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Keysight N7800A Test Management Environment (TME) Software
Special recommended calibration options: The N7800A software calculates point-to-point ISO GUM measurement uncertainty. The special “H-series” calibration options in the link below provide lower measurement uncertainties through use of direct comparison to devices directly characterized by NPL or NIST (or another NMI), along with data on a CD for easy import into the N7800A (avoids manual entry). The overall resulting N7800A measurement uncertainty then incorporates this lower device uncertainty in the overall calculated uncertainty. For more information on the special options please view this spreadsheet N7800A Special Calibration Matrix.
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PNA-L Microwave Network Analyzer
N5234B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Spectroscopic Analyzer / Test
Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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Characterization System
System 7700
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Analytical Instrument
LabSpec 4 Hi-Res
Analytical Spectral Devices, Inc.
The LabSpec 4 Hi-Res analytical spectrometer is designed for analysis of materials that are characterized by sharp spectral features that may require more resolute spectral data for accurate detection and identification.
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Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
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Chamber/Pyroelectric Task
Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled. Radiant's Pyroelectric measurement Task can be added to Vision at additional cost. This measurement suite fully characterizes the pyroelectric charge (polarization) response of the sample under test. The Pyroelectric Task suite controls various thermal controllers such as Quantum Design, Lake Shore, Delta Design, and many others. Detailed Listing of Thermal Controllers Registered in Vision. The Chamber/Pyroelectric Task is quoted upon request.
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Antenna Test System
ATS1000
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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InfiniiVision Oscilloscopes
3000A X-Series
100 MHz to 1 GHz, DSO and MSO modelsView time-correlated digital content with16 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, IC, SPI, RS232 and more Protect your investment with full upgradability
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BTA Analyzer
The new BreakThrough Analyzer (BTA) is a flexible gas delivery and management system for the precise characterization of adsorbent performance under process-relevant conditions. It delivers reliable adsorption data for gas/vapor mixtures using a flow-through system.
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X-ray Diffraction (XRD) Instruments
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Basic Spectrum Analyzer
N9322C
Quickly uncover key insights through fast, value-priced, general-purpose performance up to 7 GHz with -152 dBm DANL and 0.6 dB overall amplitude accuracy Streamlined for straightforward and efficient operation with marker demodulation, one-button optimization, and user-definable soft keys Robust measurement features for easily characterizing your product Automation and communication interface with industry standard SCPI language support and USB and LAN connectivity choices
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Particle Size Analysis
Particle size analysis is a technical procedure to characterize the size distribution of particles in a powder or liquid sample. It is widely used in R&D and quality control in industries involved with nanotechnology, pharmaceuticals, cosmetics, food, electronic materials, sintering materials, Li-ion battery electrodes, etc.
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UXA Signal Analyzer, Multi-touch, 3 Hz to 110 GHz
N9041B
Characterize challenging millimeter-wave signals: 5G, 802.11, satellite, radarMake continuous sweeps up to 110 GHzCapture lower-level spurious signals with DANL as low as -150 dBm/Hz (> 50 GHz)Simplify analysis of the latest wideband signals: 1 GHz fully-integrated instantaneous bandwidth; 5 GHz with external IF output
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LXI Microwave Matrix, 20GHz, Single 3x3
60-751-133
The 60-751-133 is a single 3x3 20GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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LXI Microwave Matrix, 10GHz, Single 4x4
60-750-144
The 60-750-144 is a single 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784777-01
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Test Data Investment Services
PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
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Pulsed and CW lasers, 375 – 1700 nm, 1 kHz measurement rate
871 Series
The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
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Environmental Monitoring
Is the processes and activities that are done to characterize and describe the state of the environment.
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LXI Microwave Matrix, 10GHz, Dual 4x4, Terminated With Loop-Thru
60-750-244-C
The 60-750-244-C is a dual 4x4 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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RF Analog Signal Generators
The right solution for your requirements from the broad analog signal generator portfolio of Rohde & Schwarz.With the analog signal generator portfolio we cover the wide range of RF, microwave and mmWave frequencies.Our selection of analog signal generators is characterized by the outstanding signal purity and performance as well as their functionality of the solutions; whether in the high end or midrange area.The solutions benefit industries such as RF semiconductor, wireless communications, aerospace and defense, and also covers tasks featuring development, production and service, and more.
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LXI Microwave Matrix, 10GHz, Dual 4x4 With Loop-Thru
60-750-244-A
The 60-750-244-A is a dual 4x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Oil-Free HDT & Vicat Tester
HV500
The Instron® CEAST HV500 is the latest instrument design to perform HDT and VICAT tests at high temperatures, up to 500°C, making this instrument ideal for research and quality control applications as it is ensuring the capability to test the new generations of techno-polymers, characterized by their excellent properties at high temperature.
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Automated Optical Inspection
AOI
No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Oil-in-Water Analyzer
LR2500
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
