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Product
Safety Tester
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Designed to ensure safe operation of DUTs under various operating conditions and environment.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
External Frontend
FE50DTR
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The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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Product
FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Product
High Voltage Optically Isolated Probes
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High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
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Product
RF Device Tester
RF ITS
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Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Product
Spring Probes
Spring Probe
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
Sound Harmonics and Current Analyzer
H74050100
Audio Analyzer
This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
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Product
Software Tool Especially Designed for Production Process Supervision
LEON OP
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The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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Product
High-Performance Autoranging DC Power Module, 60V, 17A, 500W
N6756A
Power Module
The Keysight N6756A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Product
Emulation of the Mobile Wireless Environment from 2G to 5G
Base Station Emulator sUTP 5018
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Bring a whole mobile network to your lab or production: NOFFZ Base Station Emulator (BSE) creates a customized cellular wireless environment. This makes testing wireless devices easier than ever before.Compact, cost-effective testing of multiple DUTs in parallel from 2G to 5G, including endurance testing for several days.
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Product
High-Performance Autoranging DC Power Module, 50V, 10A, 100W
N6752A
Power Module
The Keysight N6752A is a 100 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Product
Qualification Tester
LQ402
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Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 6 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 2 cabinets. One is for the electronic components with the primary measurement devices and the other one holds the 6 load boxes.
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Product
High Performance Autoranging DC Power Module, 50V, 5A, 50W
N6751A
Power Module
The Keysight N6751A is a 50 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Other Passive Probes
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Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Product
Arbitrary Load Control For Modulation Distortion
S94570B
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Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
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Product
Impedance Analyzers
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A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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Product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
Digital I/O
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
Coaxial Cable
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
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Product
PC Based Comprehensive Test Setup for Luminaires
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Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Product
RF Shield Box
CMW-Z10
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The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
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Product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
Network Analyzer
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Product
Dial Strain Gauge
DRK8093
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Shandong Drick Instruments Co., Ltd.
This stress (birefringence) sources are due to uneven cooling or external causes such as mechanical action, which directly affect the optical glass, glass products, quality transparent plastic products. Therefore, stress control is optical glass, glass products, plastic products, such as transparency in the production process extremely important part. The strain gauge can be qualitatively or quantitatively by observing stress to identify products (DUT) quality, are widely used in optical glass, glass, transparent plastics industry for fast, a lot of testing. In fact, it can not be solved by math the complex problems.
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Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
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The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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Product
High Temperature Operating Life
7000 Series
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With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Product
Automatic Calibration Module
ACM2509
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ACM2509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full two-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to seven connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Product
MIPI Receiver Test Solution
M8085A
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The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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Product
Nonlinear Pulse-Envelope Domain
S94518B
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The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
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Product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
Noise Source
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
