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Product
Basic Threaded Probes (F720, F730) F73012B075G110
1020310
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The Basic Threaded Probes F73012B075G110 are precision-engineered contact probes designed to meet the demanding needs of various applications. With a robust operational temperature range of -45°C to +100°C, these probes are well-suited for environments where reliability and accuracy are paramount. The F730 series offers a basic contact design characterized by a pitch of 1.27 mm. They are built to handle continuous currents of up to 3.00 A while maintaining a typical contact resistance of just 50 mOhm, making them an ideal choice for high-performance electrical connections.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Product
Thermal Test Vehicles
TTV
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Thermal Engineering Associates, Inc.
Using the TTC-1002 Thermal Test Chip as a basis, TEA offers TTVs in flip-chip, bare die, BGA packages for a variety of thermal simulation, reliability, qualification, heat sink characterization, and TIM characterization activities. Selective unused balls are sequentially connected together for daisy-chain applications.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Product
Vevo LAB Suite
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Vevo LAB offers basic and advanced tools for visualizing, quantifying and characterizing disease progression.
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Product
Compact Tunable Laser Source with Continuous Sweep Mode, 1520nm to 1630nm
81940A
Laser Source
Keysight's 81940A high power compact tunable lasers enables optical device characterization at high power levels and measurement of nonlinear effects. It's improves the testing of all types of optical amplifiers and other active components as well as broadband passive optical components. As single slot plug-in modules for Keysight's 8163A/B, 8164A/B and 8166A/B mainframes, they are a flexible and cost effective stimulus for single channel and DWDM test applications. Each module covers a total wavelength range of 110 nm in the C+L-band.
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Product
PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
RF Signal Generator
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Laser Scanning Systems
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QFP markets manually handled and optically tracked 3D laser scanners that set new standards in the metrology measurement industry. The products are characterized by exceptional performance, ease of use and cost-effectiveness and are the perfect solution for the metrology room as well as for the production line, stand-alone or automated.
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Product
Benchtop Femtosecond/Picosecond Lasers and Amplifiers
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The systems feature a portable design with user-friendly front panel control knobs for adjustment of output parameters, such as power, pulse width and repetition rate. With wavelength options of 780 nm, 850 nm, 1310 nm, and 1550 nm, pulse widths as low as < 0.3 ps, and GHz low-jitter synchronization signals, these systems provide ideal optical sources for high speed transceiver conformance testing and photodiode characterization.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Solutions for Nondestructive Characterization of Elastic
Sonelastic
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Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Product
Molecular Spectroscopy
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Characterize advanced complex materials on any budget. Our comprehensive portfolio of analytical solutions has the ideal molecular spectroscopy instruments for any lab to measure UV, infrared, and fluorescence.*Higher accuracy, increased sensitivity*Sample size flexibility*Wide array of sampling techniques*Shorter sample setup time*Easy-to-use software providing expert results
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Product
Nand Flash Tester
NplusT
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NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Product
EV Profiler Kit V2
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Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Product
Chamber/Pyroelectric Task
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Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled. Radiant's Pyroelectric measurement Task can be added to Vision at additional cost. This measurement suite fully characterizes the pyroelectric charge (polarization) response of the sample under test. The Pyroelectric Task suite controls various thermal controllers such as Quantum Design, Lake Shore, Delta Design, and many others. Detailed Listing of Thermal Controllers Registered in Vision. The Chamber/Pyroelectric Task is quoted upon request.
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Product
Gain-Compression Measurements
S96086B
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The S96086B, gain compression measurements provides fast and accurate characterization of input power, output power, gain, and phase at the compression point of an amplifier, over a specified frequency and power range, with a simple setup
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Product
Inorganic Elemental Analysis
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Elementar Analysensysteme GmbH
The elemental composition of a material determines its properties. Elemental analysis is therefore essential for the characterization and quality control of materials that need to meet certain requirements.Elementar's user-friendly inductar® series for inorganic elmental analysis uses the high-temperature combustion method to determine elemental concentrations of carbon, sulfur, oxygen, nitrogen, and hydrogen and is the ideal solution for R&D, routine, and high-throughput laboratories.
