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Product
Voltage Probes
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In addition to EMI measurement with LISNs (Line Impedance Stabilisation Networks, Artificial Mains Networks), Probes are used for Terminal or Line voltage measurement.
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Product
Trident
T-T-90
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The Trident T-T-90 utilizes the latest microwave and microprocessor technology to measure moisture content in various fine and coarse-grained materials. The prongs of the probe are inserted into the material to be tested and the percentage of moisture content is instantaneously shown on the easy to read display.
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Product
S2 Penta Sensors
ULP-S2 PCI/V
LED Sensor
Optomistic Products’ best-selling Sensor, the ULP S2 Penta Sensor, is relied upon for its versatility in accommodating most LED color and intensity test applications. Implemented in a unique and customizable 2-Part solution, the S2 Penta Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption:Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Loads: ‘Int.’& ‘Color’- 2Kohms min., 100pF max.Output Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longTypical response times: Typical response time: <10mS capture time; <100mS overall responsetime for color and intensity simultaneouslyFiber-Optic Probes: Can be paired with any Universal LightProbe Fiber-Optic Probe
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
Alternate 0.99 (28.00) - 6.00 (170.00) Long Travel Bead Probe
BPLT-25HL-6
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40L-013
High Frequency Probe
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Product
Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Product
Pro-Stik II Level Sensor
7330
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The Drexelbrook 7330 Pro-Stik II Series are intrinsically safe programmable liniear position sensors ideal for monitoring in a variety of liquids and tanks.These position sensors are based on the proven magnetostrictive technology and are available in different models including our popular explosion proof and flame proof models. The 7330 Pro-Stik II position sensors are loop powered and available with a rigid 316 stainless steel or flexible PVDF materials.The probe features a security feature by utilizing a timing sequence that is used to unlock the probe for programming. This ensures that the span cannot be accidentally programmed by someone in the field.All of the sensor's electronics are SMT components integrated into the 5/8" diameter sensing tube offering greater options for insertion and mounting in tanks and vessels.
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Product
Digital Megohmmeter Test Kit
STME-RT1000F
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Statclean Technology (S) Pte Ltd
This is a Resistance-Resistivity-Humidity-Temperature Test Kit. It is easy to operate, compact, lightweight, portable meter designed to measure temperature, humidity, and electrical resistance/resistivity. It has both internal and external test probes. The meter will measure resistivity, resistance between two points, and resistance to ground according to EOS/ESDAssociation Standards, -S4.1, S6.1, S7.1, S11.11, and European Standard CECC-EN 1000/15.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1Z-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
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*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1J-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Resistivity Meter
Model 2180
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The unit is compact and lightweight. The basic system is 7″ wide by 2.5″ high and 12″ long. When measurements are needed below approximately 100 micro-ohm-centimeters, the basic system is piggybacked onto a second enclosure that houses a power amplifier with a current gain of ten. The combined unit measures 7″ wide by 5″ high and 12″ long. The combined unit weighs 11.5 pounds. Two short cables interconnect the two enclosures for powering the power amplifier and routing the signals to the fixture or four point probe. The front panel of the basic system includes a 32-character backlit LCD display and a set of function keys. An easy-to-use menu will allow access to user defined parameters such as sample thickness, sample volume, and calibration constants; upper and lower alarm limits, relative measurements, and several others.
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Product
High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-C180-3
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Product
Infrared Thermometer Smart and Wireless Probe
805i
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The testo 805i Smart Probe is an infrared (IR) thermometer that provides non-contact temperature readings; great for checking breakers, motors, ducts, and registers from a distance. The measurement area is indicated by a circular laser pattern which asssures accurate targeting measurement. Use the testo Smart Probes App to take photos of objects and include the laser pattern and the temperature reading for your reference. Easily adjust the emissivity within the App and store data as files or share via text or email. The testo 805i works on smart devices with either Android or Apple operating systems.
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Product
HyMPulse Pulsed Field Magnetometer
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Metis Instruments & Equipment NV
Geometry independent M-measurement (patent pending): One probe fits all, no pole shoes per magnet geometry. Measure the actual magnet instead of a prepared standard size sample. Measurement of industrial shapes like segments, cylinders, bricks,... with one probe
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Product
Fiber Optic Temperature Sensor with the EasyDisk
The TPT-62
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The TPT-62 fiber-optic temperature probe family employs industry standard 62.5µm core OM1 fiber optic for highly improved optical, mechanical, and reliability properties over legacy 200 µm core (1st generation) fiber optic sensors. The EasyDisk sensor tip assembly ensures IEC60076-2 (Annex E) compliant installation and enables quick insertion of the probes into the spacers within the windings of transformers.
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Product
Coating Thickness Gauge
Meter MEGA-CHECK -Basic
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The new generation of MEGA-CHECK devices first used probes in which an own microcontroller, the analog sensor signals are digitized to the device outputs. This new technique is extremely trouble-free and even allows accurate and repeatable readings. The probe cable is both sides (control unit and probe) and therefore particularly service-friendly, as if a cable breaks, the device must not be returned, but only the cable is replaced. The units are equipped with a large, clear and illuminated graphic display. A variety of Fe, ferrous and dual
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Product
RF Voltage Probe
P-20 Series
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The P-20A is a PASSIVE 10:1 RF VOLTAGE PROBE with a 50 Volt DC BLOCK built in. It has been designed to allow users of RF test equipment to use standard signal tracing techniques. The P-20A makes it possible to conveniently and accurately monitor or inject signals up to 3 GHz into RF circuits without significantly loading or detuning them.
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Product
Crack Testing
STATOGRAPH® Product Family
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Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1V-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Interchangeable Probe Active Transmitters
HD2717T… Series
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The instruments of the HD2717T… series are transmitters, indicators, and ON/OFF regulators with data logging functions, they measure temperature and humidity.
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25I8-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Grips and Fixtures for Test Stands
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AMETEK Sensors, Test & Calibration
Our comprehensive range of grips, fixtures, jigs and probes cover most test applications within a wide range of industries. Below you will find a selection of our most popular grips, fixtures, jigs and probes. If you cannot find what you are looking for, please contact us for a presentation of our full range.
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Product
Radius, Straight Shaft Bullet Nose, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0J-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Automated Multi-Functional Tester
QTouch 1408 C
Functional Test
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Product
30A, 50MHz High Sensitivity Current Probe
CP030A
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Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
