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Product
Kelvin Test Contactor/Probe Head
Gemini
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At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Product
PXI 8/16-Channel Isolated D/A Converter
M9185A
Digital / Analog Converter
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Product
Exchangeable Cassette Kit for 6TL36 Faraday Chamber
AN134
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Exchangeable plates for RF applications. (Use with RF Kit, P/N AN133)).DUT maximum dimensions: 340 x 350mm
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Product
FPGA Image Processing (IP) Development Kit
ProcVision
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Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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Product
Stator Testing System for EV Motor
EVT531
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Shanghai Dean Electrical Co., Ltd
To meet the standard test projects requirement of the international companiesTo control and analysis the programs will reduce the human careless and misjudgmentEasy to edit environment and easy to learnIt can test multiple sets of DUTs simultaneouslyWhen there are several DUTs are tested, it could identify the undesirable sets individuallyThe Impulse/Surge with waveform comparison is a non-destructive analysisPolarity testMaximum saved files will be up to 100 setsIt provides the password functionSpeeding test could save time and improve efficiencyChinese and English pages can be arbitrarily switched
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Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
Matrix Switch Module
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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Product
DC Power Analyzers
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DC Power Analyzer provides unrivaled productivity gains when sourcing and measuring DC voltage and current into a DUT. The Keysight N6705C DC Power Analyzer is a highly integrated instrument that combines up to four advanced DC power supplies, DMM, oscilloscope, arbitrary waveform generator and datalogger. It provides an easy-to-use interface, with all sourcing and measuring functions available from the front panel. The N6705C makes these tasks easy:
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Product
PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
Signal Module
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
Customized Test Fixtures
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Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
Attenuator
The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
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Product
PXI Instrumentation Modules For Automated Test Systems
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PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
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Product
Vibration Unit Tester
BK2020B
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We developed the BK2020B as an upgrade to our BK2020 to test the electrical specifications (RPM, current, drop pulse, start up voltage) of your cylindrical or coin type vibration units. You can also test vibration level, noise, isolation resistance, and the DC resistance. The DUT power supply and all measurement components are self contained, so external devices aren't needed and the tester uses DSP, making it capable of fast, highly accurate and reliable measurements. The BK2020B is very versatile. It can be set up as a stand alone machine, or used with a PC and software for access to more information, and to save the data for analysis. Either version is great on the product line but you may also use it for QA, QC and development.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
Digital I/O
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Milli-OHM Meter
MR-30
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*Double LCD Display*300,000 counts resolution*Measurement Range: 30mΩ~3MΩ*0.05% accuracy*20 Standard User setting memory sets*Sorting function and Relative percentage function*PASS/FAIL test result alarm*Computer Remote Manual and Auto Scan function*Manual and Auto Channel select*Sampling Rate: 30 sample/sec*High Resolution Temperature compensation and measurement*DUT Four-wire method*USB interface
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Product
Solar Array Simulator
G5.SAS
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The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
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Product
Bidirectional DC Power Supply
62000D
DC Power Supply
Chroma 62000D programmable bidirectional DC power supplies provide both power source and load characteristics. These two quadrant power supplies allow power from the DUT to be converted back to the utility grid and so are ideal for testing renewable energy power systems such as PV, storage, and EV inverters as well as a wide range of bidirectional power conditioning system (PCS) and may also be used as a battery simulator.
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Product
P-Series Single Channel Power Meter
N1911A
Power Meter
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Product
Pulse Pattern Generator, 3.35 GHz, single channel
81133A
Pulse Generator
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Product
Phase Noise Analyzers
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Holzworth Instrumentation, Inc.
Holzworth's Real Time Phase Noise Analyzers are each designed to provide data faster than any other system, while maintaining data accuracy and repeatibilty. There is no guess work as to whether results are valid to the DUT or if there are unwanted variations or contributions coming from the measurement system itself.
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Product
MMIHF-B, Shielded Test Fixture
100223
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Shielded test fixture for high frequency and radio application. Protection of the environment from the DUT or shielding of interfering influences on the test. With our high-frequency fixture MMIHF-B, you can test sensitive and transmitting assemblies - even those with a transmitter and receiver combination - in detail without risking consequences for your production.
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Product
1-Port 14 GHz Analyzer
R140
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R140 Vector Network Analyzer (cable and antenna analyzer) delivers lab grade performance in a handheld device. This patented (US Patent 9,291,657) analyzer can be connected directly to the antenna or other DUT without the need for a test cable, eliminating measurement uncertainties inherent to cables. Resulting in highly dependable performance and calibration stability. The 1-port VNA comes with all the features engineers have come to expect included standard in our software.
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Product
Power Management & MMI Module
H73000700
Interface
This module, named “6TL-MMI”, is designed to be the interface between an operator and a SYSTEM as well as being a metered power distribution unit (PDU) for it. The module is providing also safety controls, data bus interfaces, temperature control and timers. The 6TL-MMI is suitable for any ATE, and specially for those based on CAN bus controlled devices, because in addition to the above functionalities, this module is also providing galvanic isolation up to 1500V for the CAN bus. This isolation will block potential disturbance towards the DUT.
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Product
FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Product
DC Power Module, 20V, 15A, 300W
N6773A
Power Module
The Keysight N6773A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Product
Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
Attenuator
The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
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Product
3U CPCI 32-bit Test Extender
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Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
