-
Product
Detector And FPA Testing
-
The FPA Test Set (FPATS) interface to the detectors under test (DUT’s) is via a custom pedestal plate which provides both a conductive heat path to both the individual DUT’s as well as the field of view limiting aperture plate. This custom pedestal plate protrudes through the customer provided DUT interface printed circuit board (PCB) and makes physical contact with the rear of the DUT packages and the aperture plate when the FPATS is in the closed position. The pedestal plate is mounted to the ambient source plate and its temperature is actively driven by this subsystem.
-
Product
Hardware Platform
SmartScan 3D
-
SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
-
Product
Burn-in System
Sonoma
-
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
-
Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
-
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
Switch Cables
-
Connect to the PXI-2585 PXI Multiplexer Switch Module or PXI-2586 PXI Relay Module. You can use this cable to facilitate signal routing between instruments and devices-under-test (DUT).
-
Product
Arbitrary Load Control For Modulation Distortion
S94570B
-
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
-
Product
DC Power Module, 5V, 20A, 100W
N6741B
Power Module
The Keysight N6741B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
Product
High-Performance Autoranging DC Power Module, 60V, 17A, 500W
N6756A
Power Module
The Keysight N6756A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
Product
DC Power Module, 60V, 5A, 300W
N6775A
Power Module
The Keysight N6775A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
Product
Flexible Cable Set, 2.4 Mm To 7 Mm
85135F
-
Achieve phase stability with these 62.9-cm cables when a DUT is connected between cable ends
-
Product
Automatic Calibration Module
ACM2509
-
ACM2509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full two-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to seven connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
-
Product
PC Based Comprehensive Test Setup for Luminaires
-
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
-
Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
-
Product
Characterization Platform
-
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
-
Product
MIPI Receiver Test Solution
M8085A
-
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
-
Product
LED Burn-In Test
-
Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
-
Product
Modulation Distortion For E5081A Up To 44 GHz
S960707B
-
The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
-
Product
Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
-
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others.
-
Product
Network Analyzer Cables
-
specialized, high-performance RF coaxial cables used to connect a Vector Network Analyzer to a Device Under Test (DUT).
-
Product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
Digital I/O
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
-
Product
Precision Low-Loss Multiplexers
-
Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
-
Product
60 GHz Noise Figure Test Set
-
The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.
-
Product
Tunable Non-Reflective Band-Reject Filter (700MHz-1GHz)
SPCL-00597
-
This device is placed after the DUT to protect the Spectrum Analyzer from high-power fundamentals and provide harmonic measurements. The non-reflective functionality prevents energy from bouncing back to the DUT and raising the noise floor level.Broadband matching improves dynamic range and reducesmeasurement uncertainty.
-
Product
Scanner Box for STW Series
-
The aim of these scanner boxes is to allow multiple DUTs to be tested either concurrently or in sequence using the STW-9900/9800 safety testers. The scanner boxes are particularly well suited for multi-point safety testing as well for volume testing on factory floors.
-
Product
MMIHF-C, Shielded Test Fixture
100240
-
Shielded test fixture for high frequency and radio application. Protection of the environment from the DUT or shielding of interfering influences on the test. With our high-frequency fixture MMIHF-C, you can test sensitive and transmitting assemblies - even those with a transmitter and receiver combination - in detail without risking consequences for your production.
-
Product
Virtual tester
-
Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
-
Product
Testing of Power Steering Motors
-
Endurance test bench on which up to five drives can be tested at the same time. The drives / DUTs are electrically connected to resistors and driven by a servo drive according to a predefined driving profile. This exam can take up to several days. It detects currents, speeds and temperatures.
-
Product
High-Performance Autoranging DC Power Module, 20V, 50A, 500W
N6755A
Power Module
The Keysight N6755A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
Product
High Temperature Operating Life
7000 Series
-
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
