-
Product
Image Sensor Characterization Systems
-
Image Sensor QE and Spectral Responsivity Characterization
-
Product
Material Characterization Services
-
Accolade Engineering Solutions
As the direction of materials science continues towards studying the basis of properties on smaller and smaller scales, different techniques are used to quantify material characteristics and tendencies. Measuring mechanical properties of materials on smaller scales, like thin films, cannot be done using conventional hardness testing.
-
Product
Surface Analysis and Materials Characterization Services
-
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
-
Product
Antenna Characterization
-
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
-
Product
Arbitrary Load-Control Device Characterization
S94522B
-
The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
-
Product
Material Characterization Products
MeasureReady®
-
Unique real-time sampling architecture for synchronous sourcing and measuring.
-
Product
Active Device Characterization Solution Up To 67 GHz
N5247BM
-
The N5247BM provides the N5247B 67 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 67 GHz.
-
Product
Characterization Platform
-
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
-
Product
Laser Diode Characterization Systems
-
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
-
Product
Solar Cell I-V Characterization System
VS6825
-
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
-
Product
Bench & Characterization Boards
-
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
-
Product
Device Characterization
-
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
-
Product
PCB Material Characterization
N19308B
-
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
-
Product
Amplifier Characterization With Wideband Modulated Signal
N5245BV
Amplifier
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
-
Product
Laser Diode Characterization Testing
-
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
-
Product
Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
-
The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
-
Product
Nucleic Acid Analysis And Protein Characterization
-
Utilizing automated microfluidic capillary electrophoresis (micro-CE) technology, our instruments enable the user to simplify the process of traditional gel separations, resulting in even more accurate and reproducible data in a fraction of the time. Separate, identify and analyze genomic and protein samples in seconds and visualize your data as an electropherogram, virtual gel, or tabular report.
-
Product
Optical Measurement Methods and Characterization Services
-
The Fraunhofer IOF develops optical measurement methods and systems to customer requirements. Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.
-
Product
PCI Express 4 Base Specification Receiver Test Automation
N5991PB4A
-
The N5991PB4A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 4.0 ASICs.
-
Product
White Light Continuum Generator
JIBE
-
A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
-
Product
Multi-Fabric Switch
PEX431
-
Designed to enable the development of complex, scalable, high performance 3U VPX systems in today’s increasingly-connected military/aerospace world, the PEX431 is characterized by significant flexibility. The PEX431 Multi-Fabric Switch and XMC Carrier Card allow designers to build complex VPX systems with multiple single board computers and multiple I/O modules. PEX431 supports PCIe switching, GigE switching and the ability to host a XMC mezzanine.
-
Product
High Speed Photodetectors
-
Macom Technology Solutions Holdings Inc.
MACOM offers photodetectors from 20 – 70 GHz for ultra-clean, high-speed performance that enable precise characterization of ultrafast optical signals. These products are available in with different bandwidths and packages to provide solutions many applications.
-
Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
-
Product
NanoSpectralyzer
NS2
-
NS2 is the world's only three-in-one spectrometer for carbon nanotubes. The NS2 provides all of model NS1's state-of-the-art capabilities for analyzing SWCNT samples through near-IR fluorescence and absorption. In addition, the NS2 captures Raman spectra of all CNTs, whether single-walled, multi-walled aggregated, large diameter, or chemically altered. All spectra are automatically measured with a single placement of the sample cuvette. Sophisticated software then performs integrated data analysis to characterize the CNT sample.
-
Product
Multi Channel Optical Fibre Verification
-
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
-
Product
Socket Wrench BIT733S2
1024487
-
The BIT733S2 is a specialized tool designed for threaded probing tasks, blending advanced engineering with precision functionality. This socket wrench is characterized by its compact size, featuring a tool length of only 35 mm and an outer diameter of 5 mm, making it ideal for use in tight spaces where traditional tools might not fit. The BIT733S2’s 3.00 mm tip diameter ensures a secure fit for delicate threaded components, ensuring reliability and ease of use in various applications.
-
Product
5G NR Automation Test Tool
IQfact5G
-
IQfact5G ensures quality device characterization and facilitates easy customization of test flow, thus significantly reducing engineering effort.
-
Product
PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
Vector Component Analyzer
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
-
Product
Single-Stud Raman Test Mold For Solid-State Batteries
SSR1
-
A single-stud Raman test mold designed for in situ Raman spectroscopy, solid-state battery research, and electrochemical material characterization with stable pressure control and reliable optical performance.
-
Product
PCI Express 6 Base Specification Receiver Test Automation
N5991PB6A
-
The N5991PB6A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 6.0 ASICs
