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Product
PNA-L Microwave Network Analyzer
N5234B
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Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Thermal Conductivity Analyzer
TCi
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The default C-Therm TCi Thermal Conductivity Analyzer employs the Modified Transient Plane Source (MTPS) technique in characterizing the thermal conductivity and effusivity of materials.
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244
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The 60-750-244 is a dual 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Life Science Lab Instruments
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Shimadzu's Life Science Lab Instruments are focused on developing new tools to help accelerate life science research by integrating novel chemistry with innovative technology to achieve a unique position as a true provider of solutions for life scientists. Shimadzu brings together technologies and tools that help you find out more about your biological sample. Whether it is a gel based experiment for understanding protein expression, characterizing differences in metabolism in patient studies, imaging tissue with mass spectrometry, Shimadzu can help you discover more about the biology of disease.
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Product
TF Analyzer
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The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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Product
DC-Resistance Meter
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High-stability internal resistance of the battery Meter.The main battery internal resistance and battery voltage. This product can simultaneously measure the resistance and voltage and to compare battery internal resistance and open-circuit voltage.The CHT3560 standard RS232C and HANDLER interface automated measurement fast and accurate judgment the battery deterioration of the situation, sorting products suitable for battery assembly line and factory inspection. Low resistance characteristics can be used to characterize the mechanical and electrical components down low current test conditions.
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Product
DWDM High Power DFB Buttterfly Laser
CA1782-XXX-XX-BT
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The CA1782-XXX-XX-BT DWDM High Power DFB Buttterfly Laser component is characterized for use as a CW optical source in CATV and DWDM networks. The CA1782-XXX-XX-BT is dc-coupled with a built-in TEC, thermistor, and monitor photodiode. The device is mounted in a 14-pin, OC-48 pinout compatible butterfly package with the optical isolator mounted on the TEC. The CA1782-XXX-XX-BT incorporates a high efficiency coupling scheme to deliver 40 mW, 50 mW, 63 mW and 100 mW of CW optical power.
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Product
Total Flux Measurement Systems
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LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
Low-leakage Switch Matrix Family
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Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Product
Automated Optical Inspection
AOI
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No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Product
Transformers/Baluns
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Macom Technology Solutions Holdings Inc.
At MACOM we offer multiple industry standard transformers used in wireless, aerospace and defense and communications applications. Available in a variety of surface mount, flat pack, and connectorized packages, our transformers and baluns are available in balanced and unbalanced versions and are characterized as 50 and 75 ohm impedance devices. Working closely with system design engineers to meet custom specifications, our proven technological expertise and innovative high quality, low cost manufacturing capabilities makes MACOM the partner of choice for some of the world’s leading infrastructure companies.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Product
Fiber Optic Tester
OPTOWARE-FTTx-PON Test Solutions
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FTTx networks using PON technology can be characterized and maintained every step of the way using very simple new fiber-optic test equipment.
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Product
Automatic Calibration Module
ACM4509
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ACM4509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full four-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
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Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
PNA Network Analyzer Family
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Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
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Product
cPCI System Power Supply
VX6620
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The potential-free power supplies of the VX66xx family stand for precision and reliability and are characterized by many extras such as extremely low noise, very short rise and fall times and additional measurement functions. The energy is completely provided by the PXI chassis, therefore external power supplies are not necessary
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Product
Metrology
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KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Product
LXI Microwave Matrix, 10GHz, Dual 3x3, Terminated With Loop-Thru
60-750-233-C
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The 60-750-233-C is a dual 3x3 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
2-MGEM Optical Anisotropy Factor Measurement System
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The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Product
OTDR
palmOTDR
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The compact palmOTDR now offers even more testing capacities, flexibility and value with combination of 850/1300/1310/1490/1550/1625/1650nm (Mono/double/triple wavelength) OTDR, 1310/1490/1550nm PON Power Meter, Stabilized Laser Source and VFL. The OTDR wavelengths cover the applications of regular end-to-end fiber characterization (1310/1550nm), premise/enterprise LAN testing (850/1300nm), FTTx fiber link construction verification (1490nm) and PON live fiber troubleshooting (1625/1650nm with filter). The integrated PON Power Meter can perform in-service testing of all PON signals (1310/1490/1550nm) on any spot of the network featuring pass-through design and burst mode support. palmOTDR is your ultimate solution to meet various testing requirements of entire fiber network.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
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Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
FTTx Amplifiers
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Macom Technology Solutions Holdings Inc.
MACOM’s FTTx amplifiers are designed for PON, RFoG and SFU receiver equipment and are offered in small, plastic QFN packages with integrated amplifier and attenuator functions. All parts cover the full 45 to 1000MHz / 1200MHz CATV band. 5v and 12v solutions are offered with power consumption of ≤ 1.5Watts. MACOM’s FTTx amplifiers are characterized with industry standard photodiodes, covering optical input ranges from -12 to +3dBm and each sample EVK comes complete with a photodiode and APC connector.
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Product
Fibolocator
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Fibolocator is an innovative device for measuring and characterizing breaks and other backscattering-causing faults in optical fibers. Time-resolved correlation reflectometry is the principle on which the device is based. It analyzes the backscattered light like a pulse OTDR, but unlike such OTDRs, cw laser diodes are used. The requirements for the test signal and the complexity of the system are low, which leads to very low costs for OEM subsystems.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
Connected Meteorology
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"Epi to Etch" - get full control of your frontend processes! The LayTec Connected Metrology® ecosystem enables improved process control characterizing complex layer stacks along the manufacturing chain. In a typical frontend production line, wafers are measured 3 or more times by LayTec products.
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Product
Probe Series
CAPELLA Series
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MPI Photonics Automation is the industry leading provider of turnkey test solutions for the LED / Mini LED manufacturing industry. With more than 10,000 MPI probers installed worldwide, the CAPELLA series of probers have a proven track record of superior performance and reliability. The CAPELLA series probers support electrical and optical characterization of all LED product types (Vertical chip, Lateral chip, Flip-chip) from wafer to packaged die level. Whether you need a high-performance, cost-effective or specialty prober system, MPI PA has the most comprehensive range of LED wafer/chip probers to meet your exacting requirements.
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Product
High Voltage Dividers
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Ohm-Labs manufactures precision resistive high voltage dividers. By individually characterizing each resistor in the divider, voltage and power effects are minimized.
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Product
PNA-X Microwave Network Analyzer
N5245B
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Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
