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Beam Diagnostics Systems
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Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Product
Modulation Distortion Up To 43.5 GHz
S930704B
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S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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End-Face In-Situ Raman Test Cell
EFI1
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End-face in-situ Raman test cell with a quartz optical window, sealing ring, Ø6–20 mm customizable inner diameter, and stainless steel/PA body for room-temperature electrochemical and materials characterization.
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Life Science Lab Instruments
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Shimadzu's Life Science Lab Instruments are focused on developing new tools to help accelerate life science research by integrating novel chemistry with innovative technology to achieve a unique position as a true provider of solutions for life scientists. Shimadzu brings together technologies and tools that help you find out more about your biological sample. Whether it is a gel based experiment for understanding protein expression, characterizing differences in metabolism in patient studies, imaging tissue with mass spectrometry, Shimadzu can help you discover more about the biology of disease.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Optical Polarization and Dispersion Solutions
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Test & measurement capabilities for analyzing polarization properties of optical signals are indispensable in todays optical R&D-labs and manufacturing floors. The Keysight N778x Polarization Analysis and Control series offers high speed instruments for high performance characterization and verification of optical components and sub-systems.
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Profile Imaging Modules
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The Opto profile imaging modules are characterized by the U-shaped all-aluminum housing, which is only 40mm wide.
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DisplayPort 2.0 Receiver Test
N5991DP2A
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Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.
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Arbitrary Waveform Generators
M8100 Series
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The M8100 Series arbitrary waveform generators (AWGs) offer a level of versatility that enables you to set up complex real-world signals — whether you need precise signals to characterize the performance of a design or need to stress a device to its limits. From low-observable radar to high-density communications, testing is more realistic with our precision arbitrary waveform generators.
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Specialty Instruments
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Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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PNA-X Microwave Network Analyzer
N5241A
Network Analyzer
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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Microcalorimeters
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TA Instruments’ Isothermal Titration Calorimetry (ITC), Differential Scanning Calorimetry (DSC), and Isothermal Calorimetry systems are powerful analytical techniques for in-depth characterization of molecular binding events and structural stability. Thermodynamic binding signatures not only reveal the strength of a binding event, but the specific or nonspecific driving forces involved. Structural stability profiles from DSC reveal strengths and weaknesses in higher order structure and define the behavior of individual domains and their interactions. The TA Instruments Affinity ITC, Nano ITC and Nano DSC provide the performance, reliability and ease-of-use required for the most demanding applications in drug discovery, protein-protein interactions, structure-function characterization and more.
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Environmental Monitoring
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Is the processes and activities that are done to characterize and describe the state of the environment.
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Optical Spectrum Analyzers
FTBx-5245/5255
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Robust In-service Pol-Mux OSNR for 100G/200G/400G (FTBx-5255). Industry’s only all-in-one OSA covering all applications: high speed (100G+ In-service OSNR, etc.), CWDM, O and L-band testing, etc.Portable solution for spectral characterization of DWDM/CWDM networks. Industry’s smallest OSA/transport solution in a single platform (FTB-4 Pro). Pol-Mux OSNR option compliant with IEC 61282-12 standard.
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Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Analytical Instrument
LabSpec 4 Hi-Res
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Analytical Spectral Devices, Inc.
The LabSpec 4 Hi-Res analytical spectrometer is designed for analysis of materials that are characterized by sharp spectral features that may require more resolute spectral data for accurate detection and identification.
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Thermal Warpage Metrology Tool
AXP 2.0
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The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
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FT-NIR Analyzer
ASP400 series
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The TALYS ASP400 series analyzer is designed to achieve monitoring and control of continuous processes. Its seamless installation enables real-time process monitoring, determination of stream properties or physical qualities, process characterization and early troubleshooting. This analyzer is suitable for a wide range of refinery process monitoring applications including naphtha conversion units such as catalytic reforming, isomerization, naphtha hydro-treating and steam-cracking as well as applications in HF alkylation, gasoline blending and LPG.
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Test Services
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D-Coax offers RF/Microwave test services for your researchprojects, as well as, production quantities tests. We have available resources and expertise in the high frequency interconnects testing that will benefit your research and products. We will work with you to make your requested tests the most accurate and reliable and we'll complete them in a timely fashion. The following parameters can be characterized or tested to specifications with our test services: Time Domain: Impedance, Impedance profile, rise time, propagation delay, skew and more. Frequency Domain: S21 - Insertion loss, S11- Return loss, S12 - Reverse Insertion loss (port 2 insertion loss), S22 - Reverse Return loss (port 2 return loss) and more.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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PCI Express 4 CEM Receiver Test Automation
N5991PC4A
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The N5991PC4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 4.0 CEM Add-In Cards and systems
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Sample Holder
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In combination with the PES measuring system, sample holders from aixACCT Systems are now practically standard for the characterization of piezoelectric materials.
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Product
Teslameter
RX - 32
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The device is designed to work as a research or service instrument characterized by a very high precision of magnetic field measurement. Thanks to the operation based on the principle of nuclear magnetic resonance ( Nuclear Magnetic Resonance - NMR ), it is a quantum device whose indications do not depend on external factors such as temperature, pressure, aging effects, etc.
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In-Situ Electrochemical Observation Cell
IEO1
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In-situ electrochemical observation cell for battery research, dendrite visualization, and optical characterization. Designed for real-time electrochemical and microscopy studies.
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Test Cell System
qCf FC25/100
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The quickCONNECTfixture with an active fuel cell area of 25 cm 2 has been an integral part of our product portfolio since 2006. The excellent properties and the patented design of the cellFixture offer enormous advantages in the characterization of cell-internal components for fuel cells and electrolysis.
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EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
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Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
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CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Computery Control Torsion Tester
SG-L10
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The machine is mainly used for torsion test of metal and nonmetal,also it is applicable to the torsion test of parts and members. Servo-motor and cycloid gear reducer are introduced to the loading system in this product, the system for measuring torque and distortion angle are composed of high accurate torsion sensor, photoelectric encoder and computer measuring force.It possesses automatically tracking test torque and distortion angle, maintaining maximum peak load and displaying loading speed.Test data automatically display and process, print the test report according with the national criterions, including test date, number, material quality and torsion strength etc. The machine characterizes advanced technology, high accuracy, good stability, reliable quality and easy to operate, and it is necessary test instrument for aeronautics & astronautics, construction material, traffic, wire & cable, science research departm ent and universities.
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Product
Test Cells
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Our test cells accurately characterize the dielectric properties of liquids and solid material.
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Product
Manual Test Solution
Titan
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Titan is an easy to use, low cost Human Body Model (HBM) or Machine Model (MM) manual test solution. It can be used for design, engineering, and characterization of your devices. Ranging from 50 V to 16,000 V the Titan will have the largest voltage range of any HBM tester.
