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RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Temperature Calibration Software v5.1
MET/TEMP II
MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
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Temperature Test
Series T
The temperature test are characterized by high rates of temperature change, ease of programmability through our color touch panel, as well as extremely low noise levels
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High-Performance Multifunction Calibrator
5730A
The new 50 MHz wideband option for the 5730A High-Performance Multifunction Calibrator provides expanded wideband capabilities to self-maintaining laboratories by providing a method to calibrate the 50 MHz input of the 5790B AC Meaasurement Standard. This is accomplished by characterizing the 5730A's 50 MHz output using a precision thermal voltage converter (TVC), thus reducing uncertainties to calibrate the 5790B.
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Molecular Spectroscopy
Characterize advanced complex materials on any budget. Our comprehensive portfolio of analytical solutions has the ideal molecular spectroscopy instruments for any lab to measure UV, infrared, and fluorescence.*Higher accuracy, increased sensitivity*Sample size flexibility*Wide array of sampling techniques*Shorter sample setup time*Easy-to-use software providing expert results
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InfiniiVision Oscilloscopes
3000T X-Series
100 MHz - 1 GHz, DSO and MSO models Speed testing with simplified operation and documentation enabled by the 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone Touch Triggering See the most signal detail with 1,000,000 wfms/s update rateQuickly modulate and characterize signals with built-in WaveGen 20 MHz ARB, 3-digit voltmeter and 8-digit frequency counter & totalizer options Decode serial busses faster with hardware-based serial analysis options Protect your investment with full upgradeability
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C-SGN Emulator
The C-SGN Emulator combines the MME, SGW, and PGW functions, simulating the optimized EPC network required for CIoT. As part of the NetTest suite, the C-SGN Emulator creates an end-to-end lab environment for testing functions and features that characterize enhanced Machine Type Communication (eMTC) and Narrow Band Internet of Things (NB-IoT) implementations. In order to reduce complexity in the setup of a test environment, it also supports simulation of SMS Central Function (SMS-SC) and the Service Capability Exposure Functions (SCEF).
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Temperature, Velocity & Pressure Measurement
ATVS-NxT
Advanced Thermal Solutions, Inc.
The ATVS-NxTTM hot wire anemometer is a fully-portable scanner that provides rapid and highly precise of temperature and air velocity measurements for thermally characterizing electronic packages.
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High Voltage Optically Isolated Probe, 350 MHz Bandwidth. Includes soft-carrying case.
DL03-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Benchtop Femtosecond/Picosecond Lasers and Amplifiers
The systems feature a portable design with user-friendly front panel control knobs for adjustment of output parameters, such as power, pulse width and repetition rate. With wavelength options of 780 nm, 850 nm, 1310 nm, and 1550 nm, pulse widths as low as < 0.3 ps, and GHz low-jitter synchronization signals, these systems provide ideal optical sources for high speed transceiver conformance testing and photodiode characterization.
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Impedance Analyzers
HTF-1100.
A laboratory furnace used specifically for the electrical characterization of materials and also for heat treatment between ambient temperature and 1100 °C.
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PNA-X Microwave Network Analyzer
N5247B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Embedded DisplayPort Electrical Performance and Characterization Toolset Software
D9040EDPV
Characterization testing of eDP designs now supporting AUX channel automation.
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Nanomechanical Test System
Hysitron TS 77 Select
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Ferroelectric Tester
Premier II
The Precision Premier II, is one of Radiant's most advanced test systems. The Premier II has the large envelope in terms of frequency response, voltage range, and accuracy of any ferroelectric tester in the world. Vision Software is provided with the Premier II Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choice from.
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OTDR
OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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NTA Particle Size Analyzers
NanoSight Range
The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
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Subsea Oil-In-Water Analyzer
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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PNA-L Microwave Network Analyzer
N5232B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Manual Tuners / Impedance Tuners
Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
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Hydrogen Storage Analyzer
IMI-HTP
The IMI-HTP is designed to characterize hydrogen storage materials using Sieverts method up to pressures of 200 bar. High accuracy is ensured by a minimized dead volume, all-metal construction, high thermal stability and accurate pressure measurement. Every IMI-HTP is specified to meet the challenging demands of high pressure H2 operation, with permanent overpressure protection to satisfy the most rigorous safety requirements.
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Low Leakage Switch Mainframe
B2201A
The B2201A reduces the cost of test by enabling characterization tests to be automated, with only slight compromise to the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
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Signal Path Analyzers
HL2200 Series
HYPERLABS HL2200 Series Signal Path Analyzers™ provide high-performance test and measurement capabilities for a fraction of the cost of traditional benchtop systems. These differential, multi-channel instruments are ideal for interconnect characterization, debugging cable assemblies, coupon testing, controlled impedance analysis, and other applications requiring a fast rise time.
