Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
Fine Pitch Test Probes
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Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Product
µHELIX® Test Probes
Series S200, S300, S400, and S500
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Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
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ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Test Fingers & Probes
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Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Test Probes
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Safety right angle insulated alligator test probe, safety right angle insulated alligator test probe with insulated jaws, test probe, minitest probe, micro test probe.
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Semi-Rigid Test Probes Up to 6 GHz
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Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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General Purpose Test Probes
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Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Single Ended Test Probes
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Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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Product
Test Probes & Clips
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CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Product
SMD Test Probes
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The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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Product
Environmental Test Probe, PH, Tenma 72-6783 PH Meter
72-6784
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The 72-6784 is a typical 0 to 14pH Probe with epoxy body, BNC connector. It is used with pH meter 72-6783 model.
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Probe Cards
Direct Dock
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Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Test Contactor/Probe HEad
cRacer
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The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Universal Manipulator
LS
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Manage the rapidly changing production environment and achieve the lowest cost of test, converting between probe, final, engineering and service positions with ease. Rapid advancements in semiconductor test technology have resulted in highly efficient test cells, capable of device test throughputs far greater than ever before.
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Product
IEC61032 Test Probe 12 Figure 8
CX-12
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 12 Figure 8 is intended to be used on appliaces for verifying the inaccessibility of hazardous live parts or hazardous mechanical parts.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Fine Tip Test Probes
U1164A
Accessory Kit
Compatible with test leads shipped with U1210, U1240B, U1250, U1270 series of handheld clamp meter and multimeters
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Fault Injection and White-Box Testing
VectorCAST/Probe
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VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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Handheld Digital Multimeter, 2000 Count, Auto/ Manual, 10 A, 250 V, 3.5 Digit
72-13430
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Clear LCD Display. Equipped with comfortable protective cover, test probe holder. 2m drop test, precision protection. Auto Power Off. Auto Backlight Off. Loud Buzzer Sound. Knobs shift smoothly, in-line with ergonomics. Relative mode. Powered by AAA 1.5V x 2 batteries. 12-month limited warranty. view Terms & Conditions for details
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PCIe Carrier For PMC And PrPMC
PCI104
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The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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Product
Automotive Test Lead Kit
143
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Test Lead Kit includes our basic set of interchangeable specialty test probes designed for automotive use. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. The large Crocodile Clips are good for clipping to grounds and battery terminals. Roll up storage pouch keeps your leads organized.
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Test Probes
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Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
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Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Product
Short Test Pin Probe 13
CX-13
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Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards.
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Product
Retractable Cable
3700
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Peaceful Thriving Enterprise Co Ltd
*2 x 6m retractable test leads.*Used as an extension cord for cars, trailers, boats and more.*Optional accessory included alligator clips, test probes and banana plugs.*The tester can be used with any multi meter or device equipped with banana jack connectors.
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Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
