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X-ray Inspection System
Cougar ECO / Cheetah ECO
Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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PXI-5650, 1.3 GHz RF Signal Generator
779670-00
The PXI‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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High Voltage Optically Isolated Probes
High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
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Laser Ellipsometer
The laser ellipsometer can be utilized to characterize single films and substrates from selectable, application specific angles of incidence.
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ARINC 429 Receiver
9429 RX
In addition to its wide supply voltage range from 18 V – 36 V the 9429RX module is characterized by its electrical isolation between the cRIO rack and the ARINC interface.
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18-Wavelength CWDM OTDR
FTB-740C-CWDM
Single OTDR unit that covers all 18 CWDM ITU channels for testing through MUX/DEMUX channels, providing a complete end-to-end link characterization or troubleshooting for commercial services, C-RAN networks and metro Ethernet deployments.
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LXI Microwave Matrix, 20GHz, Single 3x3 With Loop-Thru
60-751-133-A
The 60-751-133-A is a single 3x3 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Differential Scanning Calorimetry
Nano DSC
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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NFC and EMVCo Conformance and Design Validation Solution
Micropross MP500 TCL3
The MP500 TCL3 Generator/Analyzer is a high-performance test solution for designing and characterizing NFC devices. Built specifically for the laboratory environment, the MP500 TCL3 offers advanced signal generation features for unmatched flexibility. It supports the following standards:
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Bit Error Ratio Testers
M8000 Series
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Battery Capacity Analyzer
601B
The 601B Battery Capacity Analyzer addresses the need to test and maintain sealed lead acid (SLA) batteries used in backup power UPS, emergency lighting, fire alarms, security systems, and many other electrical systems. By quickly characterizing a battery's response to a load resistance and measuring the battery's internal resistance, this meter displays the remaining battery capacity as an indicator of the battery’s health. Powered by the battery under test, the 601B supports testing of both 6 V and 12 V storage type lead acid batteries.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Pass-by Noise System
Vehicle Pass-by Noise TestingA very flexible Pass-by noise test system for characterizing the overall acoustic signature of any vehicle. Our solution brings a simpler, more effective and cheaper way to obtain accurate velocity and acceleration results for the Pass-by Noise test.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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Calibration Light Source
CAL1
Image Engineering GmbH & Co. KG
The one light source solution in the field of camera characterization and calibration. CAL1The CAL1 calibration light source is designed to characterize and calibrate cameras in the lab or on the production line. Its compact design consists of one iQ-LED element in a 0.3 m integrating sphere that illuminates a 70 mm opening. Because of the non-reflective special diffusor filter on the sphere opening, a uniformity of more than 98% could be reached
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Centrifugal FFF
CF2000
The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.
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Vevo LAB Suite
Vevo LAB offers basic and advanced tools for visualizing, quantifying and characterizing disease progression.
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Current-Voltage Measurement System
The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Diffuse Reflectance Sphere
DRS100
Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Digital Tesla Meter
HT208
Model HT208 digital teslameter is controlled by the SCM,which is suitable for handle operation.It can be used to measure DC or AC magnetic field and flux dencity.The device can be carried on one’sperson. It is characterized by its wide measuring range,simple operation and clear display. It is still added with the function of maintenance such as holding Measure Value/Peak Value,As mT or Gs unit of display can be change over,Measuring range of 200mT or 2000mT can be choosed,and others that as reseting zero by key and so on. The power is one piece of battery 9V. It can be used continually about 20 hours
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Inductive Proximity Sensors
Millions of inductive proximity sensors are currently in use in virtually all industries. They detect metal objects without contact, and are characterized by a long service life and extreme ruggedness. With the latest ASIC technology, SICK's sensors offer the ultimate in precision and reliability. SICK can provide the right solution to meet your requirements every time – from cylindrical or rectangular standard sensors with single, double or triple operating distance, to special sensors for explosive zones and harsh environments. Our sensors are the intelligent, reliable route to implementing industry-specific and customized solutions to any task involving automation.
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Wide FOV Target Projector
The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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RF Training Kit And Lab Sheets
Y1800A
The RF transceiver kit consists of a transmitter unit and a receiver unit in superheterodyne architecture. The transceiver units are made up of various RF building-block modules such as filter, low noise amplifier, power amplifier, mixer and oscillator. The RF transceiver kit is controlled by a Windows-based Control Panel software via USB. A Measurement Automation Program is provided to demonstrate automated characterization and test of RF circuits. A signal generator and a spectrum analyzer are required to run this program.
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M2 & BPP Systems
The M2 factor wil define the beam propagation characteristics compared to ideal Gaussian beam propagation. According to ISO Standard 11146 rightfully offers the laser beam characterization as "M2 times diffraction limited beam", as such, a perfect beam will have an M2 of 1. 1 will be the best achievable value and no beam could have an M2 less than 1. Our conceptual design is based on sub-assemblies allowing to change the sensing head in the M2 device, offering multiple wavelengths heads up to 2.7 microns from deep UV (knife-edge technology) and camera based technology with built-in automatic filter wheel for adjustment. For focused beams, the same measuring head could be attached to a device for meauring highly divergent or highly convergent beams - FocusGage-BA, wherein the Laser Analyzing Electronic Autocollimator offers the capability of divergence measurement with Coming Soon M2 definition. M2Beam is the cornerstone of those measuring devices.
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Handheld Fiber Optic Light Source
Anfkom International Co.,Limited
3109 optical light source can provide 1 to 4 output wavelengths to meet specific requirements,including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber,as well as other wavelengths according to customer needs.Together with the 3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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Terahertz Spectrometers
Due to its non-invasive and non-ionizing properties, terahertz (THz) radiation is unparalleled in its sensing capabilities. Based on state-of-the-art research results, HÜBNER Photonics division developed innovative and highly compact plug & play systems – allowing contact-free detection, characterization and analysis as well as hyperspectral imaging of materials by THz spectroscopy within a few seconds.
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DisplayPort 2.0 Receiver Test
N5991DP2A
Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.





























