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PXI Programmable Power Supply
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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1-Port 14 GHz Analyzer
R140
R140 Vector Network Analyzer (cable and antenna analyzer) delivers lab grade performance in a handheld device. This patented (US Patent 9,291,657) analyzer can be connected directly to the antenna or other DUT without the need for a test cable, eliminating measurement uncertainties inherent to cables. Resulting in highly dependable performance and calibration stability. The 1-port VNA comes with all the features engineers have come to expect included standard in our software.
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Sound Harmonics and Current Analyzer
H74050100
This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
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Test Probe
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Precision Capacitance Meter
TH2638A
Changzhou Tonghui Electronic Co., Ltd.
TH2638 series is a new precision capacitance meter with higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. With basic accuracy of ±0.07%, loss accuracy of 0.0005, test frequency up to 1MHz, 4.3-inch LCD screen, selectable Chinese-English operation interface, TH2638 series is easy to operate and provide fast and reliable test for ceramic capacitor production. Also, it can test all kinds of capacitors from low value to high value. The results of testing one capacitor for several times are quite stable and accurate, even for lower value capacitors. The tester is compatible with SCPI command set, and configured with manipulator and scanner interface, the scanner interface can scan the open/short/ load error calibration in each channel, 256 channels at most. In low frequency, there is signal level compensation function. When the impedance is very small, the internal resistance in signal source and test cable will cause the voltage on terminal of DUT lower than the set range, then this function will adjust the level to the set range.
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Active Probe, 1 GHz
N2795A
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Multi-Channel Attenuation Control Unit (4-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7204A
The J7204A is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204A reduces cost of ownership and provide the best measurement accuracy.
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Ambient Temperature CalPod Module, 20 GHz
85530B
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards.
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Scalar Network Analyzer Extenders
A Scalar Network Analyzer is a type of RF network analyzer that is used to measure only the amplitude properties of a DUT (Device Under Test). Unlike a Vector network Analyzer, it does not measure both amplitude and phase of the DUT.
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PXI/PXIe Source Measure Unit Family
PXS(e)840x
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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Other Passive Probes
Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Performance Board
The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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PoE Testing Chassis & PD Emulation
Can test the PoE performance of the DUT. In addition, it has a function of bypassing data, supporting fast Ethernet data transmission.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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DC Power Module, 150V, 2A, 300W
N6777A
The Keysight N6777A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Railway and Traffic Engineering Solutions
In the past, LXinstruments has already implemented a number of application-specific system solutions which cater for these special requirements. These solutions are often used to replace systems which have been in production for many decades. Our systems are not only employed for testing signal box technology modules, but also for testing train control system which are installed in the track bed. Due to the strong magnetic fields which occur at the DUT in combination with high voltages, the test systems require specific technical safeguards.
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4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W
N6784A
The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.
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Burn-in System
Sonoma
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Noise Receiver Modules And Noise Switching Modules
MT7553 Series
Noise Parameters are the non-50Ω extensions of Noise Figure, and are an important modeling and model validation tool to understand how a device-undertest’s performance changes as a function of source impedance. Noise Parameter measurements are typically performedusing a Vector Network Analyzer (VNA) to measure the S-Parameters of the DUT, and a Noise Analyzer (either Noise Figure Analyzer NFA or Spectrum Analyzer SA) to measure the noise power of the DUT. Noise parameters are calculated from a combination of knownsource impedances, S-parameters and noise powers.
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Production Line Acoustic Test Chamber
PLATC
The Production Line Acoustic Test Chamber from GRAS is designed for quick and qualified acoustic test of cell phones, tablet PCs, Bluetooth speaker systems etc., including frequency response, THD, Rub & Buzz and microphone test using optional sound source. The chamber has a number of connections for injecting test and control signals to the test object (DUT).Benefits include:Repeatable testing and reliable dataEasy open/close for quick and safe change of DUTFlexible test jig for easy adjustment to new DUTFlexible microphone mounting for both front/backside speakers as well as edge-mounted speakersHigh quality, high sensitive 1/4” CCP measurementmicrophone included (G.R.A.S. 46BL)Individually calibrated frequency response** Compared to reference measurement in anechoic room
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Low Noise Test Leads For N1413 With B2980 Series, 1.5m
N1425A
The N1425A is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425A is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425A enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425A to the B2985B/87B.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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HV Test System for Patient Monitors
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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DC Power Module, 20V, 5A, 100W
N6743B
The Keysight N6743B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
