Defect
other than specified, imperfection .
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Power Capacitor
POLB HD 7%
Lifasa - International Capacitors, SA
They are self-regenerating condensers with low loss polypropylene dielectric, filled with N2 inert gas mainly, or with resin, and with overpressure disconnection system, which offers a high level of safety against defects, when cutting the 3 phases in case of action.
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Thermal Shock Chambers
Weiss Technik Thermal Shock chambers are designed to give quick transitions between a HOT and COLD temperature zones. Available in vertical, horizontal and liquid models. Thermal stock chambers are used in all industries including Automotive, Electronics, Aerospace, and others to help find product defects in electronic components and product assemblies. Thermal shock is important with MIL -STD 883 test standard.
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Automated Marking Quality Control System
Angara
The machine vision system ASKKM "Angara" is designed to detect and reject defects in the marking of labels, excise stamps, boxes, vials, ampoules, bottles, etc., which have visual manifestations in the field of permanent or variable printing. It is installed on a conveyor or mounted in a labeling machine. Labels are checked before being applied to the product or marking on the package.
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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Machine Vision Camera
Mako
Mako cameras feature the latest CMOS sensor technologies from renowned manufacturers (Sony, CMOSIS, e2V, Aptina, OnSemi Python). Always get the best image quality for your application with a choice of camera models from VGA to 5 megapixel resolution, and frame rates up to 550 fps. Choose between two plug-and-play interfaces (GigE VisionTM or USB3 VisionTM) for an easy integration into standard image processing systems. Mako camera offer advanced features including camera temperature monitoring, pixel defect masking, separate ROI for auto features for all your application requirements.
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Code Verification Systems for Quality Inspection
Matrix codes enable the comprehensive and seamless traceability of goods, which turns out as significant advantage considering everyday product recalls across all industries. Whether salmonella in food, contaminated cosmetics or poor components: defective products can harm consumers, cause losses of image as well as massive economic losses. Using the 2D code, each individual article can be localized globally. Based on the specific serial number, producers and consumers can clearly identify articles if required. That represents a perfect tool for determining whether the article is subject to be withdrawn from circulation. The proper application and specification of 2D code contents allows for serious and sustainable companies to limit recalls, save costs, and to take responsibility for consumer protection.
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Magnetic Particle Inspection
Is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
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Voltage Detector / Phase Comparators
VisualPhase
Hachmann Innovative Elektronik
With the VisualPhase line you get a type series of handy, exact and easily operated multi-functional devices with integrated voltage detectors, phase comparator and maintenance testers. Equipped with a thorough self test to ensure reliable function, a permanently enabled interface-tester to warn against defect interfaces and the connectability to HR, MR, LR, LRM or LRP string parts every VisualPhase delivers uncompromising safety.
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Destructive Physical Analysis (DPA)
Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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PocketDetect HR
PocketDetect HR
Hachmann Innovative Elektronik
With a PocketDetect HR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
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Leadframe Inspection Machine
IV-L200
The IV-L200 is a leadframe inspection machine ideal for measuring leadframe dimension and pitch. Aside from identifying leadframe warpage, it is also used to detect bent or skewed leads as well as surface defects such as scratch, ink, and contamination, among others.
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Flying Probe Tester
FA1817
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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MicroDetect Basic
MDb-01
Hachmann Innovative Elektronik
MicroDetect basic is a handy, exact and simply useable voltage detector and interface-tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-tester warns against defect interfaces.
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Ultrasonic Imaging System
USPC 3010
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Detects internal defects in new materials and metals. The wide frequency range up to 35 MHz enables highestresolution. A-, C-, and D-scans can be recorded. The imaging in B-scans is an option.
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IR Thermometers
This device truly stands out because of its fast response, high/low alarms and dual laser pointer. It is used by maintenance professionals to quickly locate worn machinery, hot spots in electrical panels and defective HVAC equipment.
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Frequency Conversion Rotating Magnetic Fla
MT-2XCF
MITECH MT-2XCF rechargeable frequency conversion rotating magnetic flaw detector is based on principle that the leakage magnetic field can absorb the magnetic powder. Make use of magnetic yoke magnetized the workpiece of ferromagnetic material. If there has defects it will produce leakage magnetic field that will adsorb magnetic powder. We could detect the flaw by observing the density of adsorption magnetic powder. It adopts large capacity lithium battery. By the inverter and the phase shifted signal processor to provide power for the detector, it solves the shortcomings of traditional magnetic particle detector relying on the 220V power supply. It has low power consumption and can continuous work for more than 6 hours. And the battery can be charged when the detector is on and off. Especially suitable for the field testing. It can choose the current frequency according to the flaw depth with unique frequency conversion communication design, that improve the detection sensitivity. It’s widely used in aircraft manufacturing, boiler and pressure vessels and other fields. It is a necessary professional precision instrument of quality control, in-service safety monitoring and life assessment.
