers are often inexpensive due to their low test point requirements, which allow for a reduction in switch cards, especially when compared with a Universal Tester. Ease of setup is accomplished through the utilization of transfer connectors between the fixture and the machine. However, this can contribute to a higher fixture cost than typically seen with a Universal Test Fixture due to the nature of their construction which is labor intensive.
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Product
Testers for Aerospace and Railway
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Testers for the realization of a network with base unit and distributed test point units (TPUs).
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Product
DIOS (Digital I/O Scan Module)
JT 2122/MPV
Digital I/O
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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Product
PCB Test Points and Terminals
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Our PCB test points and terminals feature a large loop for easy probe attachment or to facilitate the clipping on of other components. They are ideal for components which need frequent replacement and are also suitable for raising hot components above the surface of the PCB.
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Product
Sharp Point Tester
UI-T04
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Sharp Point Tester is used to test if test object point is sharp or not. Sharp Point Tester in textile, footwear is commonly used to test ornament point sharpness. It is one of necessary safety testers widely used in toy, textile and other industries. Sharp point test standard includes EN71-1, BS7909, ASTM F963 4.9, 16CFR1500.48 and etc. This toy safety tester is purchased with sharp edge tester by most customers. Conact us for Sharp Point Tester price.
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Product
Stand Alone Low Voltage Tester
Model 64×2
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Internal Memory: 8 program locations without test point labels or 2 program locations with test point labels. Removable Memory: 16 program locations without test point labels, or 4 program locations with test point labels.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
Color Coded SMT Test Points
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Color Coded for easy identification, these surface mountable PCB test points are ideal for production testing and service troubleshooting. Phosphor Bronze, Silver Plated terminals allow for superior solderability and low electrical resistance. Wire loop design provides convenient access point for J-hooks, EZ hooks, grabbers, alligator clips, tips or probes.
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Product
Optical Voltage Probe
400-02
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Srico’s optical voltage probe uses advanced, proprietary optical chip technology to achieve precise, interference-free measurement. Our sensor and optical fibers are made of dielectric materials. This facilitates a high degree of isolation between the voltage test point and the instrumentation system ⎯ at a safe distance of 100 meters and more. This system senses, measures, and transmits electrical data very accurately.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Automotive Production Board Test
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Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.
