Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
DC Electronic Load
EE30140A
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The EE30140A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control. attach the electronic load block to a heat- sink and your up and running used them with D to A's, A to D's, Pots, PLC's to control the current. These Electronic Loads can be used for both Discharge & Charging Batteries & Devices
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Product
Microscopes
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A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Product
Electronics Consulting
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Our approach to consulting is unique. We encourage you to participate in every phase of the study. We provide you with all the information and knowledge that you need to repeat the study and perform future studies independently. Our reports are detailed and comprehensive. A consulting project may get over in a set time period but we expect our relation to continue. Our mission is to empower you through our products and services.
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Product
DC Electronic Load
3310F Series
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Each 3310F Series module has its own control and display panel, CC/CR/CV/CP/Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently，also can be controlled intranet via RS232、Ethernet、USB and GPIB interface.
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Product
NeaSNOM Microscope
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Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time
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Product
Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Product
AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
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Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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Product
Color Measurement With Line Scan Cameras
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The Chromasens line scan cameras offer new approaches for the color-accurate capture of objects. The chromaPIXA has an internal FPGA-based color calculator which converts the color information of the CCD sensor on-the-fly into standard output color spaces. Algorithms are used which allow a more precise transformation than the usual 3x3 matrix transformation.
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Product
Atomic Force Microscope
XE-PTR
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Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Product
Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Product
Multimeter Electronic Test Leads Kit
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VERSATILE KIT includes 2 alligator clips with removable insulation, 2 extended range plunger mini-hooks with pass-through banana plugs, 2 heavy duty test probes, 2 42” lead extensionsUNIVERSALLY COMPATIBLE with either 0.16” banana plugs or shrouded banana plugs on all ends
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Product
Regenerative DC Electronic Load
IT8000 Series
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IT8000 series is a family of high power regenerative electronic loads with compact size. The highly integrated capability enables the e-load to simulate various e-load characteristics, and return the consumed energy back to the grid cleanly, saving costs related to energy consumption and cooling, meanwhile eco-friendly. With modular high power density design, IT8000 provide up to 18kW in 3U space.
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Product
Scanning Slit Beam Profiling
NanoScan
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Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Product
Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Product
DC Electronic Loads
LSG Series
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*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
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Product
Boundary Scan
PROGBSDL
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PROGBSDL software converts a BSDL file for an unprogrammed PLD into a BSDL file with the same pin usage as the programmed PLD.
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Product
Electronical Load Board 3U VME64x (air cooled)
056-921
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The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Product
Time Delay and Integration (TDI) Line Scan Camera
Piranha HS
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The Piranha HS cameras provide an alternative to traditional line scan imaging. They enable you to meet the line rates and responsivity necessary for your high performance applications and allow you to reduce the number of cameras in your system. When you use fewer cameras, you use fewer framegrabbers, lenses, computers and cables. The Piranha HS family delivers the lowest price/pixel TDI system solution ever offered by Teledyne DALSA. Lighting costs can also be reduced. With TDI imaging, you can use LED lights, helping you to optimize system up-time and productivity.
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Product
3D Building Scanning Services For Existing Conditions
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Trusted by industries across USA, Tejjy 3D laser scanning company facilitates high-resolution reality capture of as-built data. Our on-site 3D scanning professionals gather accurate measurement with quality point clouds of as-built condition. We facilitate precision of 4-6 mm approx. in field measurement for renovation, surveying, facility management, digital twin, heritage preservation as per client requirements.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
Power Electronics Test Solutions
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Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
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Product
Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Product
DC Electronic Load
63600 series
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Chroma's 63600 series DC electronic loads are designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, server power supplies, and power electronic components. They are excellent for research, development, produc t ion, and incoming inspection applications. The 63600's state of the art design uses DSP technology to simulate non-linear loads using a unique CZ operation mode allowing realistic loading behavior. The 63600 series can draw its rated current under very low voltage (0.4V typical). This unique feature guarantees the best loading performance for modern Point-of-Load conditions and fuel cells.
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Product
AC Electronic Load
IT8600 Series
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IT8600 is ITECH latest series of AC/DC electronic loads with power range 0~14.4 kVA and adjustable frequency 45 Hz ~ 450 Hz. The unique oscilloscope waveform display function of IT8600's can display input voltage & current as waveform. It is equipped with measurement modes for different parameters such as inrush current, peak value, effective value, PF (power factor).
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Product
Boundary Scan Trainer Kit
QE49
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Qmax Test Technologies Pvt. Ltd.
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Product
Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Product
Thermal Imaging System for Electronics Testing
ETS320
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Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
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Product
Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
