System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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PXI RF Analog Signal Generator
PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 472Ω
50-297-120
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Power Transformer Automatic Test Device
XD71
Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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The Language of Technical Computing
MATLAB
MATLAB is a high-level language and interactive environment for numerical computation, visualization, and programming. Using MATLAB, you can analyze data, develop algorithms, and create models and applications. The language, tools, and built-in math functions enable you to explore multiple approaches and reach a solution faster than with spreadsheets or traditional programming languages, such as C/C++ or Java. You can use MATLAB for a range of applications, including signal processing and communications, image and video processing, control systems, test and measurement, computational finance, and computational biology. More than a million engineers and scientists in industry and academia use MATLAB, the language of technical computing.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 472Ω
40-298-020
The 40-298-020 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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ATE Development Services
Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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PXI Precision Resistor Module 4-Channel, 1.5 to 3.55k
40-297-123
.This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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System Test Fixture
Chassis Level Test Fixture, Set Box Test Fixture, and more by IST Engineering
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PCI Resistor Card 2-Channel 1.5 Ohm To 1.02k Ohm
50-293-021
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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LM-79 Moving Detector Goniophotometer
LSG-5000
Moving Detector Goniophotometer completely meets LM-79 Clause 9.3.1 and EN13032-1 clause 6.1.1.3 goniophotometer type 4 requirements. The LSG-5000 is an automatic light distribution intensity 3D curve testing system for measuring light. The measuring distance is from 5m to 30m. It can measure all types of lighting sources, LED or HID luminaires such as indoor and outdoor luminaires, roadway luminaires, street lamps, flood lights and other kinds of luminaires.
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Surge Arrestor Testing Equipment
SA 10i
SA 10i the Leakage Current Meter from SCOPE is a State of the Art, hand held, on-line test system for Residual Life Assessment of Surge Arresters. The instrument measures and directly displays the values of resistive and total leakage current.
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Software & Hardware Interface
XJAPI
The XJAPI is a simple-to-use DLL Application Program Interface (API), designed to give you low-level access to the JTAG chain via either the XJLink or the PXI hardware, allowing easy integration with a wide range of other systems such as development/evaluation boards, test systems
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Automated Tester
With high labor costs in Europe and the US, and the surge in labor cost in Asia, automated test solutions are in demand. Automated systems also improve traceability and reduce operator mistakes.The combination of automation with high throughput test systems is perfect to extend the usage of Flying Probe Testers to mid size production/sample volumes.
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PXI Resistor Module 2-Channel 2R to 131k
40-293-034
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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External Frontend
FE50DTR
The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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PXI Precision Resistor Module 6-Channel, 3 to 1.51M
40-297-050
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Automation Solution
CONFORMIQ TRANSFORMER
Conformiq Transformer shortens the path to test automation, simplifies model-based testing (MBT) adoption using existing methods, and automates manual test execution. Along with Conformiq Creator, which generates executable test cases, scripts and documentation from models, it automates and transforms test design, extending the Conformiq 360° Test Automation™ solution for complex system testing at the speed of development.
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JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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PXI 5W Programmable Resistor Module, 1-Channel, 2.5Ω to 102kΩ
40-252-040
The 40-252-040 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Automated Test
We have been designing test systems for over 20 years. We strive to automate as much of the testing process as possible. This strategy allows operators of our test systems to focus on throughput instead of worrying about mistakes and errors.
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 122Ω
50-298-012
The 50-298-012 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 122Ω with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Current Transformer Analyzer/Tester
GF1061
Beijing GFUVE Electronics Co.,Ltd.
Portable CT PT analyzer is mainly used for field or lab testing, it can finish the measurements (M) and protection (P) class CT, PT and TYP class CT. Adopt 7 inch touch TFT LCD, self-equipped mini type printer supporting field printing; supporting to use USB flash disk to download data or RS232 port to PC control. This model GF1061 CT PT analyzer is the most complete and easy-to-use testing system for protection and metering CTs according to IEEE C57.13 and IEC60044 & IEC61869 standards.
