Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Ambient Temperature CalPod Module, 20 GHz
85530B
Electronic Calibration Module
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards.
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Product
Multiport Electronic Calibration Module (ECal), DC To 9 GHz, 6-ports
N7562A
Electronic Calibration Module
A series of multiport ECal that cascade-able up to 36-ports which makes it possible to calibrate a wide frequency range from DC up to 9 GHz without making numerous connections during calibration process. Ideal for multiport measurement application with VNA in such as high-volume PA/FEM, massive MIMO antenna or high-speed digital interconnect test applications
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Product
Electronic Calibration Module (ECal), 67 GHz, 1.85 Mm, 2-Port
N4694D
Electronic Calibration Module
The Keysight N4694D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4694D is a precision 2-port ECal module that supports 1.85 mm connectors up to 67 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4694D is included for securing your ECal module and accessories.
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Product
RF Electronic Calibration Module (ECal), 300 KHz To 18 GHz, 4-ports
N4432D
Electronic Calibration Module
The Keysight N4432D is a precision 4-port ECal module that supports selection of Type-N and 3.5 mm connectors mixed up to 18 GHz. Select either female-female, male-male, or female-male connectors.
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Product
Electronic Calibration Module (ECal), 40 GHz, 2.92 Mm, 2-port
N4692D
Electronic Calibration Module
The Keysight N4692D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4692D is a precision 2-port ECal module that supports 2.92 mm connectors up to 40 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4692D is included for securing your ECal module and accessories.
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Product
Electronic Calibration Module (ECal), 18 GHz, 7 Mm, 2-Port
N4696D
Electronic Calibration Module
The Keysight N4696D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy, and accurate. The N4696D is a precision 2-port ECal module that supports 7-mm connectors up to 18 GHz. The plastic storage case for the N4696D is included for securing your ECal module and accessories.
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Product
Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Product
Scanning Tunneling Microscope for Ultra High Vacuum
STM
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A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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Product
Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Product
Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 3.5 Mm, 2 Port
85093D
Electronic Calibration Module
The Keysight 85093D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Product
Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Product
Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Product
RF Electronic Calibration Module (ECal), DC To 13.5 GHz, 4-ports
N4431D
Electronic Calibration Module
The Keysight N4431D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4431D is a precision 4-ports ECal module that supports multiple selection of connectors like Type-N, 3.5 mm, 7-16 and 4.3-10 connectors and can be mixed up to 13.5 GHz. Select either female-female, male-male, or female-male connectors.
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Product
Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Product
Fiber Microscope
WL-C200S
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The WL-C series fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Product
Fiber Microscope
WL-D200S
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The WL-D200 fiber microscopes provide dual-illumination, both coaxial and oblique, to produce the highest-quality image detail and superior view of fiber end face cleanliness and core condition.
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Product
Scanning Tanks
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Our ultrasound test tank systems are custom built to suit your requirements and additional features can be included.
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Product
High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Digital Microscope
VHX-6000 Series
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Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
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Product
Stereo Microscopes
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From affordable, high quality, stereo zoom microscopes for exceptional value and performance, though to powerful, high resolution stereo microscopes capable of 320x magnification – all supported with a range of productivity options – there’s a solution in our range of stereo microscopes for every application.
