Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Microscope Cameras From ZEISS
Axiocam Family
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In contrast to digital cameras for photography or industrial inspection, many aspects of the microscope cameras are optimized to meet specific requirements of applications in science, research and documentation. As each application has very specific requirements, there is a wide range of different digital camera models to choose from. Different pixel sizes, for example, regulate camera sensitivity and spatial resolution. Lower pixel count enables higher frame rates and larger sensors offer better coverage of the field of view.
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Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Line Scan Camera
Linea ML
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The Linea ML brings leading edge CMOS technology that is faster than ever, with affordable multiline architecture that enables the newest, most powerful inspection techniques including HDR, color and multispectral analysis, and multi-field imaging (single-pass bright/darkfield). With a native fiber optic interface for easy, low-cost long cabling, the Linea ML opens new horizons in inspection.
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Electronic Dendrometer
CRITERION RD 1000
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F. W. Breithaupt & Sohn GmbH & Co.KG
*BAF: Visually estimates if trees fall in or out of a given plot as related to the specified Basal Area Factor.*In/Out: Internally computes the limiting distance for questionable, borderline trees and determines if they are in or out of the plot.*Diameter: Determines the diameter of a tree at any given height.*Height/Diameter: Provides the ability to determine the height at which a specific diameter occurs.*Raw Inclination: Measures inclination in percent slope.
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Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Electronic Loads
T3EL Series
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The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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ELECTRONIC MEGOHMMETER
MI-2550e
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The MI-2550e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 2,5 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 5.000.000 MΩ with four test voltages: 0,5 kV - 1 kV - 1,5 kV - 2,5 kV.
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Differential Scanning Calorimeters
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Differential Scanning Calorimeters (DSC) measure temperatures and heat flows associated with thermal transitions in a material. Common usage includes investigation, selection, comparison and end-use performance evaluation of materials in research, quality control and production applications. Properties measured by TA Instruments’ DSC techniques include glass transitions, “cold” crystallization, phase changes, melting, crystallization, product stability, cure / cure kinetics, and oxidative stability.
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Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Stroke-to-Raster Scan Conversion
VSC/900
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The Model VSC/900 provides scan conversion and mixing for any video input signals. The unit's capabilities include conversion of any input to any output format up to 2K x 2K. In addition to operating with VESA, HD and SD signals, the unit provides conversion and mixing of stroke (vector) video signals.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Bore Gages - Electronic
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Measure internal diameters and bores. Data output options available including Bluetooth.
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Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Digital Microscopes
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Great for capturing and sharing digital information with anyone, anywhere, digital microscopes by Vision Engineering are built with quality to last a lifetime. Powerful and easy to use, their versatile, operator-friendly design means they can be repurposed as your needs change, protecting your return on investment.
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Area Scan Cameras
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Area scan cameras, also known as matrix cameras, are one of the most widely used technologies in industrial image processing. They capture images in two dimensions (the X and Y directions) and are ideal for applications requiring a complete image in a single capture.
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Electronics
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The analog electronics enable the linearization of the SQUID characteristics through negative feedback to the SQUID.
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NVIDIA GPU And Intel® Xeon® AI Computing Platform For Autonomous Drive Applications
AVA-3510
Electronic Control Unit
The AVA-3510 Series is powered by an Intel® Xeon® E processor coupled with workstation-grade Intel®C246 chipset to support up to 64 GB ECC DDR4 memory. The system incorporates one 2.5" SSD 256G for easy installation as optional accessories for fast read/write performance.
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Electronic Moisture Analyzer
MOC-120H
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The moisture content of a variety of samples can be measured using an array of drying modes. The drying status can be seen at-a-glance with the fluctuation range display. Active in a variety of fields (cereals, starch, flour, noodles, brewed products, sea foods and marine products, meat products, spices, sweets, dairy products, dried foods, vegetable oils and other food articles; pharmaceuticals; ores; cokes; glass materials; cement; chemical fertilizers; pulp and paper; cotton; various fabrics and other industrial goods); enabling measurement of samples (cereals, foods, and chemical products) under various conditions (powder, particles, paste, and liquid).
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DC Electronic Load
3310F Series
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Each 3310F Series module has its own control and display panel, CC/CR/CV/CP/Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently，also can be controlled intranet via RS232、Ethernet、USB and GPIB interface.
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Electronic Ballast Analyzer
WT3000
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• It has 8 windows to display each parameter of input and output characteristics • Frequency response for testing input current up to 1MHz, suitable for precise testing of various kind of electronic ballast • WT3000 has expanding analysis for envelope wave. • Symmetry analysis for envelope wave’s crest factor of lamp current • Sampling at ultra-high speed, dynamic analysis single frequency curve, highest sampling frequency is up to 10MHz • Portable with built-in chip micro-processor, particular suitable for development and spot production • RS-232C standard interface can be connected to PC, English version software can run in WinXP or Win7
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Fabry-Perot Based Scanning Filter
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This new type Fabry-Perot Based Scanning Filter (FPSF) is based on Optoplex proprietary fiber optical Fabry-Perot Etalon technology. It offers F-P based scanning filter with central wavelength at 1060nm, 1310nm, 1550nm or other customized wavelength. It can be tuned manually or automatically by scanning over a wide spectral range from 10nm to 100nm with bandwidth from 0.05nm to 1.0nm. FPSF features less than 3dB insertion loss and as high as 1kHz scanning frequency. Its unique high reliability and low insertion loss design presents the most cost-effective solution for OEM application from telecommunication to fiber sensing interrogation.
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OEM Scan Engines
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Zebra Technologies Corporation
When you choose Zebra as your OEM partner, you get a portfolio of scan engines and devices that deliver industry-leading features, durability and reliability — saving everyone time and money. You save on development time and cost. And, your customers get best-in-class, well-proven solutions that drive time and cost out of their everyday operations.
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Fiber Optic Inspection Microscope
80761
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The Miller 400x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment. Includes 2.5mm universal adapter cap and zipper case.
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Boundry Scan Testers
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Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Electronic Calibration Module (ECal), 50 GHz, 2.4 Mm, 2-port
N4693D
Electronic Calibration Module
The Keysight N4693D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy, and accurate. The N4693D is a precision 2-port ECal module that supports 2.4 mm connectors up to 50 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4693D is included for securing your ECal module and accessories.
