System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Bloomy Simulation Reference System
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The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Product
EST-200 Emission Safety Test System For Toys
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Hangzhou Everfine Photo-E-Info Co., LTD
The system can test the radiation intensity, irradiance, light color expansion angle, peak wavelength, dominant wavelength, bandwidth, etc. of various toy light emitting devices. The measurement conditions meet the CIE127 standard, and the test report meets the ENIEC62115:2020 standa
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Mini Rack 60*60*60cm
OTP2 module no.001
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The rack serves as the basic structure for your individually designed test system. Various OTP² modules can be installed in the 60 x 60 x 60 cm rack in order to implement a wide variety of test requirements.
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Walk-In Solar Spectrum Test Chamber
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WEIBER walk in Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. It is also called Walk in Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Solar spectrum chamber also known as Walk in Solar Simulation Test Chamber
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PXI Precision Resistor Module, 4-Channel, 2 to 6.97k
40-297-130
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This 4-channel PXI precision resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Traction Test Rectifiers
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A traction test system is defined as a rectifier with a DC output voltage above 400 VDC to a maximum of 4,500 VDC. (Kinetics manufactures only air-cooled systems) A Kinetics test system includes the required OSHA designated safety features for testing power supplies as a minimum for operator interface.
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Single Space Electro-hydraulic Servo Universal Testing Machine
WAW-F Series
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Jinan Testing Equipment IE Corporation
WAW-F series single space Servo-Hydraulic Testing System Computerized is suitable for testing tension, compression and other strengths of various metallic or nonmetallic materials with high strength. The ultra-large testing space & dual-action actuator with longer stroke enable it to test not only standard specimen, but also longer ones with long elongation every so often. Equipped with the electronics, computer &software packages, it is capable of controlling the test procedures by the predetermined programs. The Servo-Hydraulic Testing System Computerized can also display, record, process and print the test results. The test curves can be drawn automatically in real time. The Servo-Hydraulic Tester of Single Space is easy to operate and is versatile in the applications of metallurgy manufacturers such as steel mills & alloy, reinforced bar, aircraft industry, research institutes, laboratories, calibration institutes etc.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 510 Ohm - SPST
40-294-114
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These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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DC Voltage Test System
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HIGHVOLT Prüftechnik Dresden GmbH
DC test systems are used to test components and complete systems found in electrical power supply systems and operating on DC voltage.
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Engine Performance/Endurance Test System
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Various types of test system as follows can be built up in combination with measurement control equipment and peripheral instruments (fuel flow meters, actuators, temperature control device, combustion analysis system, ECU monitor, OBD, sound and vibration measurement instruments, emission analyzer, smoke meter etc.)·Traveling fuel economy test·Gas emission test·Output performance test·Deterioration/endurance test·Combustion analysis·Sound source probing
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Digital I/O PXI Card
GX5050
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The GX5050 is a high speed Dynamic Digital I/O card that provides a full set of features that is comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GC5050, but the GX5050 is a PXI card (6U) and the GC5050 is a PCI card. Both have the ability to operate independently of the host computer when in RUN mode.
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Light Sources
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There are many low cost artificial light sources used for illumination or for industrial applications: tungsten or halogen bulbs, fluorescent lamps, LED lamps etc. Some of these sources have regulated intensity of emitted light. However, there very few calibrated light sources of precisely known parameters. A light source can be considered as calibrated when its user can precisely regulate its photometric/radiometric parameters like luminance (or illuminance), radiance (or irradiance) at defined spectrum of interest. Such light sources are needed in many applications among them, in systems for testing night vision devices, VIS-NIR cameras and SWIR imagers. Inframet offers a series of calibrated light sources that can be divides into three groups:
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Primary Injection Test Systems
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Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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100 High Speed Programmer
Commander Accelerator
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The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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System Instruments
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Rockwell Hardness Tester
Versitron® Series
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Newage Testing Instruments, Inc.
