Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
JTAG Boundary Scan
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Our partnership with JTAG Technologies enables us to provide you with a comprehensive JTAG Boundary Scan Test Development Service.
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Product
EQCM Electronic Quartz Crystal Microbalance
Elettra
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Elettra has been designed to operate on its own, but it is also possible to connect it to a PC to control it and acquire, view and save data thanks to its extremely easy to use software that runs under MS-Windows™. The data acquisition process can be controlled extremely quickly thanks to the PLAY, PAUSE and STOP keys.
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Line Scan Moisture Imager
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Bodkin Design & Engineering, llc
Line scan camera built for measuring product on a moving conveyor. Infrared spectral filtering permits moisture and hydrocarbon imaging for process control.
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Electronics Failure Analysis System
Sentris
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Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Area Scan Cameras
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JAI provides a wide selection of industrial machine vision cameras with both single-sensor and multi-sensor configurations. Resolutions range from 0.3 MP to 20 MP, with high frame rates ranging up to 250 fps for full 5MP resolution. A selection of cameras can operate beyond the visible – in the ultraviolet, near infrared and in the short wave infrared light spectrums.
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ELECTRONIC CIRCUIT TRACER
PPECT3000
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*Locate short and open circuits without having to remove plastic panels, molding and carpet*Traces shorts and open wires with visual navigation and sound indicators*Pinpoint shorts, open circuits, switches and breaks in wires
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Area Scan Cameras
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Area scan cameras, also known as matrix cameras, are one of the most widely used technologies in industrial image processing. They capture images in two dimensions (the X and Y directions) and are ideal for applications requiring a complete image in a single capture.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
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High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Electronic Differential Pressure
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An innovative software and hardware concept makes it possible to combine any two pressure transmitters of the VEGABAR 80 series into an electronic differential pressure system. Electronic differential pressure measurement is often used for filters, pumps and pipelines.
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Programmable DC Electronic Load
IT8500+ Series
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IT8500+series (150W~3000W) single-channel programmable DC electronic loads are designed for middle & high-end applications. They can be offered as multiple solutions according to customer's design and testing requirements.
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Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Electronic Tensile Tester
QT-ETT
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QT-ETT tensile testing equipments are specially designed considering tensile testing requirements for flexible materials that are commonly used in product packaging to study different properties of materials. This instrument utilizes Qualitest's latest embedded control system and operating software, with user-friendly operating interface and intelligent data management system.
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PathWave BenchVue Electronic Load App
BV0012B
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Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Electronic Engine Instruments
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Is a flight instrument display system in an aircraft cockpit that displays flight data electronically rather than electromechanically.
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Spectroscopy Upgrade for Any Microscope
SMS
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Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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High Current Electronic Load (600W-1200W)
ELCH600 & ELCH1200
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- Low lead resistance <5m Ohm for Fuel-cell- Battery Testing- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR- OV/OC/OP/OT protection- Communication: USB/RS232/GPIB
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Advantage Xi Radar Scan Converter
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Curtiss-Wright Defense Solutions
The Advantage Xi radar scan converter is a half-size PCI card. Radar video arrives into the card through the PCI bus, which allows the card to be used in a client-server configuration with radar distributed over a network, or in conjunction with a radar interface card such as the Virgo PCI and Osiris PCI.
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Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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Electronic
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Our electronic switches offer single or dual setpoints, adjustable time delays, external setpoint adjustments and more.
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Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Optical Scanning Systems
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that feature high scanning speed and accuracy. Our non-contact 3D scanners are ideal for 3D digitization of physical models, quality control and reverse engineering.
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Programmable Electronic Load
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Shenzhen UYIGAO Electronic Technology Co., Ltd
UYIGAO DC electronic loads provide you with the flexibility to test a wide range of power sources. Perform both static and dynamic tests to ensure that your devices can handle the steady state and occasional transient loads. The 16-bit voltage, current, and power-measurement systems provide accuracy analysis.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Electrolytic Capacitor Test & Scanning System
DU-9001
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Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Area Scan Camera
Genie Nano-CL
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Introducing Genie Nano, a CMOS area scan camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, and an unmatched feature set--all at an incredible price.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Digital Microscopes
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Digital microscopes are microscopes without eyepieces. A digital camera acts as a detector. Images are displayed on a screen or monitor, turning the microscopy workstation into an ergonomic digital workplace.
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AC Electronic Load
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AC&DC Electronic Loads are design for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources and other power devices such as switches, circuit breakers, fuses and connectors.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
