Metrology
field of measurement.
See Also: Measurement, Instrumentation, Coordinate Measuring Machines
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Product
Length Gauges
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HEIDENHAIN length gauges deliver high accuracy, even over large measuring ranges. They are commonly used wherever fast, reliable, and accurate measurements are required, such as in production metrology, multi-gauging fixtures, measuring equipment monitoring, and position measurement.
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Rotational Metrology System
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The ZeroTouch® Rotational Metrology System is a precise, high-speed, in-line or near-line metrology, and inspection system that measures critical dimensions of rotors, stators, brake discs, and other cylindrical parts, providing manufacturers with real-time metrology, and inspection data to optimize production processes, detect defects, and improve ROI.
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Product
White Light Continuum Generator
JIBE
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A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
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Non-Contact Sensors
IRIX
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Sciences et Techniques Industrielles de la Lumière
IRIX™ is a family of non-contact sensors based on chromatic confocal technology capable of measuring distances and thicknesses on any material transparent to white light.IRIX™ is capable to measure simultaneously up to five layers of material. The controller can be used in combination with a large family of optical probes with different measurement ranges, mechanical dimensions and metrological specifications to best meet the most diverse application needs.
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Thermal Warpage and Strain Measurement Tool
PS200S
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The TherMoir PS200S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoir PS200S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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DC Current Shunts
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DC current shunts / standards are true 4-terminal devices that precisely measure DC currents from 10 A to 10,000 A. They use special alloys in the resistive elements which are supported on an insulating base for mechanical stability. The 9230A includes special features to reduce the effects of power dissipation and associated self heating errors. These shunts are designed to operate in air at full rated current. These are the best performing, and most widely used, DC metrology shunts in the world.
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Product
Potable Coordinate Measuring Machines
Romer
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A first in the world of portable measuring arms: The ROMER Absolute Arm features absolute encoders and is therefore the first measuring arm which does not require referencing before measurement. When the arm is turned on, it’s ready to go.Quality control, inspection, on-machine verification, reverse engineering, virtual assembly or 3D modelling. Wherever these needs arise, you will find the ROMER Absolute Arm. Much more than just a metrology tool, its value lies in its versatility.Portability, stability, light weight and high-performance laser scanners make the ROMER Absolute Arm an all-purpose 3D measurement, analysis and digitising tool that can be used by anyone, anywhere and with minimum training.Unlike many metrology devices, the ROMER Absolute Arm does not require warm-up time or initialization, thanks to a stable carbon fiber structure and industry leading Absolute encoders. Simply take the measuring arm to the part, switch it on and start measuring.
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Product
Dimensional Metrology
Stand-Alone Metrology Family
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Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Product
Metrology System
IMPULSE V
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With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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Metrology/SEM
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Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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Product
Solar Photovoltaic
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Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film.
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Product
Micrometers
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Is a device incorporating a calibrated screw widely used for accurate measurement of components in mechanical engineering and machining as well as most mechanical trades, along with other metrological instruments such as dial, vernier, and digital calipers.
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Product
Three Phase Meter Test Board
MTB-3050
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TESCO’s MTB-3050 is a Three Phase Meter Test Board with every laboratory feature you could want along with metrology and software suitable for your production meter testing needs.
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Product
Atomic Force Microscope
XE-PTR
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Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Product
TE-Metrology
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HIGHVOLT Prüftechnik Dresden GmbH
The TE measurement complements the high voltage test and is part of the routine and type testing of numerous electrical devices. It is one of the most important non-destructive methods for detecting faults in electrical installations. The breakdown of an insulating material usually occurs at an internal weak point, which usually already shows a partial discharge activity in advance. For this reason, measuring partial discharges can help prevent costly damage. The TE measurement is thus used for quality testing and diagnosis in the factory as well as during on-site testing of cables, GIS, power transformers and transducers or rotating machinery and their components
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Product
Colorimeter Measurement
DRK8620
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Shandong Drick Instruments Co., Ltd.
