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Product
Current-Voltage Measurement System
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The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Product
High Voltage 50 Ω Pulse Generator
TLP-12010A
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High Power Pulse Instruments GmbH
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics inpulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
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Product
VNAs for Automated Test Equipment (ATE)
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With our USB VNAs your automated test equipment works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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Product
ATCA 5U 6 Slot Dual Dual Star 40G - with bused IPMB
109ATCA506-1003R
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The 5U 6 slot ATCA backplane is a dual dual start with bused IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
General Purpose Single Axis Accelerometers
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Motion of a rigid body can be characterized within six degrees of freedom. Providing mechanical excitation to simulate this motion as may be encountered in the real world can entail a variety of test machines. There are various pound/force vibration shakers for structural testing. Regardless of the apparatus, the goal is always to ensure that the product under test can adequately perform, and reliably survive, in the environment in which it will be deployed, or to which it will be exposed during transport. PCB® accelerometers provide the measurement signals needed to control the vibratory input and to analyze the product’s reaction to such testing.
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Product
Materials Lab XM
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The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XM-studio MTS software platform, together with integrated equivalent circuit analysis functionality.
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Product
Variable Optical Attenuator Module for Multimode Fiber Applications
81578A
Optical Attenuator
The Keysight 81578A variable optical attenuator is designed for multimode fiber applications and features lowest insertion loss and excellent wavelength flatness over a complete attenuation range of 60 dB, for characterizing optical network components for telecommunication and data communication in systems.
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Product
Time Domain Reflectometers
HL1100 Series
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HYPERLABS HL1100 Series TDR instruments provide high-performance test and measurement capabilities for use in the field or in the lab. These instruments are used for applications such as fault detection in cables and interconnects, impedance characterization, time of flight analysis, water level measurement, and more.
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Product
Noise & Vibration Tester
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System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).
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Product
Device Modeling Products
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Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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Product
PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
RF Signal Generator
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Product
High Voltage Optically Isolated Probes
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High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
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Product
Analog Modulation and Frequency-Dependent Measurements
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Modern lightwave transmission systems require accurate and repeatable characterization of their optoelectronic, optical and electrical components to guarantee high-speed performance.
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Product
Data Acquisition
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Data Acquisition used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Product
PNA-L Microwave Network Analyzer
N5239B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to8.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Chamber/Pyroelectric Task
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Radiant's Chamber/Pyroelectric Task sets the sample to a series of temperatures by performingGPIB control of an external thermal device. At each temperature it captures the sample’s polarization response and/or small-signalcapacitance. These are combined to calculate the pyroelectric coefficient. The Pyroelectric Task is to be used with a Radiant Test System and a Linkam Stage (-196C to 600C), Thermal Chambers, Hot Chucks, or a Furnace to automatically measure the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled. Radiant's Pyroelectric measurement Task can be added to Vision at additional cost. This measurement suite fully characterizes the pyroelectric charge (polarization) response of the sample under test. The Pyroelectric Task suite controls various thermal controllers such as Quantum Design, Lake Shore, Delta Design, and many others. Detailed Listing of Thermal Controllers Registered in Vision. The Chamber/Pyroelectric Task is quoted upon request.
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Product
PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Metrology
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KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Product
Oil-in-Water Analyzers
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Product
Intelligent Sensors
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Silicon Labs is a leading supplier of intelligent sensor solutions that are characterized by superb reliability, compact size, high levels of integration and unmatched ease of use for a variety of applications. Our diverse sensor product portfolio includes optical sensors, digital relative I2C humidity and temperature sensor ICs, biometric sensors and capacitive touch sense microcontroller devices.
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Product
Rheometers
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The MCR rheometer series from the market leader offers you one thing first and foremost: an open range of possibilities. Whatever your rheological requirements are and will be in the future – based on its modular setup, your MCR rheometer is efficiently and comfortably adapted and extended to meet your needs, from routine quality control to high-end R&D applications. An investment in an MCR rheometer is always a safe investment in longstanding technology: The air-bearing-supported EC motor, for example, was developed by Anton Paar and has been used in all MCR models for over 25 years to ensure accuracy across a vast viscosity range. It makes it possible to measure liquids with a viscosity even lower than water and also characterize stiff materials like polymer composites or steel by DMA – and everything in-between.
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Product
Climate Test
Series C
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With our CTS climatic test chambers, you can also simulate the stress factor humidity in your tests next to the temperature. The humidity is measured by a capacitive moisture sensor, which is characterized by high accuracy, long term stability and low maintenance.
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Product
PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
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The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783127-01
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
EasyEXPERT Group+ Software (for PC)
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Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Product
PXI Microwave Switch Modules
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Pickering's PXI Microwave Switch Modules vary from simple multiplexer and switch configurations to integrated matrices and large multiplexers. Most products are characterized for 50 operation however certain 75 versions are supplied either as standard or custom products. Remote versions occupy a single PXI slot with the microwave switches mounted separately from the host chassis, connection to the module is via a supplied control cable.
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Product
Thyristor Regulators
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Small and lightweight thyristor regulators for single-phase loads are characterized with high panel installation density.
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Product
16 Mux-scrambling Modulator
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Hangzhou Softel Optic Co., Ltd.
SFT3394C is a high performance and cost-effective QAM modulator designed by Softel. It has 16 DVB-S/S2 FTA tuner input to 16 non-adjacent carrier output with multiplexing, scrambling and QAM modulating included. It also supports maximum 512 IP input port and one IP (MPTS) output through GE1 and TS input for re-mux through 2 ASI ports. SFT3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation CATV broadcasting system.
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Product
Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
