Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Test Probes
Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
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SMD Test Probes
The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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Multimeter Test Probes
Multimeter Test Probes, Voltmeter test leads,with the Parrot™ Clip Invention provide precise, HQ, accurate, reliable contacts and connections. Parrot™ Clips with HQ leads and banana plugs or other connectors are the best solution for DDM, analog multimeter for high voltage measurements as well as for high current measurements. Measurements with multimeter test probes require both: Hands-on direct point contact and grip on, Hands free removable connection.
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RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Test Fingers & Probes
Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Single Ended Test Probes
Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Fused Test Probes with Silicone Test Leads
AL-57FL
Standard Electric Works Co., Ltd
● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-quality silicone test leads, 1.5 meter long.● Wipe the fused test probes and silicone test leads periodically with a damp cloth and detergent. Do not use abrasives or solvents.● Operating temperature: -20 °C to +50 °C (-5 °F to 120 °F)● One year warranty● Can't be used on current mode with blown fuse.● Rating : EN 61010-031 CAT Ⅲ 1kV 10A / CAT Ⅳ 600V 10A
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General Purpose Test Probes
Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Test Probes / Test Fixtures
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Fine Tip Test Probes
U1164A
Compatible with test leads shipped with U1210, U1240B, U1250, U1270 series of handheld clamp meter and multimeters
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ATE Test Probes
For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Test Probes and Pins
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Test Probe Kit
69600
Kit includes 14 flexible test probes, long straight probe, piercing back probe, crocodile clip, 4mm circuit tester adapter and Deutsch spooned probe. The probes are designed to be used on popular Weather-Pack, Metri-Pack and Micro-Pack style connectors. The test probes are 5" in length and are flexible to help eliminate damage to the connector terminals that can result from testing with a standard test probe. The 4mm adapter allows conversion of some circuit testers to a 4mm banana connector, which provides a better connection. Kit comes in a pouch for storage.
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Pilot VX
Pilot VX is a flexible, configurable flying Probe test system with an unrivaled set of technologically advanced tools, able to provide the test solutions required by the huge diversity which characterizes today’s electronics.
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Flying Probe Programming & Test Development
Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Interconnect Test Leads
142-1
This 64 inch pair of test leads connects with many different testing accessories and probes. Especially those found in typical test lead kits and assortments. The ends terminate in universal size 4mm banana plugs.
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IEC61032 Test Probe 32
CX-32
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 32 is intended to verify the protection provided by fan guards against access to hazardous mechanical parts.
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Test Probes & Clips
CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Stand-Alone Test Fixture
MA 2013/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Extended Test Lead Kit
U1161A
The Keysight U1161A extended test lead kits are compatible with the U1230, U1240, U1250, and U1270 Series handheld digital multimeters. The set includes two extension test leads (one red and one black), two test probes, medium-sized alligator clips, and 4 mm banana plugs.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Exchangeable Test Fixture
MA 2112/D/H/S-7
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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Wafer Probe Test System
STI3000
The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2D
Current Rating (Amps): 5Average Probe Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64Resistance (mOhm): 35
