Product

High Impedance Active Probes

35

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Picoprobe

35 - Picoprobe

The Picoprobe Model 35 has been engineered to meet the stringent demands of advanced high frequency circuit designers.

Product

Phase ID Systems

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Bierer & Associates, Inc

Bierer & Associates, Inc

LED Meter Probe allows the user to take Real time Phase Angle readings along with AC nominal voltage readings. A PD800W LED Meter Probe works in conjunction with the Receive Unit to verify phase identification along with the actual phase angle data. This is all done without any calculations or data transfer from the field to a base computer. The meter probe and reference probe or receive unit can operate at 100 feet of separation and up to 300 feet line of sight separation. In the event that this distance would need to be greater, the Receive Unit can be unplugged from the charging cable and taken into the field while operating on it's rechargeable batteries for up to 8 hours at a time.

Product

Temperature Transducer Pt1000

P4151

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COMET SYSTEM, s.r.o.

P4151 - COMET SYSTEM, s.r.o.

For external Pt1000 temperature probe.

Product

Solder-In Lead for ZD Differential Probe Qty 2

PACC-ZD002

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Teledyne LeCroy

PACC-ZD002 - Teledyne LeCroy

Solder-in lead for ZD differential probeQty 2

Product

30A, 100MHz High Sensitivity Current Probe

CP031A

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Teledyne LeCroy

CP031A - Teledyne LeCroy

Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.

Product

Flying Probe Test System

A8a

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Mycronic

A8a - Mycronic

The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.

Product

Low-leakage Switch Matrix Family

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Keysight Technologies

Keysight Technologies

Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

Product

OmniScan X3 & OmniScan X3 64

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Evident Scientific

Evident Scientific

Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM.

Product

A-/B-Scan Thickness Gauge For NDT

SONOWALL® 70

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SONOTEC GmbH

SONOWALL® 70 - SONOTEC GmbH

SONOWALL 70 is the first thickness gauge in the market with intelligent probe identification. The extended probe management allows probe-specific information such as DAC-curves, delay lines, and serial numbers to be saved directly in the ultrasonic probe. In addition to various thickness applications, the device can be upgraded to a full-function flaw detector.

Product

Radiometric Probe for UVB Irradiance

LPUVB03BLAV

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Senseca

LPUVB03BLAV - Senseca

The LPUVB03BLAV probe measures global irradiance (W/m²) on a surface area (m²) in the UVB (280 nm…315 nm) spectral region. In particular, the spectral sensitivity is focused at 305 nm, with a bandwidth (FWHM) of 5 nm. The global irradiance is the result of the sum of direct solar irradiance and of diffused irradiance incident on a planar surface.

Product

K Thermocouple Penetration Probe

TP660

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Senseca

TP660 - Senseca

“K” Type thermocouple penetration probe. Tolerance according to IEC 60584-2 standard.

Product

Wafer Test Solutions

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AEM Holdings Ltd

AEM Holdings Ltd

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.

Product

DDR4 Protocol Debug And Analysis Solution

U4972A

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Keysight Technologies

U4972A - Keysight Technologies

The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.