Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Ultrasonic Thickness Gauge w/A & B Scan and Thru Coating Capability
UTG-4000
Utilizing color waveform A-scan and time based B-scan for absolute correctness, this new state of the art ultrasonic thickness gauge is packed with useful features allowing users to be confident of the displayed values on the most critical of applications. This multi-functional ultrasonic thickness gauge offers everything from basic measurement, Scan mode with Min/Max viewing, GO/NO GO display, Adjustable Sound Velocity and Thru-Coating Capabilities.
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Programmable Single Channel DC Electronic Load, 150V/30A/200W
T3EL150302P
Programmable Single Channel DC Electronic Load, 150V/30A/200W.
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Scanning Head For Energy Meter Test
PACB108
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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ELM Electronic Load Module
Circuit breakers are often overlooked during maintenance of electrical systems in aircraft, or often only verified for open and closed states. To test the true functional purpose of a circuit breaker it requires the application of current in excess of the rated trip value and then measure the time for the breaker to actually trip. This is the only way to verify that a circuit breaker will react as designed if an electrical failure occurs.
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Measuring Microscopes, Image Processing
Milling & Drilling
Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Inspection Microscope
This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Talon 6 GHz RF/IF Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTS 2620
- Search and capture system using Sentinel™ Intelligent Signal Scanner- Captures RF signals up to 6 GHz- Capture and scan bandwidths up to 40 MHz- 30 GHz/sec scan rate- Selectable threshold triggered or manual record modes- 16-bit A/D with 75 dB SNR & 87 dB SFDR- Built-in DDC with selectable decimation range from 2 to 65,536- Built-in DUC with selectable interpolation range from 2 to 65,536- 3U to 6U 19-inch rackmount server chassis with hot-swappable HDDs- Storage capabilities to 192 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- Optional RF upconversion- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Electron Probe Microanalyzer
EPMA
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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ELECTRONIC CIRCUIT TRACER
PPECT3000
*Locate short and open circuits without having to remove plastic panels, molding and carpet*Traces shorts and open wires with visual navigation and sound indicators*Pinpoint shorts, open circuits, switches and breaks in wires
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Dynamically Controlled, High Voltage Digital I/O PXI Card With Pin Electronics
GX5055
The GX5055 represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the GX5050, the GX5055 offers high performance pin electronics and an enhanced timing generator in a compact, 6U PXI form factor.
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Electronic Autocollimators
The concept of autocollimation as an optical instrument was conceived about a century ago for accurate, non-contact measurements of angles. Recent novel photonics upgrades have created a new breed of Autocollimators, offering intricate measurement capabilities for optics, laser profiling, AR/VR/XR goggles alignment, cameras for auto-driving, VCSEL characterization and many more applications with a single instrument packed with multi-tech technologies.
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Electronic Calibration Module (ECal), DC-4 GHz, 2-Port
N7550A
The N7550A is part of Keysight’s family of value-line electronic calibration (ECal) modules that makes calibration of vector network analyzers fast, easy and accurate. Cut your calibration down to half the time it normally takes using a traditional mechanical cal kit. Simply connect it to your instrument and the firmware does the rest. For greater precision and higher accuracy measurements consider the N44xx and N469x family of ECal products.
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Light Sheet Microscopes
Life science research can place high demands on your imaging capabilities: Sometimes you need to image whole living model organisms, tissues and cells as they develop. Or you may want to observe subcellular dynamics in living samples over hours and even days. Light sheet fluorescence microscopy (LSFM) with its unique illumination principle is ideal for fast and gentle imaging of such specimens.
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Programmable DC Electronic Load
M97 series
The new M97XX series programmable DC electronic load is a new generation product designed from Maynuo Electronic Co.,Ltd. Incorporating high-performance chips, the M97XX series delivers high speed and high accuracy with a resolution of 0.1 mV and 0.01 mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs). M97XX series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar celland fuel cell etc.test and measurement applications. From 150W to 200KW, there are many models to choose from :
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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20V/30A/300W DC Programmable Electronic Load
TOB-IT8512
Xiamen Tob New Energy Technology Co., Ltd
IT8512 120V/30A/300W DC Programmable Electronic Load for Battery and Power Supply TestHigh performance and affordable single channel DC electronic load. TOB-IT8512 DC electronic loads provide you with the flexibility to test a wide range of applications from power supply, charger to battery. The high resolution voltage(1mV), current(0.1mA) measurement system provides both accuracy and convenience, and eliminates the need for a DMM, external shunts and wiring.
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Electronic Type Universal Testing Machines
Our list of current Electronic Type Universal Testing Machines products are listed below. If you cannot find what you are looking for, please contact us and we will try our best to help you.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Microscope
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Fabry-Perot Based Scanning Filter
This new type Fabry-Perot Based Scanning Filter (FPSF) is based on Optoplex proprietary fiber optical Fabry-Perot Etalon technology. It offers F-P based scanning filter with central wavelength at 1060nm, 1310nm, 1550nm or other customized wavelength. It can be tuned manually or automatically by scanning over a wide spectral range from 10nm to 100nm with bandwidth from 0.05nm to 1.0nm. FPSF features less than 3dB insertion loss and as high as 1kHz scanning frequency. Its unique high reliability and low insertion loss design presents the most cost-effective solution for OEM application from telecommunication to fiber sensing interrogation.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Electronic Ballast Tester
LCD for displaying waveforms and parameters directly, and it includes all the functions and technical parameters of WT3000. Reports can be printed if printer is connected. It also meets the latest requirements for electronic ballasts in international standards
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Upright Light Microscopes
Get the publication-quality imaging and customizable upright microscope solution you need for your Life Science research with Leica Microsystems. These powerful imaging systems feature constant color, natural light illumination, superior optics, and configurable options to provide high contrast, brilliant images for your cutting-edge biological research.
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Electronic Ballast High Frequency Parameters Tester
UI2002A
• Measure Vrms, Irms, W, PF/Hz • Voltage range: 10~600V, Current range: 10~2000mA, Frequency range: 20~70kHz • Accuracy: Class 2
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acA1440-220um, Monochrome USB3 Vision, 1.6 MP, 220 FPS Area Scan Camera
787073-01
The acA1440-220um is a Monochrome Basler Ace USB3 Vision Camera with a 1.6 MP resolution and a maximum image acquisition speed of 220 frames per second. … The acA1440-220um uses a IMX273 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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acA720-520um, Monochrome USB3 Vision, 0.3 MP, 520 FPS Area Scan Camera
787072-01
Monochrome USB3 Vision, 0.3 MP, 520 FPS Area Scan Camera - The acA720-520um is a Monochrome Basler Ace USB3 Vision Camera with a 0.3 MP resolution and a maximum image acquisition speed of 520 frames per second. … The acA720-520um uses a IMX287 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.
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Microscopic Four-Point Probes
M4PP
CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Electron Microscope Sample Preparation
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