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RFID Label Inspection System
Eurotech RFID FS
The Eurotech RFID FS RFID accurately rewinds rolls of RFID labels and validates their receptivity by running them through the Voyantic Tagsurance RFID inspection system. The unit allows stopping at a predetermined editing spot for the removal and replacement of the defective piece, as well as indicating defective labels by a mark printed by an inkjet system integrated with the machine. Adjustment of the closed loop tension control system can be made through adjusting the parameters on the software that control the servo motor control system. This gives the customer a virtual infinite range with which to wind their labels without cracking the inlay or antenna. As well accurate web adjustment and guidance is provided with a web guide system complete with an ultrasonic sensor. The Eurotech RFID FS RFID label inspection system is equipped with the Voyantic Tagsurance for testing the performance of RFID tags. This is done by verifying that the tag responds to commands on its whole operational frequency range, which means testing the tag on multiple frequencies, also outside the RFID reader frequency. Accurate power output combined with the Voyantic Snoop Pro antenna, optimized for testing tags inline at high speed, allows defining precise acceptance criteria and achieving stable quality.
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Visual Control System of Label Printing Quality
The created system allows detecting the following types of label printing defects:- absence or indistinct image or inconsistency of information applied by typographic method;- absence or indistinct image or inconsistency of information or going beyond the boundaries of the print field of variable information printed on the labeling machine (batch number, expiration date).The system is based on a Basler Scout A1300-32gc digital industrial camera and a panel computer.
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PoE Transient Test Meter
Trans-Guard 910016
GrayStone Automation's innovative DCVBD voltage breakdown meter measures the breakdown voltage of many lightning protection devices and components to identify transient protection devices that may be damaged or defective and help prevent costly transient damage to critical and expensive equipment.
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Solar EL Defect Detector
Jiangsu Keyland Laser Technology Co., Ltd.
Features: - Reveals invisible defects- Improves line yield prior to lamination- Improves quality and reliability of final product- Exceptional optical resolution in its class- Flexible system configuration for framed or unframed modules testing
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Microelectronics And Packaging AOI
Machine Vision Products, Inc. has extensive experience in a wide range of Microelectronics and Packaging applications. MVP works with the world’s leading manufacturers on a global basis. From multiple die and wire technologies to leadframe, ball grid array and surface inspection applications, MVP has the widest applications toolbox of any AOI provider. MVP takes pride in the fact that they supply many complex inspection solutions to diverse industries such as Automotive, Telecoms, Medical Devices, Military, and Space. MVP’s 900 Series is the base platform upon which all Microelectronics and Packaging inspection solutions are based. The 900 series 2D capabilities provide metrology and defect detection using a propriety Quad-Color lighting, Telecentric optics and resolutions down to 1um. 3D height measurement capabilities allow for in-line high speed inspection of Dies, paste deposition, positional accuracy, volume and height with a resolution down to 1.13um.
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Probecard testers
MANAGER
Today more complex probe cards are being used. More pins,higher density and larger array requires a new approach inprobe card analysis. With the soaring cost of new generationprobe cards, repair of defective cards becomes an necessity.BE Precision Technology offers all capabilities with the newMANAGER V. Future proof, up to 450 mm full wafer contactprobe cards can be analyzed with up to 88.000 test channels.High-end materials are used to stand extra tough requirements—such as 500 mm diameter diamante viewing window,ultra stiff carbon flip-table, high power Z–stage to generate 600Kg of contact force
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Sewer Laterals Scanner
ES-38
The ES-38 is designed for scanning laterals from 3 to 8 inches in diameter. Using Electro Scan's proprietary technology, variations of electricity flowing through the pipe wall, associated with distance measurements, are automatically transmitted to Electro Scan's Smartphone application to record and display defect locations and their relative size.
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Post-Mould Inspection Machine
IV-P1000
The IV-P1000 is a post-mould inspection machine best known for being a fully automatic vision inspection station and for having a user-friendly GUI for operator and recipe setup. This machine is best used to inspect packages for surface defects on top and bottom.
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Semiconductor Authenticity Verification & Anti-Counterfeiting
JTAG Interrogator
Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.
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Static Code Analysis for Embedded Software
GrammaTech CodeSonar®
CodeSonar is GrammaTech´s flagship static analysis software. Able to analyze both source code and binary code, it is specifically designed for zero-tolerance defect environments. With its advanced static analysis engine, CodeSonar is one of the most effective tools for eliminating the most costly and hard-to-find software defects early in the application development lifecycle. Compared with other tools, CodeSonar identifies twice as many defects that result in system crashes, leaks, data races, memory corruptions and security vulnerabilities.
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AOI & SPI, Test Systems
SigmaX SPI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The SigmaXs inspection technology is unaffected by varying materials, surface conditions, or colors. The system profiles the board to generate accurate 3D shapes far superior to other brands and technologies.
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Sapphire Defect Laser Probe and Glasses
LP-100
Easy to use and portable■ low price with long lifetime■ can be used to detect many defects, like micro crack, bubbles, impurity, crystal subgrain■ When the laser go though the crystal, if it is monocrystal the light should be scattering, in macro it should be white.
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Manual Testing Services
With manual testing services, we will hand-pick a team dedicated solely to your project. Our professionals will work with your developers, business analysts, and managers to go over requirements, build a comprehensive test plan, design thorough test cases, rapidly execute the tests, help remediate defects, and retest until the project is satisfactorily completed. The same individuals will be with you from beginning to end, so they have a complete understanding of the project and how you want it done, and you will always know exactly who you are dealing with. The same QA Engineers that develop the test cases will also execute them, leaving no room for misunderstandings and greatly expediting the process.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
