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Product
EasyEXPERT Group+ Software (for B150x Mainframe)
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Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Product
Software
Solar Cells/ Photovoltaic Devices
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Materials Development Corporation
MDC offers a comprehensive array of current-voltage, capacitance-voltage, and resistivity measurements to characterize solar cells and PV devices. CSM/Win systems and software can help to fine tune your process for maximum efficiency. Critical values such as series and shunt resistances, maximum power point (both actual and theoretical), and fill factor are automatically determined.
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Product
PAM4 Bit Error Rate Tester.
BERT-1102
Tester
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Product
PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
Signal Module
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
PNA Network Analyzer Family
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Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
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Product
PNA Microwave Network Analyzer
N5222B
Network Analyzer
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
2D Near-Field Analysis of VCSEL Arrays
VTC 4000
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Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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Product
PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
LXI Microwave Matrix, 10GHz, Single 4x4
60-750-144
Matrix Switch Module
The 60-750-144 is a single 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Deep Access RF Probes
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GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Product
PNA-X Microwave Network Analyzer
N5245B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Amplified Spontaneous Emissions (ASE) Sources
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The AP505xA series, high power ASE sources provide stable output power up to + 23dBm and broad flat spectrum over C+L band or T band. They enable effective and efficient measurements for component characterization or optical sensing. Finally, these products are proposed in friendly-user stand alone benchtop instrument with touch sensitive screen, GPIB, ethernet, RS-232 or USB controls.
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Product
Low Voltage Power Supplies
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We offer low-voltage power supplies in the power range up to 100,000W (customer-specifically even higher). , They are designed for maximum output voltages of 6.5V to 350V and are continuously adjustable from zero to maximum. Our low-voltage power supplies can be operated in constant voltage mode as well as in constant current mode. This enables unlimited operation at any time with the maximum current that can be supplied (even in the event of a short circuit). They are suitable for ohmic loads as well as inductive or capacitive loads and are characterized by a service-friendly design,
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Product
Teradyne Software Solutions
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From design through production, whether developing and debugging code or performing characterization, Teradyne offers an array of seamless solutions that extend beyond our core software to reduce your engineering efforts and speed development.
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Product
RCS Software
CEMExpert
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CEMExpert is a software dedicated to the prediction of radar cross-section of aerial and naval targets. The software uses both the high-frequency asymptotic method (PO-PTD) as well as the full-wave equation solver (FVTD). A quick calculation is made possible by automated meshing, scripts for azimuthal scan and parallel processing. The software has been used for improving stealth performance of UAVs, for shape optimization of naval ships and RCS characterization of target missiles.
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Product
COLOSUS
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The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
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Product
Monochromatic High Power LED Light Sources
LS-HP1 Series
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The LS-HP1 is a series of high-power, high brightness light sources for liquid light guides (LLG). It is characterized by its outstanding luminance and thus delivers very high light output from liquid light guides. The LS-HP1 works with the latest generation of high-power LEDs with up to 100W power from an area of less than 15mm². With the LS-HP1 series, we achieve the highest luminance levels through optimized optical coupling into the liquid light guide without heating it up too much. The LS-HP1 is available for liquid light guides with core diameters of 3 or 5mm.
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Product
Modulation Distortion Up To 13.5 GHz
S930701B
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S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
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The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Product
Dimensional Metrology
Stand-Alone Metrology Family
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Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Product
General Purpose Single Axis Accelerometers
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Motion of a rigid body can be characterized within six degrees of freedom. Providing mechanical excitation to simulate this motion as may be encountered in the real world can entail a variety of test machines. There are various pound/force vibration shakers for structural testing. Regardless of the apparatus, the goal is always to ensure that the product under test can adequately perform, and reliably survive, in the environment in which it will be deployed, or to which it will be exposed during transport. PCB® accelerometers provide the measurement signals needed to control the vibratory input and to analyze the product’s reaction to such testing.
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Product
Gross Alpha/Beta Measurement Systems
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Gross alpha/beta measurement is one of the simplest radioanalytical procedures which are applied widely as a screening technique in the field of radioecology, environmental monitoring and industrial applications. This procedure has been developed to determine whether radionuclide specific analysis is required to further characterize the water. Regular measurements of gross alpha and gross beta activity in water may be invaluable for early detection of radioactive contamination and indicate the need for supplemental data on concentrations of more hazardous radionuclides.
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Product
PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Scatterometers / Thin Film Metrology Systems
OptiPrime Series
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The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Product
EMC & RF Solutions
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Microwave Absorbing Material Characterization System that measures the signal loss through a material sample in a frequency range of 5 15GHz (with the option of extension to lower frequencies).
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Product
Solar Cell I-V Characterization System
VS6821
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Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Product
Precision Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052C
Mechanical Calibration Kit
The Keysight 85052C precision mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection.
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Product
Nanomechanical Test System
Hysitron TS 77 Select
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The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Product
PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
Multiplexer Module
The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