WSC-S Colorimeter measurement is a superior performance, versatile and convenient operation colorimeter,suitable for the determination of various objects reflection color, whiteness test, chromaticity and color object with two objects. It is equipped with a geometry test head, that the provisions of CIE 0 / d. WSC-S Colorimeter measurement with two portable desktop, digital display, and available for print. The instrument can be widely used in textiles, dyes, printing and dyeing, paper, building materials, ceramics, food, printing, metrology and other departments.
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Metrology Training Services
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As a leading provider of precision measurement equipment we are experts at training new equipment customer on how to get the best out of the equipment and training in the accompanying software functionality. Training can take place at an API facility or your location. Customers will required to pass a competency test and will subsequently receive a certificate of training completion.
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Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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Product
100-Amp Current Calibrator And AC/DC Transconductance Amplifier
2555A
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World’s Leading Precision 100-Amp AC/DC Current Standard - For 30 years Valhalla Scientific’s design has proven rock-solid reliability in metrology labs worldwide. The 2555A is a calibration powerhouse with wide-ranging applications and unsurpassed quality.
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Chilled Mirror Hygrometers
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We are internationally recognized as a leading developer and manufacturer of the high-quality MBW Calibration chilled mirror dew point hygrometers used in a variety of humidity calibration, measurement and gas quality applications. Most notably, our MBW instruments provide the calibration traceability for many laboratories such as humidity instrument manufacturers and National Metrology Institutes. Our MBW chilled dew point mirrors continue to be chosen as transfer standards for inter-laboratory comparisons both regionally and internationally.
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Benchtop Models For Best Film Metrology
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Fixed, high-precision laboratory instruments used to accurately measure properties like film thickness, refractive index, and roughness.
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Probilt™ Probe Card Analyzers
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ITC has a complete range of probe card metrology products that address all probe technologies, probe card sizes and probe counts.
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Product
Single-Phase Meter Test Equipment
ASTEL 1.2 TYPE
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ASTeL 1.2 meter test equipment is a fully automatic system that enables simultaneous, multi-position calibration and verification of single-phase electric energy meters. ASTeL 1.2 offers full compatibility with IEC 60736. Thanks to excellent parameters, superior functionality and outstanding flexibility, ASTeL 1.2 is an ideal solution for utility companies, energy meter manufacturers, governmental institutes of metrology, metrological laboratories, and other customers interested in electricity meters testing.
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Current Transformers
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Excellent measurement technology requires high-quality current transformers. The product portfolio comprises a wide range of current transformers for load currents (operating currents) and residual currents (RCM). Different designs cover a variety of installation situations and metrological requirements, and enable retrofitting. AC/DC sensitive measuring current transformers use a special measurement method to detect both AC and DC currents of different frequencies.
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Product
Connected Meteorology
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"Epi to Etch" - get full control of your frontend processes! The LayTec Connected Metrology® ecosystem enables improved process control characterizing complex layer stacks along the manufacturing chain. In a typical frontend production line, wafers are measured 3 or more times by LayTec products.
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Software
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LK Metrology offers the ultimate choice of CMM multi-sensor metrology softwares. The CAMIO software fits all solutions, especially those high-end industries, such as the aerospace industry, point cloud measurements and for offline solutions while the ARCOCAD software suits standard application, manual CMMs and portable measuring arms.
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Product
Optical Metrology
YieldStar
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Our YieldStar optical metrology solutions for the semiconductor industry can quickly and accurately measure the quality of patterns on a wafer.
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Product
Panels
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Designed mainly for Fanout Panel-Level-Package (FO-PLP) applications, Camtek’s Golden Eagle is used for the inspection and metrology of standard panel sizes, up to 650mm x 650mm. The Golden Eagle addresses the challenges of FOWLP while providing a robust system that addresses the most stringent, high-volume manufacturing requirements.
