Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
EQE/Photon-Electron Conversion Testing
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Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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Product
Optical Coherence Tomography Imaging Line Scan Cameras
OctoPlus Range
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Teledyne e2v spent 2 years developing a CMOS sensor specifically for OCT. This resulted in the launch of OctoPlus, which has a specially designed pixel architecture that improves sensitivity and reduces signal roll-off to improve image quality by several dB vs state-of-the-art CMOS cameras, especially in deep structures.
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Electronic Design
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We design and build custom racks, special switching systems, RF systems and custom Digital/ Analog sub assemblies. The hardware can be packaged per your requirements, using industry standard modules, rack mounted instruments, or custom made packaging. Extensive LabVIEW, embedded and other programming languages development are available as part of our hardware control support.
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Product
Fiber Optic Inspection Microscope
80760
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The Miller 200x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment.
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Product
Electronic Component Counter
ZE 300
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REINHARDT System- und Messelectronic GmbH
Instead of the widely used photoelectric barrier technology a new measuring technology is used in the new electronic component counter ZE 300: The laser technology offers a measuring beam with higher energy density and therefore more precise counting and faster counting speed. The ZE 300 component counter is microprocessor-controlled.
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Product
Scanning Auger Nanoprobe
PHI 710
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The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Product
Radar Input and Scan Conversion
Cougar
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Curtiss-Wright Defense Solutions
Cougar is an open standards-based high performance solution for capturing, converting and mixing radar video. Cougar is available as a VME card set or as part of a turnkey solution ready for deployment.
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Product
Opto-Mechanics, Electronics, Software, Accessories
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A variety of complementary products expand the function of our measuring instruments and support the configuration of complete measuring systems.
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Product
SPSR-2030 (200-3000nm) Super Pure Spectral Radiation Scanning Analyzer
SPSR-2030
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Hangzhou Everfine Photo-E-Info Co., LTD
SPSR-2030 adopts double-monochromator design, which can realize super-pure&fine full-spectrum scanning ( 200-3000nm), the test parameters including but not limited to spectral power distribution, peak wavelength, dominant wavelength, CCT (correlated colour temperature), CRI (color rendering index), SDCM (standard deviation of color matching), color purity, and etc.
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Product
Electronic Loads/Sinks
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An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.
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Product
Scanning Tunneling Microscope for Ultra High Vacuum
STM
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A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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Electronic Contract Manufacturing
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Specializing in low-mid volume electronic manufacturing services, Pine Electronics, Inc. offers a wide range of printed circuit board assembly (PCB assembly), cable and box build assembly solutions. Our equipment, engineering and technical talent serves both multi-national and regional customers throughout the United States. Known for full-service PCB assembly work, Pine Electronics, Inc. is highly integrated and responsive. Each customer has a designated representative for all commercial and technical questions. This personalized service model enhances communication, expedites project development, and represents Pine’s commitment to customer service.
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Product
SQUID Electronics
XXF-1
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It is designed to satisfy the needs of nearly all low-Tc SQUID applications. Additional integrated current sources provide e.g. bias current and calibration pulses for TES applications. These current sources together with an additional switchable feedback path make two-stage SQUID operation very convenient.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
High Slew-Rate High Power DC Electronic Load （100A/μS）
34110A-11（10KW）
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34000A Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.
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Product
DC Electronic Load
EE15140A
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The EE15140A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control attach the electronic load block to a heat- sink and your up and running. used them with D to A's, A to D's, Pots, PLC's to control the current. These Electronic Loads can be used for both Discharge & Charging Batteries & Devices
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Electronic Circuit Breaker Unit
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The CorePower® DC or AC Electronic Circuit Breaker Unit replaces conventional thermal mechanical circuit breakers and functions as both a breaker and a switch for controlling loads. By placing ECBUs closer to loads, aircraft manufacturers gain a significant reduction in wire weight, need fewer system components, and lower installation labor costs while increasing safety, efficiency, and reliability. This new smaller unit requires less space and provides more flexible mounting options.
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Product
Electronic Store Of Resistances
PS8
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The module is intended for use as part of information measuring systems based on the VXI bus for software setting of resistance values with a given step along three independent channels.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Product
OBDLink WiFi Scan Tool
4251WF
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OBDLink WiFi features Plug and Play connectivity with your laptop, iPhone, iPod Touch, iPad or any other standard WiFi device. The built-in USB port gives you maximum versatility. Compatible with all model year 1996-2011 cars and light trucks sold in the United States, including all American, European, and Asian vehicles.
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Product
Electronic Primary Injection Test Set
eKAM
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eKAM is the new fully automatic electronic primary injection test equipment. e KAM test system includes two portable units: one control unit with a large graphical display, that adjusts the output, and one current unit (up to 2000, 3000, 5000A). It can also perform Step and Touch tests and ground resistance tests.
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Product
Line Scan Vision System
In-Sight 9902L
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The In-Sight 9902L 2K line scan smart camera is a high resolution self-contained vision system ideal for detailed inspections of large, cylindrical, or continuously moving objects. The 9902L acquires up to 16,000 lines of 2,000 pixels per line to produce a 32MP image that can used to detect even the smallest features and defects. Each pixel line is acquired at 67,000 lines per second to keep up with the fastest production lines. This standalone vision system only requires a small view of the target part, making it an ideal choice for installations with restrictive field of view or mounting space requirements.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Product
Flash Vs. Scan
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A LiDAR system can observe the complete field of view (FOV) at once, called Flash systems. Flash typically works well for short to mid-range (0-100m), and by capturing the complete scene at once also objects with high relative speeds can be detected properly. Another implementation is to focus on a subset of the FOV, consequentially look at the next subsets, until the complete FOV is covered, called Scanning. Scanning can focus the light on the subset instead of the full FOV, and therefore can do object detection at a longer range compared to Flash.
