Defect
other than specified, imperfection .
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Product
PXI Fault Insertion Insertion Switch Modules
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Our PXI Fault Insertion Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect – all of which can simulate connectivity problems in the system.
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Product
1μΩ-4kΩ AC Milliohmmeter Low Resistance Tester
TH2521
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Shenzhen Chuangxin Instruments Co., Ltd.
TH2521 AC Milliohmmeter is a high-performance and intelligent tester widely used to test contact resistance, internal resistance and battery voltage. The application of constant current source with 1kHz frequency can greatly eliminate the potential error caused by thermoelectricity on DUT. This meter has the function to automatically detect contact failures on test cable. At the range of 30mΩ, basic R resolution can reach 1μΩ. It is applicable for transformer, inductance coil copper resistance, relay contact resistance, switch, connector contact resistance, wire resistance, PCB line and via reistance dan metal defect detection, etc. In the mean time, signals, such as HIGH, LOW, PASS, can be output through HANDLER interface, thus it is very convenient to be used in automatic production line.
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Product
Precision LCR Meter (20Hz to 2MHz)
ST2840
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ST2840 series pricision LCR meter innovatively adopts a new generation of technologies such as dual CPU architecture, Linux bottom layer, 10.1-inch capacitive touch screen, built-in instruction which effectively solves the defects of slow LCR test, single display and complicated operation in the past.The measurement frequency of ST2840 series is from 20Hz-500kHz/2MHz, which makes up for the shortcoming of lack of high-performance bridge in the frequency range of 500kHz.
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Product
Circuit Breaker Time Interval Meter
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Measuring contact timings is useful for finding the contact bounces and non-simultaneity of contacts. This helps in finding the possible electrical or mechanical defects in the circuit breaker contacts. Timing analysis also make it possible to detect incorrect mechanical adjustments and wear phenomena of the circuit breaker by measuring the differences between the fastest and slowest phases.
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
Automated System for Visual Quality Control of Markings
Angara 2.0
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The automated labeling quality control system is designed to identify and reject pharmaceutical labels that have defects in permanent printing (applied in a printing house) and variable printing (applied by an industrial printer as part of a labeling machine).
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Product
LED Light Tester
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The T100L Automatic LED Light Test Equipment is designed to identify the presence of any defects of electronic components for LED light applications, addressing any high-volume production testing challenges without needing expensive test fixtures with fiber optics
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Product
Portable GIS Partial Discharge Detector
JHPD-10
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Xiamen Jiahua Electrical Technology Co.,Ltd
JHPD-10 quickly and accurately detects various kinds of partial discharge signals that occur with insulation defects in GIS. Attached on the surface of GIS the detector collects the inside discharge signal of impure gas, suspension potential and solid insulation material. The diagnostic software analyzes the fault character and locates the fault to avoid electricity accident. The device is for daily patrol inspection with high efficiency and easy operation features. Designed with two UHF signal channels, one detects the partial discharge signal; another excludes the disturbance signal like corona discharge in the air and mobile phone communication.
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Product
Fully Automatic No Load ( Routine) Testing Panel For Self Priming Motors
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Aarohi Embedded Systems Pvt. Ltd
Aarohi introduced fully automatic routine testing panel. The primary purpose of the routine test is to insure freedom from electrical and mechanical defects, and to demonstrate by means of key tests the similarity of the motor to a “standard” motor of the same design. this panel also help to enhance productivity, Work efficiency & reduces need for skill operator.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
Thermal Imaging Cameras
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Thermography tools are indispensable when it comes to non-contact detection of thermal differences. Thermal imagers can be used to find defects in buildings, discover damage during maintenance, or analyze thermal processes.
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Product
DI Lab System™
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Comprehensive Product Engineering and Failure Analysis Lab system for complete device analysis and physical defect isolation.
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Product
Electrical Testing
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Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.
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Product
MASK DR-SEM
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Our defect review SEM tools perform detailed reviews of minute defects on photomasks.
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Product
Non-Destructive Testing (NDT)
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Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Product
Cyber Security Assessment
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In the Internet of Things, everyone and everything is at risk of becoming a victim of cyber attacks.Protection against cyberspace threats is particularly relevant and important for connected devices.Messages about defective devices and successful attacks, which can also be carried out with very simple means, are increasing.Third party verification can be helpful in building trust by confirming and demonstrating an adequate level of protection.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Tool and Process Monitoring
BK MIKRO
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BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Product
3D AOI
Zenith2
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Zenith 2 AOI platform, which provides the AI-driven Auto Programming for rapid job programming. The Zenith 2 also combines Koh Young’s advanced vision algorithms with innovative high-resolution optics. The latest platform expands inspection capabilities, delivering best-in-class performance, functionality, and accessibility. Koh Young’s side-view solution allows Zenith 2 to quickly detect and analyze defects on a wide range of mounted components and chips.
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Product
SDT Checker Range
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With a focused solution for every problem, the Checker range makes ultrasound available to everyone. Choose the right tool for the right job and perform fast troubleshooting inspections. As a first defense against breakdown, Checkers identify defects quick and early, allowing for deeper analysis and trending with an SDT200, SDT270 or SDT340.
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Product
Manual Testing Services
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With manual testing services, we will hand-pick a team dedicated solely to your project. Our professionals will work with your developers, business analysts, and managers to go over requirements, build a comprehensive test plan, design thorough test cases, rapidly execute the tests, help remediate defects, and retest until the project is satisfactorily completed. The same individuals will be with you from beginning to end, so they have a complete understanding of the project and how you want it done, and you will always know exactly who you are dealing with. The same QA Engineers that develop the test cases will also execute them, leaving no room for misunderstandings and greatly expediting the process.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
High Voltage System
HV-2
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International Electro-Magnetics, Inc.
*Tests Power Transformers for Continuity, Ratio and Phase. Applied and Induced Potential and No-load Losses.*14 Conductor Switching Matrix will test 7 individual windings, 13 taps of one common winding or some combination thereof. (10 Amp current limit)*The System Control is Windows/Visual Basic based. Menu screens allow full selection of test parameters and sequence. Low voltage tests can be performed first, allowing defective parts to be rejected without proceeding to time consuming induced Potential dwell routines. Test data labeling and data acquisition software can be easily added to the system.
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Product
Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Product
Fully Automatic Full Load (Routine) Testing Panel For Induction Motor
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Aarohi Embedded Systems Pvt. Ltd
Aarohi introduced fully automatic routine testing panel. The primary purpose of the routine test is to insure freedom from electrical and mechanical defects, and to demonstrate by means of key tests the similarity of the motor to a “standard” motor of the same design. this panel also help to enhance productivity, Work efficiency & reduces need for skill operator. More then 500 Indian pump manufacturer ware installed this system & satisfied with performance.
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Product
Ceramics and Glass Inspection Systems
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Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Product
Dual Filament Source
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Get the optimal thermal profile for different materials and situations with the Veeco Dual Filament Source. This source is designed for growing high-quality Ga- and In-containing materials, while preventing charge material recondensation and significantly reducing defects. Dual Filament Sources are available for use with both SUMO and conventional crucibles (including Group III production crucibles).