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Product
Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
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The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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Product
Opticle Encoder Tester
Endeavour
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Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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Product
Squeak & Rattle Sub-System And Component Testing
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At MB Dynamics, we’re proud to provide clients in a wide range of industries with quiet, custom turnkey component testing systems for combined squeak & rattle testing as well as durability testing of different components and subsystems (in 1 to 6 DOF). Test items can be excited in one or more axes to understand and characterize the physics and root causes of BSRs. Real-world, on-road vibration conditions are multi-axis simultaneous – vertical, fore-aft or longitudinal, lateral, roll, pitch, and yaw – 6 degrees of freedom or 6 DOF. Affordability drives decisions to find BSRs by exciting in one or two – fewer than 6 DOF. That has been a driving force for MB – be effective at finding BSRs with a lesser number of shakers (DOFs) and thus reduce the test equipment cost of finding BSRs. Vertical-only can be effective; sequential vertical then fore-aft then lateral is one step closer to real-world; creating vibration in four or five axes of response simultaneously is even closer; and full 6 DOF systems that are quiet come closest to duplicating in the lab the on-road conditions. MB offers all these possibilities to meet trade-offs of budget, test time, road replication, and BSR detection effectiveness.
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Product
Heat Deflection Tester
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Apparatus is used to determine the Heat Deflection Temperature or the Vi cat Softening Point. All the specimens are charged with a constant load and immersed in a bath, where temperature is increased at a standard velocity. The attained heat resistance rate of plastic materials is a widely required parameter for product characterization, for quality control, as well as for evaluating their conformity to the previewed applications.
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Product
Scratch Tester
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Scratch testers from Anton Paar are used to characterize film-substrate systems and to quantify parameters such as adhesive strength and friction force by using a variety of complementary methods. This makes scratch testers invaluable tools for the determination of coating adhesion, scratch resistance, and mar resistance in research, development, and quality control.
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Product
NFC and EMVCo Conformance and Design Validation Solution
Micropross MP500 TCL3
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The MP500 TCL3 Generator/Analyzer is a high-performance test solution for designing and characterizing NFC devices. Built specifically for the laboratory environment, the MP500 TCL3 offers advanced signal generation features for unmatched flexibility. It supports the following standards:
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Product
PathWave BenchVue Advanced Power Control And Analysis
BV9201B
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The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Product
Intelligent Sensors
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Silicon Labs is a leading supplier of intelligent sensor solutions that are characterized by superb reliability, compact size, high levels of integration and unmatched ease of use for a variety of applications. Our diverse sensor product portfolio includes optical sensors, digital relative I2C humidity and temperature sensor ICs, biometric sensors and capacitive touch sense microcontroller devices.
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Product
The CryoLab
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The CryoLab is designed to perform rapid material or circuit characterization measurements from room temperature down to cryogenics in a fully automated manner. Doing measurements doesn’t require any experience or know-how on cryogenics, vacuum technology or thermodynamics from the user.
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Product
Push Back Probes (VF3) VF383B0008G05
1010202
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The Push Back Probes (VF3) VF383B0008G05 is an essential tool designed for precision contact in various applications. With a compact design characterized by a pitch of 3.00 mm (118 mil), these probes operate efficiently in temperatures ranging from -45°C to +100°C, making them suitable for a wide range of environments. The critical functionality of the VF3 model is underscored by its continuous current capacity of 8.00 A and a typical contact resistance of just 30.00 mOhm, ensuring reliable performance and minimal signal loss in electrical applications.
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
Source Measure Unit
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Basic Contact Probes (100 Mil) F10006B250G200
1013012
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The Basic Contact Probes (100 mil) F10006B250G200 are precision-engineered components recognized for their exceptional performance in various electrical applications. Featuring a durable brass handle, these probes are characterized by their design and a pitch of 2.54 mm or 100 mil. They are optimized for a wide temperature range, operating effectively between -45°C to +80°C, making them suitable for both harsh environments and sensitive equipment. This versatility is complemented by the probes' robust construction, which includes a beryllium copper plunger and bronze barrel, plated with gold to ensure durability and conductivity.
