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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
(ITA), Breakout Box & Fixtures
ITA
WinSoft provides a wide range of Interface Test Adapters (ITA) and test fixtures to meet the most challenging functional test and signal conditioning requirements. This includes high frequencies, voltages and current.
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Product
Control Module
MOC
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The MOC is our universal control module for a wide variety of tasks, such as controlling relays in the fixture.
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Product
High Speed Device & Flash Programmer
JT 2147 QuadPOD
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The JT 2147 QuadPOD high speed device programmer and flash programmer comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. Used for gang, parallel, fast testing / Programming of devices.TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).
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Product
Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
Coaxial Cable
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
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Product
Non-Linear Junction Detector
ORION® 2.4 HX
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The ORION 2.4 HX Non-Linear Junction Detector (NLJD) detects electronic semi-conductor components in walls, floors, ceilings, fixtures, furniture, containers, or other surfaces. The ORION 2.4 HX NLJD is made to detect and locate hidden cameras, microphones, and other electronic devices regardless of whether the surveillance device is radiating, hard wired, or turned off.
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Product
Clamshell Type Mechanical Fixtures
Series 10
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Semco MT Series 10: An affordable solution for testing of printed circuit boards.
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Product
Compression Set Fixture
ASTM D395
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ASTM D395 Compression Set Fixture is to test rubber under constant deflection in air.
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Product
Automatic Fixture Removal
S95007B
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Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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Product
EEE Component Testing and Screening Services
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DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
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Product
PXI 1A Fault Insertion Switch 11-Channel
40-195-101
Relay
The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.
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Product
Spectrum Analysis, Up To 13.5 GHz
S930901B
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The S930901B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 13.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
PCB Test Fixtures
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ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
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Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
Large Kelvin Clip Lead
16089A
Accessory Kit
Measure odd-shaped components that you cannot measure using conventional fixtures
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Product
Solar Radiation Sensors
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The solar radiation sensors that Campbell Scientific offers come in a variety of designs: pyranometers, net radiometers, quantum sensors, and pyrheliometers. These sensors measure various aspects of the energy imparted by the sun on the Earth’s surface. A leveling fixture fitted with a bubble level may be required to accurately install solar radiation sensors.
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Product
Through Connector Functional Test Fixtures
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Circuit Check is a pioneer in the development and implementation of access mechanisms enabling testing of circuits through on-board connectors.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Automatic Fixture Removal Software
S97007B
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Automatic Fixture Removal (AFR) software is used to remove the effects of the fixture used to test coaxial connectors, which is required to make accurate measurements on the device
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Product
DGS-65 Test Panel with FV Simulator / Bed of Nails
TA-650
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The TA-650 is a new test fixture that will give any instrument shop the ability to conduct more detailed testing of the Collins DGS-65 directional gyro then was previously available.
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Product
Design and Fabrication Laboratory
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Trialon’s on-site Fabrication Shop is equipped with the tools and experienced staff to design and fabricate custom parts, test fixtures or small batch finished product. Our team is ready to provide your organization with a best-in-class experience that will meet tight timeline.
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Product
Food Grips and Fixtures
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AMETEK Sensors, Test & Calibration
We supply material testing instruments to some of the world’s most innovative companies within the food industry. The reason for this is our extensive experience within food testing, combined with our high precision texture analysis and packaging test systems.
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Product
Wind Power Solution
ECO VESTAS
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These precisely designed fixtures make generator-to-gearbox alignment easy inside any nacelle – safeguarding reliability and optimizing the energy efficiency of the wind turbine.
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Product
Universal Breakout Test Fixture
CA-323
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The CA-323 Universal Breakout test fixture was designed to provide, as the name suggests, a universal test solution for aircraft trouble-shooting. The unit gives the technician the ability to monitor (100) different conductors or open an individual conductor for simulation or measurement. Any avionics component can be extended and in many cases with only a voltmeter and oscilloscope the operation in question of the Unit Under Test can be determined.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
DGN Advanced Reporting Feature, GTE 10.00p
K8223B
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The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
SIMRC - RS232 to I2C Converter PCB
1080-001
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Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
Digital I/O
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
