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Mezzanine System
5047
The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Gaussmeter And Teslameter
MAGNET-PHYSIK Dr. Steingroever GmbH
The FH series offers compact devices from simple battery-operated handheld meters to versatile laboratory meters. The meters display the field strength in Tesla, Gauss or Ampere per meter. A standard sample is included in the price of each meter. Hall probes for older Gauss meters are available on request.
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DDR4 BGA Interposers, DDR4 DRAM X4/x8 Packages
N2114A
The N2114A DDR4 BGA interposers provide signal access to the clock, strobe, data, address and command signals to the DDR4 BGA package for making electrical and timing measurements with an Infiniium oscilloscope. With the DDR4 JEDEC specification defined at the DRAM ballout, the BGA probe adapter provides direct signal access to BGA package for true compliance testing.
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Adapter/Nickel
WADP-NMSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Probe Card
T90™ Series
The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Radius, Straight Shaft Bullet Nose, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0J
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Needle Microprobe
MT-26/2HT
Fast-response 26 gauge needle probe, (needle length is 2 cm) for instant readings in tissue, semisolids, liquids. Also for very small specimens, powders and materials. Needle tip is sealed to ensure only stainless steel contacts specimen. Max. temp. 200°C. 5 ft. lead. Smallest microprobes give fastest reading. Short probes are easier to insert and last longer. Type #'s indicate needle gauge and needle length in cm.
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Smart Polyglot - Wireless Probe
Signals & Systems India Private Limited
Smart Polyglot is designed to talk to meters of all protocols – PACT, ANSI, IEC. Not only does it talk over optical media, it interfaces with IR, IrDA meters as well, making it the only device that talks to any type of meter in any language.The Smart Polyglot has a wireless Bluetooth interface and enables seamless use with any DOS, Android, or Windows based devices with Bluetooth support. This Smart Polyglot Bluetooth probe can detect the commands from Bluetooth connected devices and establish a connection automatically for meter reading applications.
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General Purpose Probe
HT-2
HT-2 ''Workhorse'' General Purpose Probe - designed for temperature measurement of liquids, gases and semi-solids. Plastic handle with straight 9'' stainless shaft. Not good for surface temperatures. Maximum temperature 400°C, Time constant 0.5 Seconds. 5 foot lead. Not isolated.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1UN-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Immersion Temperature Probe
U1181A
Measure the temperature of food, oil, and other liquids within the range of -50°C to 700°C.
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Super Silicon Resistivity and Type Tester
HS-3FC II
Super Silicon Resistivity and Type Tester is specially designed for silicon sorting，it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Gaussmeter
DX-101
DX-101 Gaussmeter is based on the Hall effect magnetic field strength of the latest developments in instrumentation, the design of desktop-type Gauss meter. Maximum range 330.0mT and 3000mT two tranches, the minimum basic error of 1.0%. Test probe connectors is imported, stable and reliable connection.
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Standard 0.62 (18.00) - 5.40 (153.00) Probe
LFRE-39T15-5.4
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 50,000Overall Length (mil): 1,437Overall Length (mm): 36.50
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25L-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Coating Thickness Gauge for Ferrous and Non-Ferrous Materials
CM8856
* It meets the standards of both ISO2178 and ISO 2361 as well as DIN, ASTM and BS. It can be used both in the laboratory and in harsh field conditions.* The F probes measure the thickness of non-magnetic materials (e.g. paint,plastic, porcelain enamel, copper, zinc,aluminum , chrome etc.) on magnetic materials (e.g. iron, nickel etc.) . often used to measure the thickness ofgalvanizing layer, lacquer layer, porcelain enamel layer, phosphide layer, copper tile, aluminum tile, somealloy tile, paper etc.The N probes measure the thickness of non - magnetic coatings on non-magnetic metals .It is used on anodizing, varnish, paint, enamel,plastic coatings, powder, etc. appliedto aluminum, brass, non-magnetic stainless steel, etc.* Automatic substrate recognition.* Manual or automatic shut down.* Two measurement mode: Single andContinuous* Wide measuring range and highresolution.* Metric/Imperial conversion.* Digital backlit display gives exactreading with no guessing or errors.* Can communicate with PC computerfor statistics and printing by theoptional cable.* Can store 99 groups of measurements.* Statistics is available.2.SPECIFICATIONSDisplay: 4 digits LCD, backlitRange: 0~1250 μm/0~50mil(other ranges can be specified )Min.radius workpiece: F: Convex 1.5mm/Concave 25mmN: Convex 3mm/ Concave 50mmMin. measuring area: 6mmMin.Sample thickness : 0.3mmResolution: 0.1 μm (0~99.9μm);1 μm (over 100μm)Accuracy: ±1~3%n or 2.5 μm or 0.1mil(Whichever is the greater)Bttery Indicator: Low batter indicator.PC interface: with RS-232C interfacePower supply: 2x1.5 AAA(UM-4) batteryOperating condition: Temp. 0~50℃ .Humidity <95% .Size: 126x65x35 mm; 5.0x2.6x1.6 inchWeight: about 81g(not including batteries)Standard accessories:Carrying case ...................1 pc.Operation manual ............ 1 pc.F probe in built .................1 pc.NF probe in built...............1 pc.Calibration foils ..............1set.Substrate (Iron) ................1 pc.Substrate (Aluminium)......1 pc.Optional accessories: RS-232C cable & software:1.USB adaptor for RS-232C2.Bluetooth interface
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Penetration Probe
TP49AP.I
Penetration probe, Pt100 sensor. Range -70 +250 °C. Stem Ø 2.7 mm, length 150 mm. Cable length 2 meters. Aluminium handle.
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25B-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Probe Series
CAPELLA Series
MPI Photonics Automation is the industry leading provider of turnkey test solutions for the LED / Mini LED manufacturing industry. With more than 10,000 MPI probers installed worldwide, the CAPELLA series of probers have a proven track record of superior performance and reliability. The CAPELLA series probers support electrical and optical characterization of all LED product types (Vertical chip, Lateral chip, Flip-chip) from wafer to packaged die level. Whether you need a high-performance, cost-effective or specialty prober system, MPI PA has the most comprehensive range of LED wafer/chip probers to meet your exacting requirements.
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Chair Probe
CP-1500
Stainless steel fabricatedTest chairs with a resistance meter like the Ohm-Stat RT-1000 Resistivity TesterIncludes banana plug to 4.0mm monaural plugMade in the USA
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Standard 1.09 (31.00) - 4.50 (128.00) Long Travel Bead Probe
BPLT-1C-4.5
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Analog VOM
260-8 & 260-8P
Nothing beats a Simpson 260-8 for monitoring fluctuating trends and rates. Portable yet with benchtop accuracy, the 260-8 is ideal for use anywhere -- workshop, lab or in the field. The 260-8P features an additional resettable overload protection circuit and audible continuity checking. Both versions come with batteries, manual and full-size test leads with threaded probe tips and screw-on alligator clips.
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Semi-automatic 150mm Probe Station
CM460
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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Probe/SMA
WPRB-8CPGS
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25I8-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Microscopy
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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Profilometer
MicroCam™
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
