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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25V-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
500 MHz Passive Probe for WaveJet Touch, 10:1, 10 MOhm
PP006D
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Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.
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Product
Combined Pressure and Temperature Transducers
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We offer some different styles of combined pressure and temperature transducers which are well suited to Motorsport applications. These include the EPTT5100 combined pressure and temperature transducer, which, has an internal temperature sensor, and the miniature EPTTE1400 combined pressure and temperature transducer which has an external temperature probe.
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Product
Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-C100-1
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Piers and Jetties Testing Equipment
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The BathyCorrometer is a diver-held unit which will measure the corrosion potential at specific contact points. Although the readings are visible to the diver, a Surface Display Unit can be supplied to verify readings on board a ship or diving platform. If Remotely Operated Vehicles (ROVs) are being used, the UCP1A contact probe or UCP1B proximity probe can be easily installed to carry out corrosion surveys. Simple surveys of marine structures can be carried out by the use of a Marine Survey Kit (see the case study on Dover Harbour Board).
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Product
Small IC Adapter for ZD Differential Probe Qty 2
PACC-ZD006
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Small IC adapter for ZD differential probeQty 2
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Product
Flying Probe Tester
FA1817
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Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Product
Ultra High 1.16 (33.00) - 9.70 (275.00) Long Travel Bead Probe
BPLT-25HF-9.7
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Brute Hight Current Probes
P4301
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
Multi-Cell Test System
Cellcia
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Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Product
Standard 1.02 (29.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-62J-4-S
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Voltage Probe
KHZ43201
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Beijing KeHuan Century EMC Technology Co,.LTD
The KHZ43201 voltage probe is a standard low resistance test probe, which meets the technical requirements for this product in the CISPR16-1 and CISPR14-1 test equipment. When measuring the interference voltage of the power grid, the artificial power supply network cannot be used at the load port, and sometimes it is necessary to use a voltage probe to measure the interference of the signal port, the load port, and the antenna port. The input impedance of the voltage probe to the ground wire is greater than 1.5KΩ, which can protect the input terminal of the receiver.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1B-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
150 A, 5 MHz Current Probe - AC/DC, 150 A rms, 500 A Peak Pulse, 6 Meter Cable
CP150-6M
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Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Product
Mixed Signal Oscilloscope: 20 GHz, 4 Analog Plus 16 Digital Channels
MSOV204A
Oscilloscope
20 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.54 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Product
Test Hook Probe
CX-S11
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
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Product
Probe Raman Spectrometers
RMP-500 Series
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Compact, high resolution (f200) Raman optical system that is rugged enough to be moved to a site for sample measurement. This high quality optical bench is used with fiber-optic probes for remote in-situ measurement
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Product
Infiniium S-Series Real-Time Oscilloscopes
S-Series
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500 MHz to 8 GHz. See the truest representation of your signal with the industry’s best signal integrity: 10-bit ADC, low noise front end, superior time base, signal processing in hardware, and responsive deep memory Meet your measurement challenges with the industry’s most advanced platform; 240 GB removable SSD, powerful motherboard, fast data offload, and capacitive touch screen Find a solution that meets your needs with software that has 50 automated measurements and support for 100 probes
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Product
Differential Probe
DP-15K
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DP-15K is a 100mV high sensitivity and able to measure 15KVp-p high voltage and high dynamitic range model.
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Product
Scanning Probe Microscopes
attoMICROSCOPY
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The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1I15-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1UN-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Conductivity Logger Sensor
NUL-215
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This logger sensor is based on a probe with two electrodes with known surface area and distance between them. A signal is supplied to the electrodes and by testing the signal behavior, the conductivity of the solution is calculated
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Product
Digital Oscilloscope
DS6000 Series
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The 6000 Series Digital Oscilloscopes have 1 GHz of Bandwidth. Detecting high speed signals and device characteristics including ESD, digital video, and differential signals (using an differential probe accessory) is now easier than ever with our most advanced digital oscilloscope platform.
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Product
Standard 0.62 (18.00) - 5.40 (153.00) Probe
LFRE-39L15-5.4
ICT/FCT Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 50,000Overall Length (mil): 1,437Overall Length (mm): 36.50
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Product
Oscilloscope Probe Kit
6HP-9060
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Switchable X1/X10/X100 attenuation with reference switch positions. Break-resistant center conductor & wide compensation range. Flatter response, sharper leading edges. Faster rise time and replaceable cable probe head tip and ground lead. Max. input voltage: 600V/1200V (DC-peak AC). Includes BNC adapter, IC tip, insulating tip & trimming tool.
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Product
Conductivity Probe
ACS60-35
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Knowing the conductivity of liquid samples is a key parameter to control product quality throughout the production process. The optek ACF60 conductivity probe fulfils technical requirements of international regulations for reliable measurements ensuring quality and consistency.
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Product
Mixed Signal Oscilloscope: 33 GHz, 4 Analog Plus 16 Digital Channels
MSOV334A
Oscilloscope
33 GHz analog bandwidth4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (2.09 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Product
Probe Head
cViper
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cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
