Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Electronics
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Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Product
Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Electronic Pressure Switch With Digital Display
PPG
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31mm compact 1-screen 2-color display pressure switch.Supports protection structure IP65. (Piping connection: Female thread added)
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Product
Microscope Cameras
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Leica microscope cameras are remarkable for their fast live image speeds, short reaction times, high pixel resolution, and clear contrast. They can be installed on many of the Leica microscopes and macroscopes.
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Eyepiece-less Stereo Microscopes
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Vision Engineering’s eyepiece-less stereo microscopes are better for users and for business. Their ergonomic design lets the operator sit back in a comfortable position, and the expanded pupil technology delivers an enhanced 3D view of the subject. The relaxed natural posture makes it easy and to work with tools and to manipulate the subject. Greater comfort and ease of use directly translate into greater productivity and quality.
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Product
Electronic Loads
T3EL Series
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The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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Product
Modular DC Electronic Load
63600
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Chroma Systems Solutions, Inc.
Chroma’s 63600 Modular DC Electronic Load is designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, adapters, and power electronic components. They are excellent for use in research, development, production, and incoming inspection applications. The 63600’s state-of-the-art design uses DSP technology to simulate non-linear loads using an unique CZ operation mode allowing realistic loading behavior.
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Product
Spectro UV-Vis Double Beam PC Scanning Spectrophotometer
UVD-2950
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Spectro UV-Vis Double PC is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing. Precise with high accuracy of measurement and stability are also provided by the powerful built in software and large LCD screen, which can display the screen menu and other functions. It can also be linked to a computer and a printer to show Photometric and Spectral data in the PC monitor.
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Product
VS Tool Suite for Virtual Scan Synthesis and ATPG
VirtualScan
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VirtualScan is SynTest's solution to combat increase in test data volume and test cycle volume. With VirtualScan (VS) an extremely large number of short scan chains within the SOC can be virtually accessed from outside the chip with a limited number of pins assigned as scan pins.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Radiation Scanning Equipment
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The spectrometer is designed for radiation scanning of territories and objects. The functions of the spectrometer are measurement of the energy distribution of gamma radiation, measurement of the ambient dose equivalent rate of gamma radiation, search and identification of gamma-emitting radionuclides, detection of neutron radiation sources.
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Product
DIOS (Digital I/O Scan Module)
JT 2122/MPV
Digital I/O
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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Workshop Equipment for Electronics
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PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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Product
Electronic Loads
Series EL
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The EL Series is a line of modular aircooled, DC electronic loads used to test power sources such as batteries, power supplies, generators, chargers, fuel cells, etc.Power ratings start at 1KW; standard models have maximum test capabilities of 50, 200, 400 and 600 volts. High current and power operation are achieved via parallel connection in a master/slave configuration. Individual modules are capable of up to 5KW and 800 amperes.
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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FTIR Microscopes & Imaging Systems
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Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Product
Line Scan Camera
Linea Lite
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Linea Lite makes line scan more accessible than ever. Designed with performance in mind, this camera offers superior color fidelity with 2k to 4k resolution and line rates from 12.5 to 50 kHz, with a GigE Vision® interface.
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Product
Stereo Microscope
Stemi 508
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Thanks to apochromatic optics you acquire high contrast images with color accuracy. With the 8:1 zoom you bring up smallest details. Stemi 508 offers an ergonomic viewing angle of 35° - stay relaxed even after hours of work.
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Product
Electronic Loads
SLD DC
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AMETEK Programmable Power, Inc.
From the leader in programmable power products, Sorensen introduces the SL series electronic loads which offer the best value with the most flexible platform. A wide range of loads are available from 75-1800W with both DC and AC input in benchtop, modular and standalone form factors.
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Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Product
Electronic Load
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* Fully programmable, self-contained, air-cooled solid state load.* Patented design is optimized to provide ultra-low impedance operation for fuel cell testing.* Load is compatible with AC impedance or frequency response analyzers.* Interchangeable shunts for precise operation over a wide dynamic range.* Ten built-in cell voltage monitoring inputs optional. Additional voltage monitoring inputs available.* Ethernet Interface for simple configuration and expansion!* Combine with additional Fideris™ Innovator Series™ modules to create a fully-integrated,fully-automated, customized test system.* System-wide control of all Fideris™ Test System Components using FCPower™ Software,LabviewTM, or other programming language.* Integrated hardwired Run/Standby signal.
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Product
Electronic Drum Latency
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EDLM iPhone app was developed specifically for measuring latency in electronic drums. It connects to the input and output points of an e-drum system and provides automated and accurate latency measurements.
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Your Automated Microscope For Live Cell Imaging
ZEISS Celldiscoverer 7
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Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
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Renishaw Scanning Probes
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Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Scanning Tunneling Microscope for Ultra High Vacuum
STM
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A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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DC Electronic Load
3310F Series
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Each 3310F Series module has its own control and display panel, CC/CR/CV/CP/Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently，also can be controlled intranet via RS232、Ethernet、USB and GPIB interface.
