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Product
Temperature Test
Series T
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The temperature test are characterized by high rates of temperature change, ease of programmability through our color touch panel, as well as extremely low noise levels
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Product
Pulsed IV-Curve Solutions
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Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Product
TLP Tester
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Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Product
Switches
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Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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Product
PathWave BenchVue Electronic Load App
BV0012B
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Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Product
Power Analyzer
HMC8015
Analyzer
The R&S®HMC8015 Power analyzer is a compact tester for AC/DC load and standby current characterization that enables measurements without additional tools such as a computer or remote infrastructure. In addition to a numerical and graphical display with 26 key parameters, the instrument delivers performance and compliance protocols in line with IEC 62301, EN 50564 and EN 61000-3-2.
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Product
Precision Current-Voltage Analyzers
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The powerful characterization software and integrated SMU of Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into characteristics across a wide range of applications. The Precision Current-Voltage Analyzer Series comprises the following three analyzer families:
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Product
Polarization Management
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Control and manage polarization in your optical system with our lossless, fiber-squeezer-based, multifunctional polarization controllers to achieve the highest performance. Emulate all polarization impairment parameters including SOP, PMD, and PDL, with our complete industry-standard line of emulation products for network and system characterization.
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Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Thermal Warpage Measurement Tool
PS600S
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The TherMoir PS600S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoir PS600S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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Product
ADQ Development Kit for Custom Firmware in the FPGA of an ADQ-Series Digitizer
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The ADQ Development Kit is a tool for developing custom firmware in the FPGA of an ADQ-series digitizer. SP Devices’ digitizers are characterized by a combination of high speed and high resolution.The amount of data from the digitizer is thus very high. The most efficient way of processing the data is through a real-time implementation inside the FPGA on the digitizer. The ADQ Development Kit opens the FPGA for the implementation of real-time signal processing algorithms.The ADQ Development Kit is available for all digitizer models.
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Product
Transformers/Baluns
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Macom Technology Solutions Holdings Inc.
At MACOM we offer multiple industry standard transformers used in wireless, aerospace and defense and communications applications. Available in a variety of surface mount, flat pack, and connectorized packages, our transformers and baluns are available in balanced and unbalanced versions and are characterized as 50 and 75 ohm impedance devices. Working closely with system design engineers to meet custom specifications, our proven technological expertise and innovative high quality, low cost manufacturing capabilities makes MACOM the partner of choice for some of the world’s leading infrastructure companies.
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Product
Digital Pattern Generators
DPG
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Active Technologies Digital Pattern Generators also known as DPG, allow digital stimuli generation to stimulate digital designs, providing the capability to emulate standard serial or parallel bus transactions or custom digital interfaces, for system or device debugging and characterization.
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Product
Open Loop Current Sensor
C03 30A
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The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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Product
High-resolution Spectrometer
HR4000
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Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
Nanomechanical Test System
Hysitron TI Premier
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Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Product
High Frequency Coaxial Analytical Probes
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D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm differential, single-ended probe.
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Product
Analog/Linear Tester
Amoeba 4200
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4200 is capable of running multiple test sites independently with a parallel efficiency of up to 85% for quad-site and octal-site testing.It comes with test development and production software suite, which makes the transition from test development and bench characterization to production seamlessly.
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Product
IP QAM
SFT3332 (-D)
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Hangzhou Softel Optic Co., Ltd.
SFT3332 (-D) IP QAM modulator is Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 32 multiplexing channels, 32 scrambling channels and 32 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 32 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is characterized with dual RF output ports which broaden the bandwidth for QAM carriers.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
VNAs for Automated Test Equipment (ATE)
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With our USB VNAs your automated test equipment works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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Product
Displacement and Encoders
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INCREMENTAL digital Transducers are mainly designed for displacement measurement in machine tools and other industrial applications. The sensors are characterized by high precision and are absolutely dust and waterproof. The used materials permit applications in heavy industrial environments.DISPLACEMENT Transducers are suitable for measurements of small distances up to 50mm. They are characterized by high accuracy and repeatability, reliability and fast response. Digital ENCODERS operate on optical or magnetical principal and are offered with incremental or absolute coded outputs. They are suitable for precision industrial applications.
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Product
Characterization System
System 7700
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Fully Portable Stand-Alone OTDRs
LOR-200
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The LOR-200 is a family of fully portable stand-alone OTDRs. The instrument is integrated in a Windows XP based PC-platform with touchscreen interface.The LOR-200 is based on Luciol's novel scanning photon-counting technology (US patent #7,593,098). It achieves a superior dynamic range, and allows high resolution fiber characterization up to a total distance range of 160 km.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Performance vector tester
PVT360A
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The R&S®PVT360A is a VSG/VSA single-box vector tester optimized for FR1 base station, small cell and RFcomponent testing in production and characterization environments. Two independent signal generatorsand analyzers enable fast parallelized measurements. A frequency range of up to 8 GHz, flexible bandwidth configuration and an optional second TRX channel provide the necessary performance and enable flexible adaptation in a small form factor.
