Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Single-sensor Color Area Scan Cameras
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JAI provides a wide selection of single-sensor color area scan cameras with resolutions ranging from VGA to 20 megapixels. Cameras are built around state-of-the-art sensor technology including the latest CMOS global shutter imagers, as well as some with traditional CCDs.
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Product
Scanning Vibrating Electrode Technique
VS-SVET
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The Scanning Vibrating Electrode Technique uses a single wire to measures voltage drop in solution. This voltage drop is a result of local current at the surface of a sample. Measuring this voltage in solution images the current at the sample surface. Current can be naturally occurring from a corrosion or biological process, or the current can be externally controlled using a galvanostat.
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Product
Line Scan Camera
Linea ML
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The Linea ML brings leading edge CMOS technology that is faster than ever, with affordable multiline architecture that enables the newest, most powerful inspection techniques including HDR, color and multispectral analysis, and multi-field imaging (single-pass bright/darkfield). With a native fiber optic interface for easy, low-cost long cabling, the Linea ML opens new horizons in inspection.
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Product
150W Electronic Load
EL63150B
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Features:*Number operation and control*LED display with high definition and high contrast, rich display information*Easy operation of knob encoder switch*Basic load function: constant current, voltage, power and resistance*Multi units used to multiple load ability*Short-circuit test*Battery test*Dynamic test*Multi parameters measured in the list*Remote voltage measurement*Panel and exterior trigger function*Protection function: over-voltage, over-current, over-power, over-heat, polarity connection in reverse*10 sets of parameters memorized and loaded, and automatically loaded on turning on the instrument*Intelligent fan control*Key lock and knob lock functions
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Product
Electronic Type Universal Testing Machines
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Our list of current Electronic Type Universal Testing Machines products are listed below. If you cannot find what you are looking for, please contact us and we will try our best to help you.
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Product
Long Range Scanning
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Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
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Product
Optical Coherence Tomography Imaging Line Scan Cameras
OctoPlus Range
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Teledyne e2v spent 2 years developing a CMOS sensor specifically for OCT. This resulted in the launch of OctoPlus, which has a specially designed pixel architecture that improves sensitivity and reduces signal roll-off to improve image quality by several dB vs state-of-the-art CMOS cameras, especially in deep structures.
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Product
3D Scanning Coordinate Measurement Machine
CUBE-R™
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CUBE-R™ is a fast, reliable, and efficient complete turnkey solution for automated quality control applications. This automated 3D measuring machine features MetraSCAN 3D-R, a powerful robot-mounted optical 3D scanner that can be integrated into factory automation systems without compromising on accuracy. It is the perfect alternative to solve any productivity issues caused by bottlenecks at the traditional coordinate measuring machine (CMM).
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Product
Area Scan Camera
Genie Nano-CXP
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Introducing Genie Nano-CXP, a camera designed for full-throttle performance. Genie Nano-CXP builds on Nano's proven, industry leading reputation and leverages a CoaXPress 6Gbps interface to deliver the maximum throughput from leading edge high resolution CMOS image sensors.
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Product
End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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Product
Electronic Loads
SLD DC
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AMETEK Programmable Power, Inc.
From the leader in programmable power products, Sorensen introduces the SL series electronic loads which offer the best value with the most flexible platform. A wide range of loads are available from 75-1800W with both DC and AC input in benchtop, modular and standalone form factors.
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Product
Electronic Speed Controller
AFI-ESC1220
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The AFI-ESC1220 is an Electronic Speed Controller designed to drive BLDC motors. It meets the industrial requirements of high power and high voltage application for electronic vehicles, airplanes, boats and medium duty industrial machinery. It is rated at 24KW.
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Product
Electronic Resistance Store
MPS2
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The MPS2 module is a mezzanine module designed to form DC resistance in two channels with a four-wire measurement circuit. MPS2 is installed on the mezzanine carrier - the NMU module and is connected to it via a local information highway. Up to four mezzanines of various types can be installed on the NMU module. The NMU module together with the mezzanines installed on it forms a VXI module of the size C-1 and is used to create information measuring VXI systems.
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Product
Electronic Test Equipment
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Teledyne LeCroy offers a comprehensive range of electronic test equipment solutions to complement our well known family of oscilloscopes and analyzers. We offer these tools under both the Teledyne LeCroy and Teledyne Test Tools brand names. The Teledyne Test Tools family of products was created in collaboration with leading OEM technology partners and comes with the world class service and support you've come to expect from us.
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Product
1800~3000W DC Electronic Loads
JT633 series
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Nanjing Jartul Electronic Co., Ltd
JT633 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT633 series load very suitable for testing power supply when produced in large quantity. Besides, JT633 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT633 series load satisfing most of R&D requirements.
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Product
Power Electronics Solutions
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Scientech Technologies Pvt. Ltd.
Power electronics has found an important place in modern technology being a core of power and energy control.The subject of Power Electronics is the merger of the field of electrical power system and solid state electronic devices. It is the discipline that involves the study, analysis, and design of circuits that convert electrical energy from one form to another. Almost all the new electrical and electromechanical equipment contain power circuits.
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Product
64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
Digital I/O
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Scanning Mobility Particle Sizer Spectrometer
3938
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TSI''s newest Scanning Mobility Particle Sizer SMPS™ spectrometer is widely used as the standard for measuring airborne particle size distributions. This system is also routinely used to make accurate nanoparticle size measurements of particles suspended in liquids. The National Institute of Standards and Technology (NIST) uses a TSI DMA to size 60 nm and 100 nm standard size reference materials.
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Product
Electronics
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The analog electronics enable the linearization of the SQUID characteristics through negative feedback to the SQUID.
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Product
Boundary Scan Tester and Programmer
JTAGMaster
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The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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Product
Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Product
Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Product
Air Cooled Linear DC Electronic Load
ALx Series
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The ALx Series utilizes conventional linear MOSFET-based dissipative elements, allowing the series to achieve a very wide voltage-current operating range within the model’s maximum power rating. Using the same heat management innovations developed for Magna-Power’s high density programmable DC power supplies, the ALx Series’ conservative cooling ensures long product life in environments up to 50 °C ambient operating temperature.
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Product
AFM Atomic Force Microscope
FM-Nanoview 6800
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
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Product
Single Sensor - Monochrome Line Scan Cameras with Fast Scan Rates
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JAI’s monochrome line scan cameras provide an excellent combination of high resolution and fast scan rates.The Sweep SW-8000M-PMCL model features an 8192-pixel linear CMOS sensor delivering a line rate of 100,000 lines/s (100 kHz) over a Camera Link interface. The SW-4000M-PMCL model is based on a 4096-pixels sensor capable of running as fast as 200,000 lines/s (200 kHz) over Camera Link.
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Product
Electronic DC Load, 500V, 16A, 400W
LDH400 Series
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Versatile solution for direct testing of dc power sources and PFCsConstant current, resistance, conductance and power modesWide voltage and current range, 10 to 500V and 0 to 16A400 watts continuous dissipation at 28°C (360W at 40°C)High resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminalsLoad inputs rated to CAT II (300V)Full bus control via USB, RS232 and LXI compliant LAN interfacesGPIB Option
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Product
Programmable AC Electronic Load
63800
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Chroma Systems Solutions, Inc.
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing resulting in reliable and unbiased test results.
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Product
Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Product
Electronic Crockmeter
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TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
