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Test Services
D-Coax offers RF/Microwave test services for your researchprojects, as well as, production quantities tests. We have available resources and expertise in the high frequency interconnects testing that will benefit your research and products. We will work with you to make your requested tests the most accurate and reliable and we'll complete them in a timely fashion. The following parameters can be characterized or tested to specifications with our test services: Time Domain: Impedance, Impedance profile, rise time, propagation delay, skew and more. Frequency Domain: S21 - Insertion loss, S11- Return loss, S12 - Reverse Insertion loss (port 2 insertion loss), S22 - Reverse Return loss (port 2 return loss) and more.
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Photoelectrochemical Test System
ModuLab XM
The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Optical Light Source
Shenzhen Sharingtek Communication Co., LTD
Is used to emit electromagnetic radiation in order to perform a specific task, whether detecting faults, breaks and microbends, characterizing link-loss or certifying LAN/WANs.
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PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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AC source/sink
The static AC source contains tried and tested components from our UPS technology., Available with adjustable output frequency and/or output voltage., Clear design, tried and tested components and easy maintenance characterize this AC source.
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Variable Optical Attenuator Module for Multimode Fiber Applications
81578A
The Keysight 81578A variable optical attenuator is designed for multimode fiber applications and features lowest insertion loss and excellent wavelength flatness over a complete attenuation range of 60 dB, for characterizing optical network components for telecommunication and data communication in systems.
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Specialty Instruments
Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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ATCA 5U 6 Slot replicated Mesh 40G - with bused IPMB
109ATCA506-3003R
The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with bused IPMB, designed to meet 40Gbps ( 4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Network Infrastructure Testing
Xena VulcanBay
Xena Networks’ VulcanBay is a scalable Gigabit TCP test chassis that offers extreme performance for stateful traffic load testing, analysis and characterizing of Ethernet equipment and network infrastructure. It supports 1/2.5/5/10/25/40GE interfaces and can be used for simulating millions of real-world end-user environments to test and validate infrastructure, a single device, or an entire system.
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Multiplexer 2:1 With De-Emphasis 32 Gb/s
M8062A
R&D and test engineers who need to characterize serial interfaces of up to 32.0 Gb/s can use the M8061A 2:1 Multiplexer with optional de-emphasis to extend the rate of J-BERT M8020A and J-BERT N4903B pattern generator. For the most accurate receiver characterization results, the M8061A provides four calibrated de-emphasis taps, which can be extended to eight taps, built-in superposition of level interference and Clock/2 jitter injection. The M8061A is a 2-slot AXIe module that can be controlled via USB from the user interface of J-BERT M8020A as well as N4903B.
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ATI Performance Oscilloscopes
DPO70000SX
DPO70000SX ATI Performance Oscilloscopes deliver the industry’s most accurate capture of high-speed signal behavior to verify, validate and characterize your next generation designs. Capture up to 70 GHz signals with the lowest noise and highest fidelity, ensuring the most accurate measurements of your signal’s true characteristics.
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Linea Imaging Modules
The Opto linea imaging modules are characterized by the slim, straight, all-aluminum housing.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Cryostats
attoCRYO
Fundamental research in physics, as well as specimen characterization in materials science often require the use of (ultra) low temperatures. Many phenomena also involve the application of high magnetic fields, usually generated by superconducting magnets. attocube provides a broad portfolio of versatile cryostats for sensitive measurements at variable temperatures and extreme conditions.
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Light/Laser Flash Analyzers
Light or laser flash is a measurement technique used to determine the thermal diffusivity, thermal conductivity, and specific heat capacity of materials. Light flash measurements are essential for characterizing the heat transfer and storage properties of a variety of materials, whether the sample of interest is expected to insulate, conduct, or simply withstand temperature changes.
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TF Analyzer
The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-02
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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Phase Noise Analyzer and VCO Tester
FSPN
The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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PNA-L Microwave Network Analyzer
N5239B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to8.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Physical Contact Connectors
Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
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Intelligent Sensors
Silicon Labs is a leading supplier of intelligent sensor solutions that are characterized by superb reliability, compact size, high levels of integration and unmatched ease of use for a variety of applications. Our diverse sensor product portfolio includes optical sensors, digital relative I2C humidity and temperature sensor ICs, biometric sensors and capacitive touch sense microcontroller devices.
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Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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IP GAM
SFT 3316
Hangzhou Softel Optic Co., Ltd.
SFT 3316 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by Softel. It has 1 6 multiplexing channels, 16 scrambling channels and 16 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 16 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
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PCB Material Characterization
N19308B
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244-B
The 60-750-244-B is a dual 4x4 10GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Diffusion Sensors
BASIC EVO
Diffusion sensors for room air monitoring are available from smartGAS as the BASIC EVO series. Like all smartGAS sensors, they are characterized by low detection limits, low drift, a wide temperature range as well as a fast response time and low maintenance. The BASIC EVO series is the optimal solution for all applications in which a room air sensor should be reliable and easy to handle at the same time.
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CMP Tester
CP-6
The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
