Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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TOC-L For Monitoring A Microscopic Algae Biomass
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Biomass is considered a prospective new energy source. The dry weight method has been typically used to determine the amount of microscopic algae in biomass. However, Shimadzu proposes a new method, one that is rapid, easy, and accurate, utilizing the TOC-L total organic carbon analyzer.
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Electronic Loads
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The DSO and DSOT series electronic loads are designed using advanced linear technology.The DSO series offers two main functions: constant current and constant resistance. However, these loads can absorb full power between 20% and 100% of the acceptable input voltage thanks to the autoranging mode.For more extensive requirements, we offer 'DSOT' models that also include constant voltage and constant power functions. These functions are essential for testing voltage generators such as automotive alternators or photovoltaic panels to determine their power curve. In addition, DSOT models have a basic '0 Volt' characteristic, which means they can be used with input voltages as low as 0 Volt. However, they still maintain a high reaction speed, which can reach 1V/us and 8A/us.
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Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Microscope Software
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Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Electronic Fuel Injection & Ignition Spark Tester Kit
36310
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Quickly diagnose "no start" and engine miss conditions in the electrical fuel injection and spark plug circuits. Analyze rough running engines. Contains Cat. No. 36300, Noid Light Set to test electronic fuel injection signals and the Cat. No. 23900, In-Line Ignition Spark Checker to trouble shoot the ignition system (Shows a duplicate view of the ignition spark). Supplied with Noid Lights to check Bosch PFI, Ford TBI, Geo TBI, GM PFI, GM SCPI and GM TBI.
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Electronic Ballast High Frequency Parameters Tester
UI2002A
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• Measure Vrms, Irms, W, PF/Hz • Voltage range: 10~600V, Current range: 10~2000mA, Frequency range: 20~70kHz • Accuracy: Class 2
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Confocal Raman Microscope
LabRAM HR Evolution
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The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Programmable AC Electronic Load
63800
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Chroma Systems Solutions, Inc.
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing resulting in reliable and unbiased test results.
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Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Electronic Calibration Module, DC To 6.5 GHz, 2-Port
N7551A
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Reduce your calibration time by half with a smaller, lighter 2-port module that supports 3.5 mm or type-N 50 Ω connectors
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Medium Power Programmable DC Electronic Load(600W~3000W)
FT63200A/E
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Shenzhen FaithTech Technology Co., Ltd.
The FT63200A/E series of Medium power programmable DC electronic load is designed for high reliability and high power density. It can achieve 2U/3kW, which is twice of the power density of the conventional load. The FT63200A/E series has three voltage ranges of 150V, 600V and 1200V, with a single power range from 750W to 3kW. Its wider working range, extremely fast dynamic frequency, effectively increase the testing capability and application range. The whole series of products have strong overload capacity, instant over power pull up to twice the rated power, can effectively reduce the test cost.
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High Soeed CMOS System on Chip (SoC) Line Scan Image Sensor
LS4k
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The LS4k is a high speed CMOS System on Chip (SoC) line scan image sensor optimized for applications requiring short exposure times and high accuracy line rates. It incorporates on chip two pixel arrays consisting of 2 rows with 4,096 7µm pitch pixels and 4 rows with 2,048 14µm pitch pixels respectively, a high accuracy (12-bit) high speed (84MHz) analog-to-digital conversion (ADC), and sophisticated on chip optical calibration for PRNU, DSNU, and lens shading correction.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Automotive Electronic Stethoscope
77109
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Helps to identify engine and chassis noise. Maintain all health and safety precautions whilst using on running engine. Helps to identify engine and chassis noise. Powered by a 9volt battery (not supplied). Complete with headphones and volume control. CE certificated.
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64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
Digital I/O
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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Electronic Control Units
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Self-contained engine management system and data logger for race engines up to eight cylinders. The unit is complete with integrated ignition and injection drivers and so needs no external units to run an engine.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Acoustic Microscope
AMI D9650Z
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The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
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Scanning Slit Beam Profiling
NanoScan
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Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Dual-in-Line (DIL / DIP) Reed Relays From Pickering Electronics
Reed Relay
Pickering Electronics Series 97 & 98 DIL / DIP Reed Relays feature the highest quality instrumentation grade reed switches making them suitable for the most demanding applications. They are available in two ranges featuring internal mu-metal magnetic screens.
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Scanning Kelvin Probe
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Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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3D Scanning System
CyberGage360
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Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
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Differential Scanning Calorimeter
DSC-L600
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The Differential Scanning Calorimeter (DSC-L600) is a powerful thermal analysis instrument that measures the heat flow of a sample as a function of time or temperature. The DSC-L600 has been designed to be a cost-effective instrument that is well suited for research or QC applications. The instrument communicates with the PC via a RS232/USB connection. The specially designed heat flux plate has demonstrated more than twice the sensitivity than other heat flow type DSC’s on the market. The reproducibility is excellent, and the noise level is virtually unnoticeable due to a precision high gain, low noise differential amplifier
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Microscopes
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A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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Multi-channel DC Electronic Load
IT8700 Series
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IT8700 series programmable DC electronic load adopts removable modules design, supports up to 16 channels with mainframe extension transient mode up to 25 kHz, which improves your test efficiency, with high resolution and accuracy. Users can freely choose in the 8 load modules according to the number of channels and power requirements, controlled by mainframe control panel, or controlled by host computer software via built-in LAN / RS232 /USB / GPIB interface.