The Versitron Rockwell hardness testing system is the industry workhorse of hardness testing - designed to meet the toughest challenges: clamp large parts, operate in poor environments, and test high volumes - all with less service problems and less operator skill requirements. Available with 2 different test stands types (in a range of sizes) and 2 test heads and also a wide range of other options.
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ISTA Testing
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ISTA is an organization focused on the specific concerns of transport packaging and whose mission is to develop and deliver standards, educational programs and tools for the economic, social, and environmental optimization of packaging systems. ISTA testing is a well defined shipping testing procedure designed to verify that your packaging is sufficient to protect your product during all shipping environments.
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Battery Fault Insertion Unit
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The Battery Fault Insertion Unit (FIU) provides intelligent switching of cell-simulation channels for the Battery Simulator 1200. The switching capability enables simulation of open-circuit and short-to-rail fault conditions on any cell channel for the purposes of battery management system (BMS) testing. Additionally, a four-wire auxiliary input allows you to connect an external digital multimeter (DMM) instrument to any cell channel for very high-accuracy bypass current and cell voltage measurements. Each FIU provides 24 independently-programmable cell-switching channels for one or two 12-cell Battery Simulator 1200 units. Additional Battery Simulator 1200 and FIU instruments can extend functionality up to 120 series-connected cell channels.
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Automotive Solutions
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One of the most challenging applications in the field of automotive testing is manufacturing electronics. With each successive model year, the number of automated features increases. Every segment of the automotive electronics plays a role in the safety and reliability. These critical applications require high dependability and low maintenance and warranty costs. Our customers don’t have room for error, hardware test systems must perform as designed. Circuit Check provides Automated Test Systems that meet the stringent needs of this marketplace.
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RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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TIM Tester
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The Analysis Tech TIM Tester 1300 is an automated test system for measurement of thermal impedance and conductivity on thin, thermally conductive materials of the type frequently used for electronic packaging, as well as a wide variety of flexible or rigid solids and semi-liquid or viscous materials. Generally, the TIM Tester 1300 can accommodate samples with high-to-medium thermal conductivity with contact pressures ranging from 10 to 550 psi (70-3800 kpa) and at sample temperature ranging from 15C to 70C.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 127 Ohm - SPST
40-294-112
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These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Analog Hipot & Insulation Tester
KT-5000Pi
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This is a Hipot(Puncture) Tester combined with Insulation Tester in a set.It tests 2 kinds of test continuously in sequence, and any of both hipot or insulation test can be set to test first in other by the selection switch.Hipot Tester has the leakage current meter, so the operator can check the leakage value while testing. And the preset procedure of the Insulation Tester is very easy. Both tester judge the product to be good or bad automatically in a short time.This tester has many I/O ports to connect extra test system. Price : 2,550 (USD)
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PXI Precision Resistor Module 6-Channel, 3 to 1.51M
40-297-050
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A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test System
4003 TLP+™
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The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Wire Crimp Testers
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Imada offers manual and motorized wire crimp test systems in either vertical or horizontal configurations.Lever-operated systems offer basic functionality and rapid destructive testing up to 220 lbf.Motorized systems have speed control and are capable of destructive or force-controlled non-destructive testing up to 1100 lbf.Choose from manual or automatic wire-gripping fixtures.Digital gauges offer data output for analysis with data acquisition software.Create your own custom configuration or consult our application specialists.
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Arbitrary Waveform Generator
AWG5200
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The AWG5200 Arbitrary Waveform Generator meets demanding signal generation needs with high signal fidelity and the ability to scale up to 32 or more channels with multi-unit synchronization at an affordable price. Ideal for advanced research, electronic test and radar, and electronic warfare system design and test.
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Test Solution Requirements Gathering
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When we first talk to our customers about their test requirements, they generally know what they want to achieve but often do not have the detailed requirement specifications to enable us to design and build a suitable test system for them. The process of generating a detailed design specification is both time consuming and stressful, so we understand the challenges this causes.
